Inventor · disambiguated record
Liying Jiang
Also filed as: JIANG LIYING
15 granted patents·15 citations·filing 2016–2021
88Inventor score
Files withIBM15
Top patents by PatentIndex Score
15 records- 0189US10224429B2Precise junction placement in vertical semiconductor devices using etch stop layersIBM·Filed 2017·Granted Mar 5, 2019·4 cites·20 claims
- 0286US9954101B2Precise junction placement in vertical semiconductor devices using etch stop layersIBM·Filed 2016·Granted Apr 24, 2018·3 cites·11 claims
- 0382US10811599B2Co-fabrication of magnetic device structures with electrical interconnects having reduced resistance through increased conductor grain sizeIBM·Filed 2019·Granted Oct 20, 2020·2 cites·20 claims
- 0480US10361364B2Co-fabrication of magnetic device structures with electrical interconnects having reduced resistance through increased conductor grain sizeIBM·Filed 2017·Granted Jul 23, 2019·2 cites·11 claims
- 0579US10833180B2Self-aligned tunneling field effect transistorsIBM·Filed 2018·Granted Nov 10, 2020·2 cites·20 claims
- 0678US11088278B2Precise junction placement in vertical semiconductor devices using etch stop layersIBM·Filed 2019·Granted Aug 10, 2021·1 cites·20 claims
- 0772US10664966B2Anomaly detection using image-based physical characterizationIBM·Filed 2018·Granted May 26, 2020·1 cites·18 claims
- 0864US11244869B2Fabrication of logic devices and power devices on the same substrateIBM·Filed 2020·Granted Feb 8, 2022·0 cites·20 claims
- 0963US10756260B2Co-fabrication of magnetic device structures with electrical interconnects having reduced resistance through increased conductor grain sizeIBM·Filed 2019·Granted Aug 25, 2020·0 cites·20 claims
- 1061US11282186B2Anomaly detection using image-based physical characterizationIBM·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 1161US10249754B2Precise junction placement in vertical semiconductor devices using etch stop layersIBM·Filed 2018·Granted Apr 2, 2019·0 cites·20 claims
- 1260US11682718B2Vertical bipolar junction transistor with all-around extrinsic base and epitaxially graded intrinsic baseIBM·Filed 2021·Granted Jun 20, 2023·0 cites·19 claims
- 1355US10903162B2Fuse element resistance enhancement by laser anneal and ion implantationIBM·Filed 2019·Granted Jan 26, 2021·0 cites·9 claims
- 1453US10685886B2Fabrication of logic devices and power devices on the same substrateIBM·Filed 2017·Granted Jun 16, 2020·0 cites·13 claims
- 1548US11177132B2Self aligned block masks for implantation controlIBM·Filed 2019·Granted Nov 16, 2021·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →