Inventor · disambiguated record
Masaru Sugimoto
Also filed as: SUGIMOTO MASARU
39 granted patents·11 pending applications·1,822 citations·filing 1986–2021
98Inventor score
Files withTOKYO ELECTRON LTD18FUJIKURA LTD6KOSHIISHI AKIRA5MATSUSHITA ELECTRIC WORKS LTD5TOYOTA MOTOR CO LTD4
Top patents by PatentIndex Score
50 records- 0198US7951262B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2005·Granted May 31, 2011·486 cites·21 claims
- 0297US8603293B2Plasma processing apparatus and methodKOSHIISHI AKIRA·Filed 2011·Granted Dec 10, 2013·73 cites·22 claims
- 0397US7988816B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2005·Granted Aug 2, 2011·63 cites·22 claims
- 0497US6874910B2Light source device using LED, and method of producing sameMATSUSHITA ELECTRIC WORKS LTD·Filed 2001·Granted Apr 5, 2005·278 cites·22 claims
- 0595US7740737B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2005·Granted Jun 22, 2010·25 cites·14 claims
- 0695US6930332B2Light emitting device using LEDMATSUSHITA ELECTRIC WORKS LTD·Filed 2002·Granted Aug 16, 2005·124 cites·14 claims
- 0795US6331063B1LED luminaire with light control meansMATSUSHITA ELECTRIC WORKS LTD·Filed 1998·Granted Dec 18, 2001·218 cites·13 claims
- 0894US7495322B2Light-emitting devicePANASONIC ELEC WORKS CO LTD·Filed 2004·Granted Feb 24, 2009·120 cites·3 claims
- 0994US7084435B2Light emitting device using LEDMATSUSHITA ELECTRIC WORKS LTD·Filed 2003·Granted Aug 1, 2006·107 cites·20 claims
- 1093US8137471B2Plasma processing apparatus and methodKOSHIISHI AKIRA·Filed 2010·Granted Mar 20, 2012·12 cites·22 claims
- 1190US7717589B2Light emitting device using light emitting diode chipPANASONIC ELEC WORKS CO LTD·Filed 2004·Granted May 18, 2010·75 cites·18 claims
- 1289US10861678B2Plasma etching apparatus and methodTOKYO ELECTRON LTD·Filed 2018·Granted Dec 8, 2020·4 cites·15 claims
- 1389US9490105B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2013·Granted Nov 8, 2016·6 cites·19 claims
- 1488US8852385B2Plasma etching apparatus and methodKOSHIISHI AKIRA·Filed 2007·Granted Oct 7, 2014·12 cites·17 claims
- 1587US10854431B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2019·Granted Dec 1, 2020·2 cites·12 claims
- 1687US10229815B2Plasma etching apparatus and methodTOKYO ELECTRON LTD·Filed 2014·Granted Mar 12, 2019·6 cites·14 claims
- 1786US5045527AMethod of producing a superconductive oxide conductorFUJIKURA LTD·Filed 1988·Granted Sep 3, 1991·43 cites·27 claims
- 1883US10546727B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2016·Granted Jan 28, 2020·2 cites·9 claims
- 1980US8790490B2Plasma processing apparatus and methodKOSHIISHI AKIRA·Filed 2012·Granted Jul 29, 2014·3 cites·14 claims
- 2078US10619229B2Manufacturing method of wear-resistant iron-based sintered alloy and wear-resistant iron-based sintered alloyTOYOTA MOTOR CO LTD·Filed 2017·Granted Apr 14, 2020·1 cites·3 claims
- 2178US7326358B2Plasma processing method and apparatus, and storage mediumTOKYO ELECTRON LTD·Filed 2005·Granted Feb 5, 2008·5 cites·8 claims
- 2277US10213830B2Production method of sintered alloy, sintered-alloy compact, and sintered alloyTOYOTA MOTOR CO LTD·Filed 2017·Granted Feb 26, 2019·1 cites·10 claims
- 2377US9950369B2Manufacturing method of sintered alloy, compact for sintering, and sintered alloyTOYOTA MOTOR CO LTD·Filed 2017·Granted Apr 24, 2018·1 cites·10 claims
- 2476US10058922B2Compact for producing a sintered alloy, a wear-resistant iron-based sintered alloy, and a method for producing the sameTOYOTA MOTOR CO LTD·Filed 2015·Granted Aug 28, 2018·1 cites·3 claims
- 2576US6954079B2Interface circuit coupling semiconductor test apparatus with tested semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Oct 11, 2005·23 cites·17 claims
- 2675US9805945B2Etching methodTOKYO ELECTRON LTD·Filed 2016·Granted Oct 31, 2017·2 cites·10 claims
- 2774US2021082669A1Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2020·Application pending·0 cites
- 2873US7079060B2Test circuit for evaluating characteristic of analog signal of deviceRENESAS TECH CORP·Filed 2005·Granted Jul 18, 2006·7 cites·9 claims
- 2969US4965245AMethod of producing oxide superconducting cables and coils using copper alloy filament precursorsFUJIKURA LTD·Filed 1988·Granted Oct 23, 1990·31 cites·13 claims
- 3069US4665611AMethod of fabricating superconductive electrical conductorFUJIKURA LTD·Filed 1986·Granted May 19, 1987·25 cites·10 claims
- 3165US5283232AMethod for producing oxide superconducting composite wireFUJIKURA LTD·Filed 1992·Granted Feb 1, 1994·20 cites·11 claims
- 3259US2014326409A1Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2014·Application pending·0 cites
- 3358US2016358753A1Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2016·Application pending·0 cites
- 3457US6281698B1LSI testing apparatus and timing calibration method for use therewithMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 28, 2001·21 cites·13 claims
- 3556US10529539B2Plasma processing apparatus and methodTOKYO ELECTRON LTD·Filed 2016·Granted Jan 7, 2020·0 cites·8 claims
- 3655US11605712B2Fabrication process flow of dielectric layer for isolation of nano-sheet devices on bulk silicon substrateTOKYO ELECTRON LTD·Filed 2021·Granted Mar 14, 2023·0 cites·18 claims
- 3754US6796027B2Method of manufacturing printed wiring boardMATSUSHITA ELECTRIC WORKS LTD·Filed 2002·Granted Sep 28, 2004·5 cites·17 claims
- 3853US5168127AOxide superconducting wireFUJIKURA LTD·Filed 1992·Granted Dec 1, 1992·13 cites·2 claims
- 3953US2008105378A1Plasma processing method and apparatus, and storage mediumTOKYO ELECTRON LTD·Filed 2007·Application pending·0 cites
- 4049US9811450B2Semiconductor test apparatus for controlling testerRENESAS ELECTRONICS CORP·Filed 2014·Granted Nov 7, 2017·0 cites·6 claims
- 4149US2011214815A1Plasma processing apparatus and methodKOSHIISHI AKIRA·Filed 2011·Application pending·0 cites
- 4248US2021376123A1Substrate processing method for forming inner spacers in a nano-sheet deviceTOKYO ELECTRON LTD·Filed 2021·Application pending·0 cites
- 4347US6546525B2LSI testing apparatusMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 8, 2003·4 cites·20 claims
- 4447US2018039571A1Semiconductor test apparatus for controlling testerRENESAS ELECTRONICS CORP·Filed 2017·Application pending·0 cites
- 4545US9557384B2Testing deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Jan 31, 2017·0 cites·6 claims
- 4644US2007163995A1Plasma processing method, apparatus and storage mediumTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 4736US2002006040A1Led luminaire with light control meansFiled 2001·Application pending·0 cites
- 4835US2001006184A1Welding wire holderHONDA MOTOR CO LTD·Filed 2000·Application pending·0 cites
- 4934US2004012958A1Light emitting device comprising led chipFiled 2002·Application pending·0 cites
- 5032US5108986ASubstituted YiBa2 Cu3 oxide superconductorFUJIKURA LTD·Filed 1990·Granted Apr 28, 1992·3 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →