Inventor · disambiguated record
Patrick J. Alladio
Also filed as: ALLADIO PATRICK J
8 granted patents·3 pending applications·145 citations·filing 2008–2017
87Inventor score
Top patents by PatentIndex Score
11 records- 0197US8536889B2Electrically conductive pins for microcircuit testerNELSON JOHN E·Filed 2010·Granted Sep 17, 2013·47 cites·20 claims
- 0295US9007082B2Electrically conductive pins for microcircuit testerNELSON JOHN E·Filed 2012·Granted Apr 14, 2015·19 cites·29 claims
- 0393US8441275B1Electronic device test fixtureALLADIO PATRICK J·Filed 2011·Granted May 14, 2013·51 cites·20 claims
- 0489US8102184B2Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2008·Granted Jan 24, 2012·19 cites·57 claims
- 0583US8912811B2Test contact system for testing integrated circuits with packages having an array of signal and power contactsSHERRY JEFFREY C·Filed 2012·Granted Dec 16, 2014·5 cites·21 claims
- 0676US8937484B2Microcircuit tester with slideable electrically conductive pinsNELSON JOHN E·Filed 2013·Granted Jan 20, 2015·3 cites·14 claims
- 0762US10877090B2Electrically conductive pins for microcircuit testerJOHNSTECH INT CORP·Filed 2017·Granted Dec 29, 2020·0 cites·19 claims
- 0854US2015123689A1Electrically Conductive Pins For Microcircuit TesterJOHNSTECH INT CORP·Filed 2015·Application pending·0 cites
- 0950US2012062261A1Electrically Conductive Pins For Microcircuit TesterNELSON JOHN E·Filed 2011·Application pending·0 cites
- 1049US7994808B2Contact insert for a microcircuit test socketJOHNSTECH INT CORP·Filed 2008·Granted Aug 9, 2011·1 cites·16 claims
- 1136US2008297142A1Contact insert for a microcircuit test socketALLADIO PATRICK J·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →