Inventor · disambiguated record
Ivan Maleev
Also filed as: MALEEV IVAN
19 granted patents·5 pending applications·168 citations·filing 2010–2024
93Inventor score
Top patents by PatentIndex Score
24 records- 0196US10564714B2Systems and methods for biomechanically-based eye signals for interacting with real and virtual objectsGOOGLE LLC·Filed 2016·Granted Feb 18, 2020·56 cites·28 claims
- 0296US9891177B2TDI sensor in a darkfield systemKLA TENCOR CORP·Filed 2014·Granted Feb 13, 2018·56 cites·41 claims
- 0394US9279774B2Wafer inspectionROMANOVSKY ANATOLY·Filed 2012·Granted Mar 8, 2016·29 cites·19 claims
- 0491US9995850B2System, method and apparatus for polarization controlKLA TENCOR CORP·Filed 2014·Granted Jun 12, 2018·8 cites·33 claims
- 0590US10488348B2Wafer inspectionKLA TENCOR CORP·Filed 2018·Granted Nov 26, 2019·3 cites·57 claims
- 0688US9377416B2Wafer edge detection and inspectionKLA TENCOR CORP·Filed 2015·Granted Jun 28, 2016·9 cites·22 claims
- 0784US11385154B2Apparatus and method for monitoring and measuring properties of polymers in solutionsTOKYO ELECTRON LTD·Filed 2020·Granted Jul 12, 2022·1 cites·20 claims
- 0873US2024418501A1Optical sensor for film thickness measurementTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0972US11989876B2Method and apparatus for inspecting pattern collapse defectsTOKYO ELECTRON LTD·Filed 2023·Granted May 21, 2024·0 cites·10 claims
- 1072US10921488B2System, method and apparatus for polarization controlKLA TENCOR CORP·Filed 2018·Granted Feb 16, 2021·1 cites·26 claims
- 1169US12360463B2Fiber bundle based optical spot size selectorTOKYO ELECTRON LTD·Filed 2023·Granted Jul 15, 2025·0 cites·21 claims
- 1269US11415725B2System, method and apparatus for polarization controlKLA CORP·Filed 2021·Granted Aug 16, 2022·0 cites·20 claims
- 1369US9494531B2Multi-spot illumination for improved detection sensitivityKLA TENCOR CORP·Filed 2014·Granted Nov 15, 2016·1 cites·19 claims
- 1467US10837902B2Optical sensor for phase determinationTOKYO ELECTRON LTD·Filed 2018·Granted Nov 17, 2020·1 cites·20 claims
- 1567US9182341B2Optical surface scanning systems and methodsKLA TENCOR CORP·Filed 2013·Granted Nov 10, 2015·1 cites·8 claims
- 1664US8502977B1Angular resolved spectroscopic scatterometerMALEEV IVAN·Filed 2010·Granted Aug 6, 2013·1 cites·19 claims
- 1763US11676266B2Method and apparatus for inspecting pattern collapse defectsTOKYO ELECTRON LTD·Filed 2020·Granted Jun 13, 2023·0 cites·10 claims
- 1860US9915622B2Wafer inspectionKLA TENCOR CORP·Filed 2015·Granted Mar 13, 2018·0 cites·20 claims
- 1959US2025293095A1System and method of pulse scoringTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 2056US9076639B2Transmissive-reflective photocathodeMALEEV IVAN·Filed 2012·Granted Jul 7, 2015·1 cites·46 claims
- 2156US2024242987A1Wafer temperature measurement for wet etching bath applicationsTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 2254US2025112065A1Metrology integrated with vacuum processingTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 2353US11664283B2Raman sensor for supercritical fluids metrologyTOKYO ELECTRON LTD·Filed 2021·Granted May 30, 2023·0 cites·20 claims
- 2447US2022139743A1Optical Sensor for Inspecting Pattern Collapse DefectsTOKYO ELECTRON LTD·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →