Inventor · disambiguated record
Ido Adam
Also filed as: ADAM IDO
4 granted patents·2 pending applications·7 citations·filing 2016–2023
63Inventor score
Top patents by PatentIndex Score
6 records- 0181US10831108B2Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrologyKLA CORP·Filed 2016·Granted Nov 10, 2020·5 cites·77 claims
- 0274US11112704B2Mitigation of inaccuracies related to grating asymmetries in scatterometry measurementsKLA TENCOR CORP·Filed 2017·Granted Sep 7, 2021·2 cites·7 claims
- 0359US2025389530A1Optical critical dimensions (ocd) metrology for thick stacksNOVA LTD·Filed 2023·Application pending·0 cites
- 0457US11862522B2Accuracy improvements in optical metrologyKLA TENCOR CORP·Filed 2021·Granted Jan 2, 2024·0 cites·9 claims
- 0543US2018047646A1Accuracy improvements in optical metrologyKLA TENCOR CORP·Filed 2017·Application pending·0 cites
- 0641US11158548B2Overlay measurement using multiple wavelengthsKLA TENCOR CORP·Filed 2018·Granted Oct 26, 2021·0 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Ido Adam files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →