Inventor · disambiguated record
Ming Di
Also filed as: DI MING-CHUN · Di ming
8 granted patents·7 pending applications·29 citations·filing 2010–2024
82Inventor score
Top patents by PatentIndex Score
15 records- 0192US9595481B1Dispersion model for band gap trackingKLA TENCOR CORP·Filed 2014·Granted Mar 14, 2017·18 cites·20 claims
- 0286US11378451B2Bandgap measurements of patterned film stacks using spectroscopic metrologyKLA TENCOR CORP·Filed 2017·Granted Jul 5, 2022·3 cites·44 claims
- 0373US10079183B2Calculated electrical performance metrics for process monitoring and yield managementKLA TENCOR CORP·Filed 2014·Granted Sep 18, 2018·3 cites·19 claims
- 0471US11796390B2Bandgap measurements of patterned film stacks using spectroscopic metrologyKLA CORP·Filed 2022·Granted Oct 24, 2023·0 cites·14 claims
- 0570US10410935B1Dispersion model for band gap trackingKLA TENCOR CORP·Filed 2017·Granted Sep 10, 2019·1 cites·16 claims
- 0664US2024353352A1Methods And Systems For Nanoscale Imaging Based On Second Harmonic Signal Generation And Through-Focus Scanning Optical MicroscopyKLA CORP·Filed 2024·Application pending·0 cites
- 0762US10770362B1Dispersion model for band gap trackingKLA CORP·Filed 2019·Granted Sep 8, 2020·0 cites·19 claims
- 0861US2025349623A1Measurement Condition Dependent, Multi-Dimensional Model Of Optical Dispersion Of Semiconductor StructuresKLA CORP·Filed 2024·Application pending·0 cites
- 0960US9442063B2Measurement of composition for thin filmsDi ming·Filed 2012·Granted Sep 13, 2016·1 cites·33 claims
- 1060US2024176206A1Interface-based thin film metrology using second harmonic generationKLA CORP·Filed 2023·Application pending·0 cites
- 1156US2024418633A1Combination of multiwavelength raman and spectroscopic ellipsometry to measure a film stackKLA CORP·Filed 2023·Application pending·0 cites
- 1254US2024053280A1Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation ModelKLA CORP·Filed 2023·Application pending·0 cites
- 1353US2024221149A1Interface-based defect inspection using second harmonic generationKLA CORP·Filed 2023·Application pending·0 cites
- 1438US2019242938A1Methods of bandgap analysis and modeling for high k metal gateGLOBALFOUNDRIES INC·Filed 2018·Application pending·0 cites
- 1530USD659532SCombined foam dispensing pump and capDI MING-CHUN·Filed 2010·Granted May 15, 2012·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →