Inventor · disambiguated record
Hisashi Isozaki
Also filed as: ISOZAKI HISASHI
28 granted patents·3 pending applications·261 citations·filing 1995–2017
96Inventor score
Top patents by PatentIndex Score
31 records- 0188US6654111B2Surface inspection apparatus and methodTOPCON CORP·Filed 2001·Granted Nov 25, 2003·31 cites·24 claims
- 0288US6104481ASurface inspection apparatusTOPCON CORP·Filed 1998·Granted Aug 15, 2000·113 cites·12 claims
- 0380US10502630B2Temperature measurement device and temperature measurement methodTOPCON CORP·Filed 2017·Granted Dec 10, 2019·2 cites·3 claims
- 0478US9719850B2Spatial light measuring method and spatial light measuring systemTOPCON CORP·Filed 2016·Granted Aug 1, 2017·2 cites·3 claims
- 0576US9823354B2Illuminance measuring systemTOPCON CORP·Filed 2016·Granted Nov 21, 2017·2 cites·12 claims
- 0675US6587192B2Surface inspecting apparatus and methodTOPCON CORP·Filed 2001·Granted Jul 1, 2003·15 cites·24 claims
- 0772US8692194B2Electron microscope deviceISOZAKI HISASHI·Filed 2011·Granted Apr 8, 2014·3 cites·8 claims
- 0871US10067233B2Illuminance measuring systemTOPCON CORP·Filed 2017·Granted Sep 4, 2018·1 cites·6 claims
- 0971US8097849B2Electron microscope deviceOHTOMO FUMIO·Filed 2009·Granted Jan 17, 2012·5 cites·6 claims
- 1071US7046353B2Surface inspection systemTOPCON CORP·Filed 2002·Granted May 16, 2006·14 cites·11 claims
- 1168US8791415B2Electron microscope deviceISOZAKI HISASHI·Filed 2009·Granted Jul 29, 2014·2 cites·6 claims
- 1267US6611328B2Surface inspecting apparatus and methodTOPCON CORP·Filed 2001·Granted Aug 26, 2003·8 cites·6 claims
- 1365US7352461B2Particle detecting method and storage medium storing program for implementing the methodTOKYO ELECTRON LTD·Filed 2005·Granted Apr 1, 2008·2 cites·8 claims
- 1465US7064820B2Surface inspection method and surface inspection systemTOPCON CORP·Filed 2003·Granted Jun 20, 2006·6 cites·4 claims
- 1565US6771364B2Surface inspecting apparatusTOPCON CORP·Filed 2002·Granted Aug 3, 2004·6 cites·11 claims
- 1665US6204918B1Apparatus for surface inspectionTOPCON CORP·Filed 1999·Granted Mar 20, 2001·31 cites·10 claims
- 1760US8351115B2Complex type microscopic deviceTOPCON CORP·Filed 2009·Granted Jan 8, 2013·2 cites·9 claims
- 1860US6847444B2Surface inspecting apparatus and methodTOPCON CORP·Filed 2003·Granted Jan 25, 2005·2 cites·8 claims
- 1956US8243264B2Measuring apparatusISOZAKI HISASHI·Filed 2010·Granted Aug 14, 2012·1 cites·6 claims
- 2056US8009286B2Surface inspecting method and deviceTOPCON CORP·Filed 2007·Granted Aug 30, 2011·1 cites·14 claims
- 2147US6941792B2Surface inspection systemTOPCON CORP·Filed 2002·Granted Sep 13, 2005·1 cites·9 claims
- 2246US6331888B1Method and apparatus for surface inspectionTOPCON CORP·Filed 2000·Granted Dec 18, 2001·0 cites·6 claims
- 2346US2012120485A1Interference microscope and measuring apparatusOOTOMO FUMIO·Filed 2009·Application pending·0 cites
- 2444US6115117AMethod and apparatus for surface inspectionTOPCON CORP·Filed 1998·Granted Sep 5, 2000·10 cites·11 claims
- 2543US9952091B2Management system for illumination facilityTOPCON CORP·Filed 2016·Granted Apr 24, 2018·0 cites·10 claims
- 2641US7245388B2Method and device for surface inspectionTOPCON CORP·Filed 2003·Granted Jul 17, 2007·0 cites·16 claims
- 2739US2011043808A1Measuring apparatusISOZAKI HISASHI·Filed 2010·Application pending·0 cites
- 2839US2004095572A1Laser light source device and surface inspection apparatus using itTOPCON CORP·Filed 2003·Application pending·0 cites
- 2934US7394532B2Surface inspection method and apparatusTOPCON CORP·Filed 2003·Granted Jul 1, 2008·0 cites·11 claims
- 3032US6108078AMethod and apparatus for surface inspectionTOPCON CORP·Filed 1998·Granted Aug 22, 2000·1 cites·19 claims
- 3130US5814828AApparatus for defining the location of a foreign object on a rotary body in terms of a coordinate systemTOPCON CORP·Filed 1995·Granted Sep 29, 1998·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →