Inventor · disambiguated record
Robert Sauer
Also filed as: SAUER ROBERT · SAUER ROBERT F
7 granted patents·6 pending applications·133 citations·filing 1996–2007
87Inventor score
Files withADVANTEST CORP11
Top patents by PatentIndex Score
13 records- 0181US7437261B2Method and apparatus for testing integrated circuitsADVANTEST CORP·Filed 2004·Granted Oct 14, 2008·17 cites·24 claims
- 0281US6747447B2Locking apparatus and loadboard assemblyADVANTEST CORP·Filed 2002·Granted Jun 8, 2004·30 cites·13 claims
- 0372US7089135B2Event based IC test systemADVANTEST CORP·Filed 2002·Granted Aug 8, 2006·15 cites·17 claims
- 0469US6710590B1Test head Hifix for semiconductor device testing apparatusADVANTEST CORP·Filed 2002·Granted Mar 23, 2004·17 cites·16 claims
- 0560US5951704ATest system emulatorADVANTEST CORP·Filed 1997·Granted Sep 14, 1999·40 cites·3 claims
- 0642US2004181731A1Semiconductor test system storing pin calibration data, commands and other data in non-volatile memoryADVANTEST CORP·Filed 2004·Application pending·0 cites
- 0741US6771062B1Apparatus for supporting and manipulating a testhead in an automatic test equipment systemADVANTEST CORP·Filed 2003·Granted Aug 3, 2004·2 cites·29 claims
- 0841US2008016396A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0941US2008010524A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1039US5828985ASemiconductor test systemADVANTEST CORP·Filed 1996·Granted Oct 27, 1998·12 cites·3 claims
- 1137US2003217341A1Architecture and design of universal IC test systemFiled 2002·Application pending·0 cites
- 1234US2003110427A1Semiconductor test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2003·Application pending·0 cites
- 1333US2005039079A1Test emulator, test module emulator, and record medium storing program thereinFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →