Inventor · disambiguated record
Ling-Chun Chou
Also filed as: CHOU LING-CHUN
22 granted patents·9 pending applications·92 citations·filing 2007–2025
94Inventor score
Files withUNITED MICROELECTRONICS CORP18CHOU LING-CHUN5WANG I-CHANG2CHANG CHUNG-FU1CHANG TSUNG-HUNG1
Top patents by PatentIndex Score
31 records- 0194US9853021B1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Dec 26, 2017·19 cites·16 claims
- 0291US9590072B1Method of forming semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Mar 7, 2017·8 cites·12 claims
- 0389US8502288B2Semiconductor structure and method for slimming spacerGUO TED MING-LANG·Filed 2011·Granted Aug 6, 2013·11 cites·7 claims
- 0486US8129235B2Method of fabricating two-step self-aligned contactCHOU LING-CHUN·Filed 2007·Granted Mar 6, 2012·16 cites·15 claims
- 0584US9269811B2Spacer scheme for semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Feb 23, 2016·5 cites·5 claims
- 0682US12349399B2Lateral diffusion metal-oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jul 1, 2025·0 cites·7 claims
- 0782US12300748B2Lateral diffusion metal-oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Granted May 13, 2025·0 cites·5 claims
- 0881US8552503B2Strained silicon structureHWANG GUANG-YAW·Filed 2010·Granted Oct 8, 2013·6 cites·12 claims
- 0980US2025234584A1Lateral diffusion metal-oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 1079US7817265B2Alignment mark and defect inspection methodUNITED MICROELECTRONICS CORP·Filed 2008·Granted Oct 19, 2010·6 cites·10 claims
- 1178US8486794B1Method for manufacturing semiconductor structureCHOU LING-CHUN·Filed 2012·Granted Jul 16, 2013·5 cites·18 claims
- 1273US9978745B2Bipolar junction transistorUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 22, 2018·2 cites·20 claims
- 1373US9799770B2FinFET structure deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 24, 2017·2 cites·19 claims
- 1472US11881527B2Lateral diffusion metal-oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2021·Granted Jan 23, 2024·0 cites·6 claims
- 1572US9318571B2Gate structure and method for trimming spacersWANG I-CHANG·Filed 2009·Granted Apr 19, 2016·6 cites·8 claims
- 1671US8574978B1Method for forming semiconductor deviceHUNG CHING-WEN·Filed 2012·Granted Nov 5, 2013·3 cites·19 claims
- 1766US2023253497A1High voltage semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1863US8841193B2Semiconductor structure and method for slimming spacerUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 23, 2014·1 cites·13 claims
- 1962US9312258B2Strained silicon structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 12, 2016·1 cites·18 claims
- 2061US8951876B2Semiconductor device and manufacturing method thereofCHOU LING-CHUN·Filed 2012·Granted Feb 10, 2015·1 cites·25 claims
- 2159US11664450B2High voltage semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2021·Granted May 30, 2023·0 cites·12 claims
- 2259US10978589B2Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 13, 2021·0 cites·7 claims
- 2358US2025107114A1Metal-oxide-semiconductor capacitor structureUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 2457US2025351427A1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2553US10439066B2Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 8, 2019·0 cites·13 claims
- 2643US8273631B2Method of fabricating n-channel metal-oxide semiconductor transistorWANG I-CHANG·Filed 2009·Granted Sep 25, 2012·0 cites·11 claims
- 2741US2010327451A1Alignment markCHOU LING-CHUN·Filed 2010·Application pending·0 cites
- 2841US2010308220A1Inspection structure and method for in-line monitoring waferUNITED MICROLELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 2937US2013089962A1Semiconductor processCHANG CHUNG-FU·Filed 2011·Application pending·0 cites
- 3037US2013171789A1Method for manufacturing semiconductor deviceCHOU LING-CHUN·Filed 2012·Application pending·0 cites
- 3135US2012196421A1Stress adjusting methodCHANG TSUNG-HUNG·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →