Inventor · disambiguated record
Kris Bhaskar
Also filed as: BHASKAR KRIS
31 granted patents·5 pending applications·617 citations·filing 2005–2024
97Inventor score
Top patents by PatentIndex Score
36 records- 0198US10043261B2Generating simulated output for a specimenKLA TENCOR CORP·Filed 2017·Granted Aug 7, 2018·32 cites·28 claims
- 0297US9222895B2Generalized virtual inspectorKLA TENCOR CORP·Filed 2014·Granted Dec 29, 2015·96 cites·43 claims
- 0396US9965901B2Generating simulated images from design informationKLA TENCOR CORP·Filed 2016·Granted May 8, 2018·24 cites·43 claims
- 0495US10346740B2Systems and methods incorporating a neural network and a forward physical model for semiconductor applicationsKLA TENCOR CORP·Filed 2017·Granted Jul 9, 2019·23 cites·30 claims
- 0595US10181185B2Image based specimen process controlKLA TENCOR CORP·Filed 2017·Granted Jan 15, 2019·21 cites·35 claims
- 0695US9222771B2Acquisition of information for a construction siteKLA TENCOR CORP·Filed 2012·Granted Dec 29, 2015·36 cites·37 claims
- 0795US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0894US11551348B2Learnable defect detection for semiconductor applicationsKLA CORP·Filed 2020·Granted Jan 10, 2023·5 cites·38 claims
- 0994US11415526B2Multi-controller inspection systemKLA CORP·Filed 2020·Granted Aug 16, 2022·4 cites·29 claims
- 1094US10360477B2Accelerating semiconductor-related computations using learning based modelsKLA TENCOR CORP·Filed 2017·Granted Jul 23, 2019·22 cites·39 claims
- 1194US8204296B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferBHASKAR KRIS·Filed 2010·Granted Jun 19, 2012·15 cites·16 claims
- 1293US10186026B2Single image detectionKLA TENCOR CORP·Filed 2016·Granted Jan 22, 2019·10 cites·36 claims
- 1393US9916965B2Hybrid inspectorsKLA TENCOR CORP·Filed 2016·Granted Mar 13, 2018·13 cites·30 claims
- 1493US7796804B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferKLA TENCOR CORP·Filed 2008·Granted Sep 14, 2010·25 cites·28 claims
- 1592US8422010B2Methods and systems for determining a characteristic of a waferKIRK MICHAEL D·Filed 2012·Granted Apr 16, 2013·13 cites·34 claims
- 1691US10395356B2Generating simulated images from input images for semiconductor applicationsKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·11 cites·27 claims
- 1790US10648924B2Generating high resolution images from low resolution images for semiconductor applicationsKLA TENCOR CORP·Filed 2017·Granted May 12, 2020·5 cites·27 claims
- 1890US10599951B2Training a neural network for defect detection in low resolution imagesKLA TENCOR CORP·Filed 2019·Granted Mar 24, 2020·19 cites·31 claims
- 1990US9176072B2Dark field inspection system with ring illuminationZHAO GUOHENG·Filed 2010·Granted Nov 3, 2015·10 cites·30 claims
- 2088US11580375B2Accelerated training of a machine learning based model for semiconductor applicationsKLA TENCOR CORP·Filed 2016·Granted Feb 14, 2023·9 cites·37 claims
- 2188US9262821B2Inspection recipe setup from reference image variationKLA TENCOR CORP·Filed 2015·Granted Feb 16, 2016·8 cites·38 claims
- 2287US10713769B2Active learning for defect classifier trainingKLA TENCOR CORP·Filed 2019·Granted Jul 14, 2020·9 cites·36 claims
- 2387US8284394B2Methods and systems for determining a characteristic of a waferKIRK MICHAEL D·Filed 2007·Granted Oct 9, 2012·12 cites·36 claims
- 2486US11769242B2Mode selection and defect detection trainingKLA CORP·Filed 2020·Granted Sep 26, 2023·2 cites·20 claims
- 2585US9355208B2Detecting defects on a waferKLA TENCOR CORP·Filed 2014·Granted May 31, 2016·8 cites·37 claims
- 2670US9576861B2Method and system for universal target based inspection and metrologyKLA TENCOR CORP·Filed 2013·Granted Feb 21, 2017·2 cites·25 claims
- 2770US7345753B2Apparatus and methods for analyzing defects on a sampleKLA TENCOR TECH CORP·Filed 2005·Granted Mar 18, 2008·6 cites·19 claims
- 2866US11580398B2Diagnostic systems and methods for deep learning models configured for semiconductor applicationsKLA TENCOR CORP·Filed 2017·Granted Feb 14, 2023·2 cites·38 claims
- 2966US2023118839A1Learnable defect detection for semiconductor applicationsKLA CORP·Filed 2022·Application pending·0 cites
- 3063US10402461B2Virtual inspection systems for process window characterizationKLA TENCOR CORP·Filed 2015·Granted Sep 3, 2019·1 cites·27 claims
- 3161US11644756B23D structure inspection or metrology using deep learningKLA CORP·Filed 2021·Granted May 9, 2023·0 cites·26 claims
- 3260US12480890B2Deep learning based mode selection for inspectionKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·20 claims
- 3360US2025117925A1Defect synthesis and detection via defect generative pre-trained transformer for semiconductor applicationsKLA CORP·Filed 2024·Application pending·0 cites
- 3453US2024169116A1Protecting data sources from different entities for semiconductor yield related applicationsKLA CORP·Filed 2023·Application pending·0 cites
- 3548US2024013365A9Unsupervised or self-supervised deep learning for semiconductor-based applicationsKLA CORP·Filed 2022·Application pending·0 cites
- 3647US2023136110A1Knowledge distillation for semiconductor-based applicationsKLA CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →