Inventor · disambiguated record
Mark Wiltse
Also filed as: WILTSE MARK
6 granted patents·3 pending applications·166 citations·filing 1996–2012
85Inventor score
Files withAPPLIED MATERIALS INC3IBM1INTEGRATED SURFACE TECHNOLOGIE1KLA TENCOR CORP1KLA TENCOR TECH CORP1
Top patents by PatentIndex Score
9 records- 0189US6537011B1Method and apparatus for transferring and supporting a substrateAPPLIED MATERIALS INC·Filed 2000·Granted Mar 25, 2003·68 cites·22 claims
- 0285US8104342B2Process condition measuring deviceSUN MEI H·Filed 2008·Granted Jan 31, 2012·16 cites·37 claims
- 0375US7924408B2Temperature effects on overlay accuracyKLA TENCOR TECH CORP·Filed 2007·Granted Apr 12, 2011·4 cites·17 claims
- 0475US7901250B2Electrical adapter for a connector having a retention latchIBM·Filed 2009·Granted Mar 8, 2011·16 cites·19 claims
- 0567US5893643AApparatus for measuring pedestal temperature in a semiconductor wafer processing systemAPPLIED MATERIALS INC·Filed 1997·Granted Apr 13, 1999·37 cites·15 claims
- 0661US5851926AMethod for etching transistor gates using a hardmaskAPPLIED MATERIALS INC·Filed 1996·Granted Dec 22, 1998·25 cites·5 claims
- 0755US2010080957A1Surface CoatingINTEGRATED SURFACE TECHNOLOGIE·Filed 2008·Application pending·0 cites
- 0846US2013029433A1Process condition measuring deviceKLA TENCOR CORP·Filed 2012·Application pending·0 cites
- 0943US2004140963A1Stylus having variable reflectivity and method for data input therewithFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →