Inventor · disambiguated record
Myungjun Lee
Also filed as: LEE MYUNGJUN
27 granted patents·8 pending applications·74 citations·filing 2007–2025
94Inventor score
Top patents by PatentIndex Score
35 records- 0197US10095122B1Systems and methods for fabricating metrology targets with sub-resolution featuresKLA TENCOR CORP·Filed 2016·Granted Oct 9, 2018·18 cites·18 claims
- 0294US12347096B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 1, 2025·2 cites·12 claims
- 0391US12002698B2Metrology apparatus and method based on diffraction using oblique illumination and method of manufacturing semiconductor device using the metrology methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 4, 2024·4 cites·16 claims
- 0491US11726046B2Multi-scale spectral imaging apparatuses and methods, and methods of manufacturing semiconductor devices by using the imaging methodsSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 15, 2023·4 cites·15 claims
- 0589US10018919B2System and method for fabricating metrology targets oriented with an angle rotated with respect to device featuresKLA TENCOR CORP·Filed 2016·Granted Jul 10, 2018·4 cites·23 claims
- 0688US11972960B2Imaging ellipsometry (IE)-based inspection method and method of fabricating semiconductor device by using IE-based inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 30, 2024·3 cites·17 claims
- 0786US9040192B2Lithium rechargeable batteryLEE SEONGJOON·Filed 2009·Granted May 26, 2015·13 cites·22 claims
- 0881US10579768B2Process compatibility improvement by fill factor modulationKLA TENCOR CORP·Filed 2016·Granted Mar 3, 2020·3 cites·5 claims
- 0979US12117347B2Metrology target design for tilted device designsKLA CORP·Filed 2016·Granted Oct 15, 2024·2 cites·40 claims
- 1079US11988495B2Through-focus image-based metrology device, operation method thereof, and computing device for executing the operationSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 21, 2024·1 cites·16 claims
- 1179US10209627B2Systems and methods for focus-sensitive metrology targetsKLA TENCOR CORP·Filed 2017·Granted Feb 19, 2019·2 cites·35 claims
- 1279US9121336B2Diesel engine pistonLEE MYUNGJUN·Filed 2011·Granted Sep 1, 2015·10 cites·9 claims
- 1378US10216096B2Process-sensitive metrology systems and methodsKLA TENCOR CORP·Filed 2016·Granted Feb 26, 2019·2 cites·19 claims
- 1476US10685165B2Metrology using overlay and yield critical patternsKLA TENCOR CORP·Filed 2016·Granted Jun 16, 2020·2 cites·6 claims
- 1576US2025035489A1Metrology target design for tilted device designsKLA CORP·Filed 2024·Application pending·0 cites
- 1672US12228499B2Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 18, 2025·0 cites·19 claims
- 1772US7833657B2External case for secondary batteries and secondary battery using the external caseSAMSUNG SDI CO LTD·Filed 2007·Granted Nov 16, 2010·2 cites·9 claims
- 1872US2025225674A1Semiconductor measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1970US9466604B2Metal segments as landing pads and local interconnects in an IC deviceGLOBALFOUNDRIES INC·Filed 2014·Granted Oct 11, 2016·2 cites·20 claims
- 2069US12045009B2Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHMSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 23, 2024·0 cites·11 claims
- 2167US2024353795A1Holographic microscope and manufacturing method of semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 2266US11604136B2Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 14, 2023·0 cites·14 claims
- 2364US11314205B2Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHMSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 26, 2022·0 cites·19 claims
- 2461US2023114817A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 2559US2025224328A1Device for measuring semiconductorsSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 2658US12405226B2Substrate inspection apparatus and substrate inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 2, 2025·0 cites·20 claims
- 2757US12038718B2Holographic microscope and manufacturing method of semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jul 16, 2024·0 cites·20 claims
- 2857US2024272561A1Method of managing semiconductor processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 2956US2024418645A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 3053US12222282B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 11, 2025·0 cites·20 claims
- 3153US11275034B2Inspection apparatus and method based on coherent diffraction imaging (CDI)SAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 15, 2022·0 cites·18 claims
- 3251US2024112881A1Substrate analysis systemSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 3348US11428947B2Super-resolution holographic microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Aug 30, 2022·0 cites·19 claims
- 3445US12307650B2Scanning electron microscope device, semiconductor manufacturing device, and method of controlling semiconductor manufacturing deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 20, 2025·0 cites·18 claims
- 3539US9419268B2Secondary battery and circuit board assembly suitable for secondary batteryLEE SEONGJOON·Filed 2010·Granted Aug 16, 2016·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →