Inventor · disambiguated record
Isao Nagaoki
Also filed as: NAGAOKI ISAO
23 granted patents·8 pending applications·214 citations·filing 1998–2014
95Inventor score
Files withHITACHI HIGH TECH CORP13HITACHI LTD9NAGAOKI ISAO3FUJISAWA AKIKO1HITACHI SCIENCE SYSTEMS LTD1
Top patents by PatentIndex Score
31 records- 0192US6570156B1Autoadjusting electron microscopeHITACHI LTD·Filed 2000·Granted May 27, 2003·100 cites·11 claims
- 0285US9721752B2Sample holder and charged particle deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 1, 2017·3 cites·8 claims
- 0376US6888139B2Electron microscopeHITACHI LTD·Filed 2003·Granted May 3, 2005·28 cites·4 claims
- 0471US8586922B2Transmission electron microscope and sample observation methodNAGAOKI ISAO·Filed 2010·Granted Nov 19, 2013·4 cites·8 claims
- 0570US6875983B2Electron microscope and means to set observation conditionsHITACHI LTD·Filed 2002·Granted Apr 5, 2005·7 cites·4 claims
- 0669US7838829B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 23, 2010·2 cites·7 claims
- 0768US10083814B2Electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 25, 2018·2 cites·13 claims
- 0868US8426811B2Electron microscopeNAGAOKI ISAO·Filed 2009·Granted Apr 23, 2013·2 cites·11 claims
- 0967US7544936B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2006·Granted Jun 9, 2009·4 cites·1 claims
- 1067US7164129B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2005·Granted Jan 16, 2007·4 cites·26 claims
- 1167US6777679B2Method of observing a sample by a transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2003·Granted Aug 17, 2004·10 cites·7 claims
- 1264US8044352B2Electron microscopyHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 25, 2011·1 cites·8 claims
- 1363US7214938B2Sample observation method and transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted May 8, 2007·4 cites·6 claims
- 1462US7022989B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2004·Granted Apr 4, 2006·10 cites·3 claims
- 1560USD636005SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Apr 12, 2011·11 cites·1 claims
- 1658US6878934B2Method and device for observing a specimen in a field of view of an electronHITACHI LTD·Filed 2001·Granted Apr 12, 2005·8 cites·36 claims
- 1757US8928485B2Charged corpuscular ray apparatusKIKUCHI HIDEKI·Filed 2009·Granted Jan 6, 2015·2 cites·10 claims
- 1855US7838834B2Image forming method and electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 23, 2010·0 cites·10 claims
- 1954US2011254944A1Scanning charged particle microscopeISHITANI TOHRU·Filed 2009·Application pending·0 cites
- 2053US7041977B2Electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2005·Granted May 9, 2006·0 cites·5 claims
- 2151US8288725B2Charged particle beam deviceFUJISAWA AKIKO·Filed 2010·Granted Oct 16, 2012·0 cites·5 claims
- 2251US7012254B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2004·Granted Mar 14, 2006·4 cites·3 claims
- 2351US2008197282A1Scanning Transmission Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 2446US2017018397A1Sample holder for charged particle beam device, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Application pending·0 cites
- 2545US6982420B2Sample observation method and transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 3, 2006·2 cites·10 claims
- 2645US2017323762A1Charged particle beam apparatus, electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2014·Application pending·0 cites
- 2741US2014103208A1Electron microscopeNODA HIROYUKI·Filed 2012·Application pending·0 cites
- 2840US2015041676A1Soundproof cover for charged-particle beam device, and charged-particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 2937US6472663B2Electron microscopeHITACHI LTD·Filed 1998·Granted Oct 29, 2002·6 cites·4 claims
- 3036US2013163076A1Transmission interference microscopeNAGAOKI ISAO·Filed 2011·Application pending·0 cites
- 3127US2013062519A1Electron microscope, and method for adjustng optical axis of electron microscopeOYAGI TOSHIYUKI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →