Inventor · disambiguated record
Kenong Wu
Also filed as: WU KENONG
33 granted patents·2 pending applications·432 citations·filing 2001–2022
97Inventor score
Top patents by PatentIndex Score
35 records- 0197US9092846B2Detecting defects on a wafer using defect-specific and multi-channel informationKLA TENCOR CORP·Filed 2014·Granted Jul 28, 2015·30 cites·56 claims
- 0293US10365232B2High accuracy of relative defect locations for repeater analysisKLA TENCOR CORP·Filed 2018·Granted Jul 30, 2019·9 cites·24 claims
- 0393US8111900B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleWU KENONG·Filed 2010·Granted Feb 7, 2012·27 cites·17 claims
- 0493US7570800B2Methods and systems for binning defects detected on a specimenKLA TENCOR TECH CORP·Filed 2005·Granted Aug 4, 2009·29 cites·45 claims
- 0591US9846930B2Detecting defects on a wafer using defect-specific and multi-channel informationKLA TENCOR CORP·Filed 2016·Granted Dec 19, 2017·5 cites·17 claims
- 0691US9601393B2Selecting one or more parameters for inspection of a waferLEE CHRIS·Filed 2010·Granted Mar 21, 2017·17 cites·69 claims
- 0791US9518934B2Wafer defect discoveryKLA TENCOR CORP·Filed 2015·Granted Dec 13, 2016·12 cites·20 claims
- 0891US9310316B2Selecting parameters for defect detection methodsWU KENONG·Filed 2012·Granted Apr 12, 2016·15 cites·35 claims
- 0990US9171364B2Wafer inspection using free-form care areasKLA TENCOR CORP·Filed 2014·Granted Oct 27, 2015·16 cites·33 claims
- 1089US9189844B2Detecting defects on a wafer using defect-specific informationKLA TENCOR CORP·Filed 2012·Granted Nov 17, 2015·15 cites·68 claims
- 1189US7729529B2Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticleKLA TENCOR TECH CORP·Filed 2004·Granted Jun 1, 2010·39 cites·19 claims
- 1288US10127652B2Defect detection and classification based on attributes determined from a standard reference imageKLA TENCOR CORP·Filed 2015·Granted Nov 13, 2018·9 cites·53 claims
- 1386US9766186B2Array mode repeater detectionKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·3 cites·34 claims
- 1484US9552636B2Detecting defects on a wafer using defect-specific and multi-channel informationKLA TENCOR CORP·Filed 2015·Granted Jan 24, 2017·3 cites·67 claims
- 1582US7359544B2Automatic supervised classifier setup tool for semiconductor defectsKLA TENCOR TECH CORP·Filed 2003·Granted Apr 15, 2008·46 cites·44 claims
- 1682US6747646B2System and method for fusing three-dimensional shape data on distorted images without correcting for distortionIBM·Filed 2001·Granted Jun 8, 2004·111 cites·26 claims
- 1781US7142992B1Flexible hybrid defect classification for semiconductor manufacturingKLA TENCOR TECH CORP·Filed 2004·Granted Nov 28, 2006·28 cites·19 claims
- 1880US9766187B2Repeater detectionKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·2 cites·22 claims
- 1980US9727047B2Defect detection using structural informationKLA TENCOR CORP·Filed 2015·Granted Aug 8, 2017·3 cites·18 claims
- 2079US10572991B2System and method for aligning semiconductor device reference images and test imagesKLA TENCOR CORP·Filed 2017·Granted Feb 25, 2020·3 cites·49 claims
- 2178US11067516B2High accuracy of relative defect locations for repeater analysisKLA TENCOR CORP·Filed 2018·Granted Jul 20, 2021·1 cites·30 claims
- 2278US10923317B2Detecting defects in a logic region on a waferKLA CORP·Filed 2019·Granted Feb 16, 2021·2 cites·21 claims
- 2377US10395359B2Adaptive local threshold and color filteringKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·2 cites·23 claims
- 2470US9704234B2Adaptive local threshold and color filteringKLA TENCOR CORP·Filed 2014·Granted Jul 11, 2017·2 cites·35 claims
- 2561US8989479B2Region based virtual fourier filterGAO LISHENG·Filed 2011·Granted Mar 24, 2015·3 cites·35 claims
- 2658US11139216B2System, method and non-transitory computer readable medium for tuning sensitivities of, and determining a process window for, a modulated waferKLA TENCOR CORP·Filed 2020·Granted Oct 5, 2021·0 cites·11 claims
- 2755US12190498B2Print check repeater defect detectionKLA CORP·Filed 2022·Granted Jan 7, 2025·0 cites·30 claims
- 2851US10679909B2System, method and non-transitory computer readable medium for tuning sensitivies of, and determining a process window for, a modulated waferKLA TENCOR CORP·Filed 2017·Granted Jun 9, 2020·0 cites·9 claims
- 2950US2009290784A1Methods and systems for binning defects detected on a specimenKLA TENCOR TECH CORP·Filed 2009·Application pending·0 cites
- 3049US11328411B2Print check repeater defect detectionKLA CORP·Filed 2021·Granted May 10, 2022·0 cites·21 claims
- 3149US9721337B2Detecting defects on a wafer using defect-specific informationKLA TENCOR CORP·Filed 2015·Granted Aug 1, 2017·0 cites·23 claims
- 3248US2017076911A1Wafer Defect DiscoveryKLA TENCOR CORP·Filed 2016·Application pending·0 cites
- 3338US10339262B2System and method for defining care areas in repeating structures of design dataKLA TENCOR CORP·Filed 2016·Granted Jul 2, 2019·0 cites·20 claims
- 3438US9360863B2Data perturbation for wafer inspection or metrology setup using a model of a differenceTHATTAISUNDARAM GOVIND·Filed 2011·Granted Jun 7, 2016·0 cites·39 claims
- 3537US10387601B2Methods to store dynamic layer content inside a design fileKLA TENCOR CORP·Filed 2016·Granted Aug 20, 2019·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →