Inventor · disambiguated record
Lu Chen
Also filed as: CHEN LU · Chen lu-an
46 granted patents·9 pending applications·207 citations·filing 2004–2024
97Inventor score
Top patents by PatentIndex Score
55 records- 0195US10103742B1Multi-stage hybrid analog-to-digital converterHONG KONG APPLIED SCIENCE & TECH RESEARCH INST CO LTD·Filed 2018·Granted Oct 16, 2018·49 cites·20 claims
- 0293US12211743B2Method of forming a metal liner for interconnect structuresAPPLIED MATERIALS INC·Filed 2021·Granted Jan 28, 2025·3 cites·17 claims
- 0392US11764157B2Ruthenium liner and cap for back-end-of-line applicationsAPPLIED MATERIALS INC·Filed 2021·Granted Sep 19, 2023·2 cites·6 claims
- 0491US7218186B2Directional couplerSCIENT COMPONENTS CORP·Filed 2004·Granted May 15, 2007·49 cites·22 claims
- 0589US9153571B1Stacked electrostatic discharge (ESD) protection deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Oct 6, 2015·10 cites·23 claims
- 0688US8896024B1Electrostatic discharge protection structure and electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 25, 2014·10 cites·14 claims
- 0786US11237258B1Method for optimization of a parametric array shallow profile difference frequency conversion performanceHUNAN GUOTIAN ELECTRONIC TECH CO LTD·Filed 2021·Granted Feb 1, 2022·9 cites·7 claims
- 0885US11270911B2Doping of metal barrier layersAPPLIED MATERIALS INC·Filed 2020·Granted Mar 8, 2022·2 cites·20 claims
- 0982US8778783B2Methods for improved growth of group III nitride buffer layersMELNIK YURIY·Filed 2012·Granted Jul 15, 2014·7 cites·17 claims
- 1082US8530969B2Semiconductor deviceChen lu-an·Filed 2012·Granted Sep 10, 2013·7 cites·9 claims
- 1182US8492834B2Electrostatic discharge protection device and applications thereofLAI TAI-HSIANG·Filed 2011·Granted Jul 23, 2013·8 cites·15 claims
- 1281US8980002B2Methods for improved growth of group III nitride semiconductor compoundsMELNIK YURIY·Filed 2012·Granted Mar 17, 2015·2 cites·19 claims
- 1381US8507981B2Method of manufacturing NMOS transistor with low trigger voltageChen lu-an·Filed 2011·Granted Aug 13, 2013·7 cites·10 claims
- 1480US11410881B2Impurity removal in doped ALD tantalum nitrideAPPLIED MATERIALS INC·Filed 2020·Granted Aug 9, 2022·1 cites·20 claims
- 1577US7880446B2Adaptive frequency compensation for DC-to-DC converterVISHAY SILICONIX·Filed 2006·Granted Feb 1, 2011·9 cites·20 claims
- 1675US2025029874A1Low Resistance and High Reliability Metallization ModuleAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1774US2025112090A1Method Of Forming A Metal Liner For Interconnect StructuresAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1871US12243774B2Impurity removal in doped ALD tantalum nitrideAPPLIED MATERIALS INC·Filed 2022·Granted Mar 4, 2025·0 cites·20 claims
- 1969US11784127B2Ruthenium liner and cap for back-end-of-lineAPPLIED MATERIALS INC·Filed 2022·Granted Oct 10, 2023·0 cites·13 claims
- 2068US9343567B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted May 17, 2016·2 cites·28 claims
- 2168US7960947B2Adaptive frequency compensation for DC-to-DC converterVISHAY SILICONIX·Filed 2009·Granted Jun 14, 2011·7 cites·20 claims
- 2267US12195845B2Conditioning treatment for ALD productivityAPPLIED MATERIALS INC·Filed 2022·Granted Jan 14, 2025·0 cites·10 claims
- 2366US9325164B2Electrostatic discharge (ESD) protection device for an output bufferUNITED MICROELECTRONICS CORP·Filed 2014·Granted Apr 26, 2016·1 cites·27 claims
- 2465US12148660B2Low resistance and high reliability metallization moduleAPPLIED MATERIALS INC·Filed 2021·Granted Nov 19, 2024·0 cites·10 claims
- 2561US9142545B2Electrostatic discharge protection structure capable of preventing latch-up issue caused by unexpected noiseUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 22, 2015·1 cites·14 claims
- 2661US8723263B2Electrostatic discharge protection deviceCHAO MEI-LING·Filed 2012·Granted May 13, 2014·2 cites·14 claims
- 2761US6965280B2Three way power splitterCHEN LU·Filed 2004·Granted Nov 15, 2005·9 cites·25 claims
- 2860US12431358B2Methods and materials for enhanced barrier performance and reduced via resistanceAPPLIED MATERIALS INC·Filed 2020·Granted Sep 30, 2025·0 cites·20 claims
- 2960US7049905B2High power directional couplerSCIENT COMPONENTS COPORATION·Filed 2004·Granted May 23, 2006·8 cites·18 claims
- 3059US10262987B2Electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2017·Granted Apr 16, 2019·0 cites·4 claims
- 3159US9985525B2Power converter and switching power supply deviceSHENZHEN SKYWORTH RGB ELECTRONICS CO LTD·Filed 2016·Granted May 29, 2018·2 cites·16 claims
- 3256US2024345609A1Linear power converter circuit with surge protection circuitTRITIUM ELECTRONICS PTE LTD·Filed 2024·Application pending·0 cites
- 3355US11955382B2Reverse selective etch stop layerAPPLIED MATERIALS INC·Filed 2020·Granted Apr 9, 2024·0 cites·18 claims
- 3454US11566324B2Conditioning treatment for ALD productivityAPPLIED MATERIALS INC·Filed 2020·Granted Jan 31, 2023·0 cites·12 claims
- 3554US9303318B2Multiple complementary gas distribution assembliesAPPLIED MATERIALS INC·Filed 2012·Granted Apr 5, 2016·0 cites·19 claims
- 3654US9041110B2Semiconductor device for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2013·Granted May 26, 2015·0 cites·6 claims
- 3754US2020226694A1Reducing supply-demand gapMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2019·Application pending·0 cites
- 3851US9825021B2Semiconductor device for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 21, 2017·0 cites·12 claims
- 3951US9263562B2Electrostatic discharge protection structure capable of preventing latch-up issue caused by unexpected noiseUNITED MICROELECTRONICS CORP·Filed 2014·Granted Feb 16, 2016·0 cites·14 claims
- 4050US9443841B2Electrostatic discharge protection structure capable of preventing latch-up issue caused by unexpected noiseUNITED MICROELECTRONICS CORP·Filed 2016·Granted Sep 13, 2016·0 cites·17 claims
- 4149US2023070489A1Doped tantalum-containing barrier filmsAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 4248US9443927B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 13, 2016·0 cites·14 claims
- 4347US9496251B2Electrostatic discharge protectorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 15, 2016·0 cites·7 claims
- 4446US2016204598A1Electrostatic discharge protection circuit and electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 4545US9142540B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 22, 2015·0 cites·15 claims
- 4644US9660072B2Laterally diffused metal oxide semiconductor and field drift metal oxide semiconductorUNITED MICROELECTRONICS CORP·Filed 2014·Granted May 23, 2017·0 cites·6 claims
- 4744US9362420B2Transistor structure for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 7, 2016·0 cites·14 claims
- 4843US10319521B2Conductor-insulator-conductor capacitor and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jun 11, 2019·0 cites·18 claims
- 4943US8853086B2Methods for pretreatment of group III-nitride depositionsMELNIK YURIY·Filed 2012·Granted Oct 7, 2014·0 cites·19 claims
- 5043US8477467B2Electrostatic discharge protection circuitChen lu-an·Filed 2011·Granted Jul 2, 2013·0 cites·27 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →