Inventor · disambiguated record
Naoyuki Kobayashi
Also filed as: KOBAYASHI NAOYUKI
53 granted patents·18 pending applications·711 citations·filing 1991–2023
99Inventor score
Files withNIKON CORP33KOBAYASHI NAOYUKI12JAPAN STEEL WORKS LTD5JSW AKTINA SYSTEM CO LTD4HENKEL CORP2
Top patents by PatentIndex Score
71 records- 0199US7388649B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2005·Granted Jun 17, 2008·121 cites·50 claims
- 0298US7589820B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2006·Granted Sep 15, 2009·49 cites·18 claims
- 0397US7242455B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2005·Granted Jul 10, 2007·32 cites·61 claims
- 0496US7505115B2Exposure apparatus, method for producing device, and method for controlling exposure apparatusNIKON CORP·Filed 2006·Granted Mar 17, 2009·19 cites·42 claims
- 0594US8552684B2Non-contact charging module and reception-side and transmission-side non-contact charging apparatuses using the sameTABATA KENICHIRO·Filed 2012·Granted Oct 8, 2013·37 cites·31 claims
- 0694US8174668B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2007·Granted May 8, 2012·11 cites·78 claims
- 0793US9304392B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2014·Granted Apr 5, 2016·4 cites·22 claims
- 0893US8760617B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2013·Granted Jun 24, 2014·4 cites·95 claims
- 0991US9939739B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2016·Granted Apr 10, 2018·2 cites·51 claims
- 1090US9760026B2Exposure apparatus, method for producing device, and method for controlling exposure apparatusNIKON CORP·Filed 2016·Granted Sep 12, 2017·2 cites·91 claims
- 1190US8749757B2Exposure apparatus, method for producing device, and method for controlling exposure apparatusNIKON CORP·Filed 2013·Granted Jun 10, 2014·4 cites·125 claims
- 1289US6002987AMethods to control the environment and exposure apparatusNIKON CORP·Filed 1997·Granted Dec 14, 1999·76 cites·23 claims
- 1388US8729855B2Non-contact charging module and non-contact chargerKOBAYASHI NAOYUKI·Filed 2011·Granted May 20, 2014·8 cites·9 claims
- 1488US5587794ASurface position detection apparatusNIKON CORP·Filed 1994·Granted Dec 24, 1996·45 cites·36 claims
- 1587US8384877B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2007·Granted Feb 26, 2013·4 cites·30 claims
- 1687US8169592B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2008·Granted May 1, 2012·4 cites·83 claims
- 1787US8130363B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2008·Granted Mar 6, 2012·4 cites·36 claims
- 1887US8125612B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2006·Granted Feb 28, 2012·4 cites·20 claims
- 1987US8072576B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2007·Granted Dec 6, 2011·4 cites·38 claims
- 2087US5973773ALens distortion measurement using moire fringesNIKON CORP·Filed 1998·Granted Oct 26, 1999·44 cites·13 claims
- 2186US9494871B2Exposure apparatus, method for producing device, and method for controlling exposure apparatusNIKON CORP·Filed 2014·Granted Nov 15, 2016·2 cites·52 claims
- 2286US8605252B2Exposure apparatus, exposure method, and method for producing deviceKOBAYASHI NAOYUKI·Filed 2012·Granted Dec 10, 2013·3 cites·17 claims
- 2386US8134682B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2007·Granted Mar 13, 2012·4 cites·28 claims
- 2483US9316921B2Exposure apparatus, exposure method, and method for producing deviceNIKON CORP·Filed 2013·Granted Apr 19, 2016·2 cites·46 claims
- 2581US12090570B2Laser processing apparatus, laser processing method, and method for manufacturing semiconductor apparatusJSW AKTINA SYSTEM CO LTD·Filed 2023·Granted Sep 17, 2024·0 cites·7 claims
- 2681US5095072AThermoplastic elastomer compositionNIPPON ZEON CO·Filed 1991·Granted Mar 10, 1992·33 cites·8 claims
- 2779US8208119B2Exposure apparatus, exposure method, and method for producing deviceKOBAYASHI NAOYUKI·Filed 2005·Granted Jun 26, 2012·3 cites·40 claims
- 2878US8451424B2Exposure apparatus, method for producing device, and method for controlling exposure apparatusMAGOME NOBUTAKA·Filed 2006·Granted May 28, 2013·4 cites·51 claims
- 2977US8089611B2Exposure apparatus and method for producing deviceNEI MASAHIRO·Filed 2009·Granted Jan 3, 2012·4 cites·21 claims
- 3076US8963490B2Non-contact charging module and reception-side and transmission-side non-contact charging apparatuses using the samePANASONIC CORP·Filed 2013·Granted Feb 24, 2015·4 cites·15 claims
- 3174US7990326B2Antenna apparatus and adjusting method thereofPANASONIC CORP·Filed 2009·Granted Aug 2, 2011·8 cites·9 claims
- 3273US7817244B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2006·Granted Oct 19, 2010·2 cites·17 claims
- 3373US5801835ASurface position detection apparatus and methodNIKON CORP·Filed 1997·Granted Sep 1, 1998·25 cites·19 claims
- 3472US7834976B2Exposure apparatus and method for producing deviceNIKON CORP·Filed 2006·Granted Nov 16, 2010·2 cites·13 claims
- 3571US7423237B2Method of cutting laminated glass with laser beamsJAPAN STEEL WORKS LTD·Filed 2004·Granted Sep 9, 2008·17 cites·4 claims
- 3671US2018196352A1Exposure apparatus and method for producing deviceNIKON CORP·Filed 2018·Application pending·0 cites
- 3770US8146251B2Method of manufacturing catalytic convertersKOBAYASHI NAOYUKI·Filed 2005·Granted Apr 3, 2012·9 cites·18 claims
- 3869US2019121246A1Exposure apparatus, method for producing device, and method for controlling exposure apparatusNIKON CORP·Filed 2018·Application pending·0 cites
- 3968US6124933AExposure apparatus utilizing surface position detection, method thereof, and semiconductor device production method using the apparatusNIKON CORP·Filed 1998·Granted Sep 26, 2000·20 cites·15 claims
- 4067US5767959ALens distortion measurement using moire fringesNIKON CORP·Filed 1997·Granted Jun 16, 1998·22 cites·16 claims
- 4166US10185232B2Exposure apparatus, method for producing device, and method for controlling exposure apparatusNIKON CORP·Filed 2017·Granted Jan 22, 2019·0 cites·26 claims
- 4266US2018348653A1Exposure apparatus, exposure method, and method for producing deviceNIKON CORP·Filed 2018·Application pending·0 cites
- 4364US5870197APrecision stage interferometer system with local single air ductNIKON CORP·Filed 1996·Granted Feb 9, 1999·23 cites·33 claims
- 4462US8780327B2Exposure apparatus and method for producing deviceKOBAYASHI NAOYUKI·Filed 2011·Granted Jul 15, 2014·0 cites·16 claims
- 4561US10048602B2Exposure apparatus, exposure method, and method for producing deviceNIKON CORP·Filed 2016·Granted Aug 14, 2018·0 cites·96 claims
- 4661US2008231825A1Exposure Apparatus and method for producing deviceNIKON CORP·Filed 2008·Application pending·0 cites
- 4756US11813694B2Laser processing apparatus, laser processing method, and method for manufacturing semiconductor apparatusJSW AKTINA SYSTEM CO LTD·Filed 2018·Granted Nov 14, 2023·0 cites·4 claims
- 4854US7285191B2Phosphate film processing method and phosphate film processing deviceFUJISYOJI CO LTD·Filed 2002·Granted Oct 23, 2007·4 cites·5 claims
- 4954US6837044B2Structure of an exhaust manifold branch collecting portionYUMEX CORP·Filed 2003·Granted Jan 4, 2005·11 cites·9 claims
- 5053US6179934B1Aqueous phosphating composition and process for metal surfacesHENKEL CORP·Filed 1998·Granted Jan 30, 2001·18 cites·22 claims
Showing the top 50 of 71 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →