Inventor · disambiguated record
Kuan-Cheng Su
Also filed as: SU KUAN-CHENG
59 granted patents·8 pending applications·409 citations·filing 1993–2024
98Inventor score
Top patents by PatentIndex Score
67 records- 0197US9368484B1Fin type electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 14, 2016·28 cites·13 claims
- 0293US9691752B1Semiconductor device for electrostatic discharge protection and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·11 cites·20 claims
- 0391US9653450B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 16, 2017·8 cites·14 claims
- 0487US8817434B2Electrostatic discharge (ESD) protection deviceWANG CHANG-TZU·Filed 2011·Granted Aug 26, 2014·10 cites·18 claims
- 0586US10008489B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 26, 2018·4 cites·15 claims
- 0686US8467162B2ESD protection circuit and ESD protection device thereofWANG CHANG-TZU·Filed 2010·Granted Jun 18, 2013·8 cites·10 claims
- 0783US10629585B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 21, 2020·3 cites·16 claims
- 0883US9640524B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 2, 2017·3 cites·5 claims
- 0982US9673189B2ESD unitUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 6, 2017·4 cites·28 claims
- 1082US9331161B1Metal gate structure and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted May 3, 2016·6 cites·9 claims
- 1181US9093565B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 28, 2015·3 cites·5 claims
- 1280US10103136B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 16, 2018·2 cites·1 claims
- 1379US9564436B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Feb 7, 2017·5 cites·21 claims
- 1477US10204897B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 12, 2019·2 cites·6 claims
- 1576US7649377B2Test structureUNITED MICROELECTRONICS CORP·Filed 2008·Granted Jan 19, 2010·4 cites·13 claims
- 1674US2025120185A1Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1773US8648421B2Electrostatic discharge (ESD) device and semiconductor structureWEN YUNG-JU·Filed 2011·Granted Feb 11, 2014·5 cites·14 claims
- 1871US5382534AField effect transistor with recessed buried source and drain regionsUNITED MICROELECTRONICS CORP·Filed 1994·Granted Jan 17, 1995·28 cites·30 claims
- 1969US11189611B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2020·Granted Nov 30, 2021·0 cites·9 claims
- 2068US9343567B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted May 17, 2016·2 cites·28 claims
- 2167US7759957B2Method for fabricating a test structureUNITED MICROELECTRONICS CORP·Filed 2007·Granted Jul 20, 2010·2 cites·8 claims
- 2267US5691234ABuried contact method to release plasma-induced charging damage on deviceUNITED MICROELECTRONICS CORP·Filed 1995·Granted Nov 25, 1997·23 cites·21 claims
- 2367US5585297AMethod of manufacture of multi-state mask ROM and multi-state mask ROM device produced therebyUNITED MICROELECTRONICS CORP·Filed 1995·Granted Dec 17, 1996·23 cites·15 claims
- 2467US5576573AStacked CVD oxide architecture multi-state memory cell for mask read-only memoriesUNITED MICROELECTRONICS CORP·Filed 1995·Granted Nov 19, 1996·36 cites·11 claims
- 2566US9607977B1Electrostatic discharge protection device and method for producing an electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Mar 28, 2017·1 cites·29 claims
- 2665US12211833B2Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jan 28, 2025·0 cites·19 claims
- 2764US5545580AMulti-state read-only memory using multiple polysilicon selective depositionsUNITED MICROELECTRONICS CORP·Filed 1995·Granted Aug 13, 1996·20 cites·10 claims
- 2861US10672759B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jun 2, 2020·0 cites·14 claims
- 2960US7589551B1On-wafer AC stress test circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Sep 15, 2009·4 cites·15 claims
- 3057US8283941B2Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluationKUO SUNG-NIEN·Filed 2010·Granted Oct 9, 2012·3 cites·18 claims
- 3156US9559091B2Method of manufacturing fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jan 31, 2017·0 cites·5 claims
- 3256US9455246B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 27, 2016·0 cites·4 claims
- 3356US9331064B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 3, 2016·0 cites·4 claims
- 3456US6093626ABuried contact method to release plasma-included charging damage on deviceUNITED MICROELECTRONICS CORP·Filed 1997·Granted Jul 25, 2000·14 cites·10 claims
- 3556US5504030AProcess for fabricating high-density mask ROM devicesUNITED MICROELECTRONICS CORP·Filed 1995·Granted Apr 2, 1996·21 cites·9 claims
- 3655US5665995APost passivation programmed mask ROMUNITED MICROELECTRONICS CORP·Filed 1995·Granted Sep 9, 1997·13 cites·15 claims
- 3755US5597753ACVD oxide coding method for ultra-high density mask read-only-memory (ROM)UNITED MICROELECTRONICS CORP·Filed 1994·Granted Jan 28, 1997·17 cites·25 claims
- 3855US2024162218A1Electrostatic discharge protection device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 3954US6500389B1Plasma arcing sensorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Dec 31, 2002·2 cites·9 claims
- 4054US5918127AMethod of enhancing electrostatic discharge (ESD) protection capability in integrated circuitsUNITED MICROELECTRONICS CORP·Filed 1996·Granted Jun 29, 1999·15 cites·4 claims
- 4154US5429974APost passivation mask ROM programming methodUNITED MICROELECTRONICS CORP·Filed 1993·Granted Jul 4, 1995·15 cites·18 claims
- 4254US2025031458A1Semiconductor structure and method of preventing charging damage thereofUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 4353US5536669AMethod for fabricating read-only-memory devices with self-aligned code implantsUNITED MICROELECTRONICS CORP·Filed 1995·Granted Jul 16, 1996·12 cites·12 claims
- 4453US2025072042A1Electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 4553US2024194668A1Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 4652US5705840AField effect transistor with recessed buried source and drain regionsUNITED MICROELECTRONICS CORP·Filed 1996·Granted Jan 6, 1998·15 cites·1 claims
- 4751US12408408B2Electrostatic discharge protection device including source silicide pattern and drain silicide patternUNITED MICROELECTRONICS CORP·Filed 2022·Granted Sep 2, 2025·0 cites·14 claims
- 4851US2024168084A1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2022·Application pending·0 cites
- 4950US9748222B2Fin type electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 29, 2017·0 cites·15 claims
- 5050US8711535B2ESD protection circuit and ESD protection device thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 29, 2014·0 cites·13 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →