Inventor · disambiguated record
Kara L. Sherman
Also filed as: SHERMAN KARA L · SHERMAN KARA LEE
5 granted patents·1 pending application·39 citations·filing 2007–2021
75Inventor score
Top patents by PatentIndex Score
6 records- 0194US10761128B2Methods and systems for inline parts average testing and latent reliability defect detectionKLA TENCOR CORP·Filed 2017·Granted Sep 1, 2020·23 cites·20 claims
- 0290US11293970B2Advanced in-line part average testingKLA CORP·Filed 2020·Granted Apr 5, 2022·4 cites·31 claims
- 0380US7453274B1Detection of defects using transient contrastKLA TENCOR TECH CORP·Filed 2007·Granted Nov 18, 2008·12 cites·13 claims
- 0451US11798827B2Systems and methods for semiconductor adaptive testing using inline defect part average testingKLA CORP·Filed 2021·Granted Oct 24, 2023·0 cites·25 claims
- 0550US11754625B2System and method for identifying latent reliability defects in semiconductor devicesKLA CORP·Filed 2021·Granted Sep 12, 2023·0 cites·27 claims
- 0642US2022196723A1System and method for automatically identifying defect-based test coverage gaps in semiconductor devicesKLA CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →