Inventor · disambiguated record
Jeffrey C. Sherry
Also filed as: SHERRY JEFFREY · SHERRY JEFFREY C
36 granted patents·5 pending applications·217 citations·filing 2007–2020
97Inventor score
Top patents by PatentIndex Score
41 records- 0197US11293968B2Integrated circuit testing for integrated circuits with antennasJOHNSTECH INT CORP·Filed 2020·Granted Apr 5, 2022·4 cites·11 claims
- 0297US8536889B2Electrically conductive pins for microcircuit testerNELSON JOHN E·Filed 2010·Granted Sep 17, 2013·47 cites·20 claims
- 0395US10725069B1Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2018·Granted Jul 28, 2020·13 cites·16 claims
- 0495US9007082B2Electrically conductive pins for microcircuit testerNELSON JOHN E·Filed 2012·Granted Apr 14, 2015·19 cites·29 claims
- 0593US10794933B1Integrated circuit contact test apparatus with and method of constructionJOHNSTECH INT CORP·Filed 2017·Granted Oct 6, 2020·6 cites·14 claims
- 0693US9606143B1Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testingJOHNSTECH INT CORP·Filed 2014·Granted Mar 28, 2017·12 cites·7 claims
- 0793US8558554B2Electrically conductive Kelvin contacts for microcircuit testerERDMAN JOEL N·Filed 2010·Granted Oct 15, 2013·16 cites·39 claims
- 0892US10247755B2Electrically conductive kelvin contacts for microcircuit testerJOHNSTECH INT CORP·Filed 2016·Granted Apr 2, 2019·5 cites·11 claims
- 0992US7737708B2Contact for use in testing integrated circuitsJOHNSTECH INT CORP·Filed 2007·Granted Jun 15, 2010·21 cites·11 claims
- 1091US10274515B1Waveguide integrated testingJOHNSTECH INT CORP·Filed 2016·Granted Apr 30, 2019·5 cites·15 claims
- 1189US11002760B1High isolation housing for testing integrated circuitsJOHNSTECH INT CORP·Filed 2018·Granted May 11, 2021·4 cites·11 claims
- 1289US9500673B2Electrically conductive kelvin contacts for microcircuit testerJOHNSTECH INT CORP·Filed 2013·Granted Nov 22, 2016·7 cites·17 claims
- 1389US8102184B2Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2008·Granted Jan 24, 2012·19 cites·57 claims
- 1488US10761112B1Self flattening test socket with anti-bowing and elastomer retentionJOHNSTECH INT CORP·Filed 2018·Granted Sep 1, 2020·3 cites·19 claims
- 1587US9678106B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2016·Granted Jun 13, 2017·2 cites·20 claims
- 1683US8912811B2Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2012·Granted Dec 16, 2014·5 cites·21 claims
- 1782US9476936B1Thermal management for microcircuit testing systemJOHNSTECH INT CORP·Filed 2014·Granted Oct 25, 2016·6 cites·7 claims
- 1881US10073117B2Resilient interposer with electrically conductive slide-by pins as part of a microcircuit testerJOHNSTECH INT CORP·Filed 2017·Granted Sep 11, 2018·1 cites·20 claims
- 1980US11360117B1Waveguide integrated circuit testingJOHNSTECH INT CORP·Filed 2020·Granted Jun 14, 2022·1 cites·16 claims
- 2080US8988090B2Electrically conductive kelvin contacts for microcircuit testerERDMAN JOEL N·Filed 2011·Granted Mar 24, 2015·5 cites·16 claims
- 2178US11307232B1Waveguide integrated circuit testingJOHNSTECH INT CORP·Filed 2020·Granted Apr 19, 2022·1 cites·19 claims
- 2277US10698000B1Waveguide integrated testingJOHNSTECH INT CORP·Filed 2019·Granted Jun 30, 2020·1 cites·16 claims
- 2377US8354854B2Microcircuit testing interface having kelvin and signal contacts within a single slotJOHNSTECH INT CORP·Filed 2008·Granted Jan 15, 2013·8 cites·9 claims
- 2476US8937484B2Microcircuit tester with slideable electrically conductive pinsNELSON JOHN E·Filed 2013·Granted Jan 20, 2015·3 cites·14 claims
- 2571US9297832B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2014·Granted Mar 29, 2016·1 cites·12 claims
- 2669US11467183B2Integrated circuit contact test apparatus with and method of constructionJOHNSTECH INT CORP·Filed 2020·Granted Oct 11, 2022·0 cites·5 claims
- 2766US11709183B2Self flattening test socket with anti-bowing and elastomer retentionJOHNSTECH INT CORP·Filed 2020·Granted Jul 25, 2023·0 cites·15 claims
- 2866US11209458B2Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2020·Granted Dec 28, 2021·0 cites·15 claims
- 2966US11183783B2High isolation contactor with test pin and housing for integrated circuit testingJOHNSTECH INT CORP·Filed 2020·Granted Nov 23, 2021·0 cites·20 claims
- 3066US10302675B2Electrically conductive pins microcircuit testerJOHNSTECH INT CORP·Filed 2018·Granted May 28, 2019·0 cites·16 claims
- 3162US10877090B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2017·Granted Dec 29, 2020·0 cites·19 claims
- 3260US9696347B2Testing apparatus and method for microcircuit and wafer level IC testingJOHNSTECH INT CORP·Filed 2014·Granted Jul 4, 2017·2 cites·13 claims
- 3356US10928423B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2018·Granted Feb 23, 2021·0 cites·24 claims
- 3454US2015123689A1Electrically Conductive Pins For Microcircuit TesterJOHNSTECH INT CORP·Filed 2015·Application pending·0 cites
- 3553US2013002285A1Electrically Conductive Pins For Microcircuit TesterJOHNSTECH INT CORP·Filed 2012·Application pending·0 cites
- 3652US9329204B2Electrically conductive Kelvin contacts for microcircuit testerJOHNSTECH INT CORP·Filed 2012·Granted May 3, 2016·0 cites·11 claims
- 3751US10067164B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2016·Granted Sep 4, 2018·0 cites·16 claims
- 3850US10686269B2High isolation contactor with test pin and housing for integrated circuit testingJOHNSTECH INT CORP·Filed 2018·Granted Jun 16, 2020·0 cites·23 claims
- 3950US2012062261A1Electrically Conductive Pins For Microcircuit TesterNELSON JOHN E·Filed 2011·Application pending·0 cites
- 4046US2007202714A1Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2007·Application pending·0 cites
- 4144US2019302145A1Electrically Conductive Kelvin Contacts For Microcircuit TesterJOHNSTECH INT CORP·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →