Inventor · disambiguated record
Kuei-Sheng Wu
Also filed as: WU KUEI-SHENG
19 granted patents·8 pending applications·95 citations·filing 2008–2023
92Inventor score
Files withUNITED MICROELECTRONICS CORP15LIN YUNG-CHANG4WU KUEI-SHENG3UNIMICRON TECH CORPORATION2UNIMICRON TECHNOLOGY CORP2
Top patents by PatentIndex Score
27 records- 0190US7671355B2Method of fabricating a phase change memory and phase change memoryUNITED MICROELECTRONICS CORP·Filed 2008·Granted Mar 2, 2010·23 cites·19 claims
- 0288US8035191B2Contact efuse structureUNITED MICROELECTRONICS CORP·Filed 2008·Granted Oct 11, 2011·19 cites·14 claims
- 0384US8227890B2Method of forming an electrical fuse and a metal gate transistor and the related electrical fuseLIN YUNG-CHANG·Filed 2009·Granted Jul 24, 2012·10 cites·7 claims
- 0482US9978666B2Method for fabrication semiconductor device with through-substrate viaUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 22, 2018·3 cites·7 claims
- 0581US8071437B2Method of fabricating efuse, resistor and transistorLIN YUNG-CHANG·Filed 2009·Granted Dec 6, 2011·10 cites·8 claims
- 0680US8026573B2Electrical fuse structureUNITED MICROELECTRONICS CORP·Filed 2008·Granted Sep 27, 2011·9 cites·18 claims
- 0779US9123730B2Semiconductor device having through silicon trench shielding structure surrounding RF circuitUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 1, 2015·5 cites·19 claims
- 0876US12101881B2Circuit board assemblyUNIMICRON TECH CORPORATION·Filed 2023·Granted Sep 24, 2024·0 cites·8 claims
- 0976US7888668B2Phase change memoryUNITED MICROELECTRONICS CORP·Filed 2008·Granted Feb 15, 2011·9 cites·17 claims
- 1070US8399318B2Method of forming an electrical fuse and a metal gate transistor and the related electrical fuseLIN YUNG-CHANG·Filed 2012·Granted Mar 19, 2013·2 cites·14 claims
- 1168US11825604B2Circuit board assemblyUNIMICRON TECH CORPORATION·Filed 2021·Granted Nov 21, 2023·0 cites·15 claims
- 1268US9024416B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted May 5, 2015·2 cites·17 claims
- 1364US8922328B2Electrical fuse structureWU KUEI-SHENG·Filed 2011·Granted Dec 30, 2014·3 cites·21 claims
- 1451US9761509B2Semiconductor device with throgh-substrate via and method for fabrication the semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 12, 2017·0 cites·9 claims
- 1549US2012228718A1Method of forming an electrical fuse and a metal gate transistor and the related electrical fuseLIN YUNG-CHANG·Filed 2012·Application pending·0 cites
- 1648US9412686B2Interposer structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2014·Granted Aug 9, 2016·0 cites·10 claims
- 1748US2014061855A1Capacitor structure and fabricating method thereofKUO CHIEN-LI·Filed 2012·Application pending·0 cites
- 1845US2016093687A1Capacitor structure and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 1943US2015332996A1Interposer and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 2041US10504821B2Through-silicon via structureUNITED MICROELECTRONICS CORP·Filed 2016·Granted Dec 10, 2019·0 cites·5 claims
- 2141US2014332952A1Semiconductor structure and method for testing the sameUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 2238US10145889B2Testkey structure and method of measuring device defect or connection defect by using the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Dec 4, 2018·0 cites·19 claims
- 2336US2011074538A1Electrical fuse structure and method for fabricating the sameWU KUEI-SHENG·Filed 2009·Application pending·0 cites
- 2433US8035097B2Phase change memoryUNITED MICROELECTRONICS CORP·Filed 2008·Granted Oct 11, 2011·0 cites·20 claims
- 2532US2012286390A1Electrical fuse structure and method for fabricating the sameWU KUEI-SHENG·Filed 2011·Application pending·0 cites
- 2629USD969745SElectronic connectorUNIMICRON TECHNOLOGY CORP·Filed 2019·Granted Nov 15, 2022·0 cites·1 claims
- 2725US2018315714A1Chip package structure and manufacturing method thereofUNIMICRON TECHNOLOGY CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →