Inventor · disambiguated record
Motoyuki Sato
Also filed as: SATO MOTOYUKI
37 granted patents·28 pending applications·411 citations·filing 1981–2025
97Inventor score
Top patents by PatentIndex Score
65 records- 0195US8779410B2Resistance change memory and method of manufacturing the sameSATO MOTOYUKI·Filed 2012·Granted Jul 15, 2014·35 cites·19 claims
- 0293US5508616AApparatus and method for determining parameters of formations surrounding a borehole in a preselected directionSEKIYUSHIGEN KAIHATSU KABUSHIK·Filed 1993·Granted Apr 16, 1996·167 cites·6 claims
- 0389US7055535B2Holding unit, processing apparatus and holding method of substratesEBARA CORP·Filed 2003·Granted Jun 6, 2006·38 cites·11 claims
- 0485US2025335545A1Automated Non-Synchronization Detection and Resolution to Support Decision Making in Complex SystemsNEC LAB AMERICA INC·Filed 2025·Application pending·0 cites
- 0585US2025335546A1Automated Non-Synchronization Detection and Resolution to Support Decision Making in Complex SystemsNEC LAB AMERICA INC·Filed 2025·Application pending·0 cites
- 0685US2025335544A1Automated Non-Synchronization Detection and Resolution to Support Decision Making in Complex SystemsNEC LAB AMERICA INC·Filed 2025·Application pending·0 cites
- 0784US6431185B1Apparatus and method for cleaning a semiconductor substrateTOSHIBA KK·Filed 1999·Granted Aug 13, 2002·60 cites·11 claims
- 0881US12406025B2Automated non-synchronization and resolution to support decision making in complex systemsNEC LAB AMERICA INC·Filed 2024·Granted Sep 2, 2025·0 cites·20 claims
- 0979US7521309B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2007·Granted Apr 21, 2009·6 cites·10 claims
- 1077US2023280739A1Histogram model for categorical anomaly detectionNEC LAB AMERICA INC·Filed 2023·Application pending·0 cites
- 1177US2023281186A1Explainable anomaly detection for categorical sensor dataNEC LAB AMERICA INC·Filed 2023·Application pending·0 cites
- 1273US8796755B2Nonvolatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Aug 5, 2014·3 cites·20 claims
- 1369US7375403B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2003·Granted May 20, 2008·11 cites·4 claims
- 1466US8803219B2Nonvolatile semiconductor memory device and method of manufacturingTOSHIBA KK·Filed 2013·Granted Aug 12, 2014·1 cites·12 claims
- 1566US7687869B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2008·Granted Mar 30, 2010·2 cites·15 claims
- 1666US7652341B2Semiconductor apparatus having a semicondutor element with a high dielectric constant filmTOSHIBA KK·Filed 2007·Granted Jan 26, 2010·2 cites·20 claims
- 1764US2025006229A1Semiconductor memory deviceTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1862US6420271B2Method of forming a patternTOSHIBA KK·Filed 2001·Granted Jul 16, 2002·8 cites·20 claims
- 1961US8076193B2CMOS device fabrication method with PMOS interface insulating film formed concurrently with sidewall insulating filmSATO MOTOYUKI·Filed 2006·Granted Dec 13, 2011·2 cites·14 claims
- 2061US2015008482A1Semiconductor device and manufacturing method thereofTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2161US2025355843A1Generating categorical data for missing values in anomaly detection systemsNEC LAB AMERICA INC·Filed 2025·Application pending·0 cites
- 2260US8895387B2Method of manufacturing nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Nov 25, 2014·1 cites·18 claims
- 2359US4383703ATandem axle suspension assemblyMITSUBISHI STEEL MFG·Filed 1981·Granted May 17, 1983·25 cites·8 claims
- 2458US8337642B2Spring steel with improved hardenability and pitting resistanceFUKUZUMI TATSUO·Filed 2012·Granted Dec 25, 2012·0 cites·3 claims
- 2558US6673163B2Apparatus and method for cleaning a semiconductor substrateTOSHIBA KK·Filed 2002·Granted Jan 6, 2004·5 cites·15 claims
- 2658US2010003813A1Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2009·Application pending·0 cites
- 2757US6679950B2Cleaning method and cleanerEBARA CORP·Filed 2001·Granted Jan 20, 2004·5 cites·18 claims
- 2856US7265427B2Semiconductor apparatus and method of manufacturing the semiconductor apparatusTOSHIBA KK·Filed 2004·Granted Sep 4, 2007·5 cites·13 claims
- 2955US7850794B2Spring steel with improved hardenability and pitting resistanceMITSUBISHI STEEL MFG·Filed 2003·Granted Dec 14, 2010·1 cites·3 claims
- 3055US7824976B2Semiconductor apparatus and method of manufacturing the semiconductor apparatusTOSHIBA KK·Filed 2009·Granted Nov 2, 2010·0 cites·6 claims
- 3155US6627902B2Dose reading device and dose reading magazineASAHI TECHNO GLASS CORP·Filed 2001·Granted Sep 30, 2003·2 cites·21 claims
- 3255US2024412970A1Manufacturing method for semiconductor deviceTOKYO ELECTRON LTD·Filed 2022·Application pending·0 cites
- 3354US8754433B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2012·Granted Jun 17, 2014·0 cites·8 claims
- 3454US8197614B2Spring steel with improved hardenability and pitting resistanceFUKUZUMI TATSUO·Filed 2010·Granted Jun 12, 2012·0 cites·3 claims
- 3554US2007197048A1Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2007·Application pending·0 cites
- 3654US2009000547A1Semiconductor device fabrication method and fabrication apparatusTOSHIBA KK·Filed 2008·Application pending·0 cites
- 3754US2014315378A1Nonvolatile semiconductor memory device and method of manufacturingTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3854US2024387176A1Stacked substrate for laser lift-off, substrate processing method, and substrate processing apparatusTOKYO ELECTRON LTD·Filed 2022·Application pending·0 cites
- 3953US2025201721A1Substrate bonding method and bonded substrateTOKYO ELECTRON LTD·Filed 2025·Application pending·0 cites
- 4051US7501335B2Semiconductor device and manufacturing method of the sameTOSHIBA KK·Filed 2004·Granted Mar 10, 2009·2 cites·11 claims
- 4151US7427518B2Semiconductor device fabrication method and fabrication apparatusTOSHIBA KK·Filed 2005·Granted Sep 23, 2008·0 cites·17 claims
- 4251US7220681B2Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2005·Granted May 22, 2007·0 cites·14 claims
- 4350US5057693ARadiation dose reading apparatusKERNFORSCHUNGSZ KARLSRUHE·Filed 1990·Granted Oct 15, 1991·13 cites·7 claims
- 4449US7968397B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2010·Granted Jun 28, 2011·0 cites·15 claims
- 4546US7141466B2Method of fabricating semiconductor device having gate insulating film comprising a silicate nitride film with interface insulating filmTOSHIBA KK·Filed 2004·Granted Nov 28, 2006·2 cites·8 claims
- 4644US2009032883A1Semiconductor deviceNEC ELECTRONICS CORP·Filed 2008·Application pending·0 cites
- 4744US2012074504A1Semiconductor device and method of fabricating the sameSATO MOTOYUKI·Filed 2011·Application pending·0 cites
- 4844US2011294291A1Semiconductor device and method of manufacturing the sameMATSUI YUKITERU·Filed 2011·Application pending·0 cites
- 4943US2008027648A1Detection-Object-Position-Specifying Device and Method of Specifying Position of Object to Be DetectedTOKYO GAS CO LTD·Filed 2005·Application pending·0 cites
- 5042US8754465B2Semiconductor device with fixed charge layersSATO MOTOYUKI·Filed 2012·Granted Jun 17, 2014·0 cites·19 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →