Inventor · disambiguated record
Ryuji Kono
Also filed as: KONO RYUJI
10 granted patents·1 pending application·147 citations·filing 1998–2009
90Inventor score
Top patents by PatentIndex Score
11 records- 0189US6305230B1Connector and probing systemHITACHI LTD·Filed 1998·Granted Oct 23, 2001·79 cites·14 claims
- 0276US6759258B2Connection device and test systemRENESAS TECH CORP·Filed 2001·Granted Jul 6, 2004·14 cites·17 claims
- 0369US6626994B1Silicon wafer for epitaxial wafer, epitaxial wafer, and method of manufacture thereofSHINETSU HANDOTAI KK·Filed 2000·Granted Sep 30, 2003·12 cites·16 claims
- 0464US7541202B2Connection device and test systemRENESAS TECH CORP·Filed 2007·Granted Jun 2, 2009·1 cites·10 claims
- 0560US6573112B2Semiconductor device manufacturing methodHITACHI LTD·Filed 2002·Granted Jun 3, 2003·6 cites·10 claims
- 0658US7214271B2Silicon single crystal wafer process apparatus, silicon single crystal wafer, and manufacturing method of silicon epitaxial waferSHINETSU HANDOTAI KK·Filed 2002·Granted May 8, 2007·7 cites·6 claims
- 0754US7285430B2Connection device and test systemHITACHI LTD·Filed 2004·Granted Oct 23, 2007·3 cites·8 claims
- 0854US6511857B1Process for manufacturing semiconductor deviceHITACHI LTD·Filed 1999·Granted Jan 28, 2003·15 cites·18 claims
- 0952US2009209053A1Connection device and test systemKASUKABE SUSUMU·Filed 2009·Application pending·0 cites
- 1045US6479305B2Semiconductor device manufacturing methodHITACHI LTD·Filed 1999·Granted Nov 12, 2002·10 cites·13 claims
- 1139US7119362B2Method of manufacturing semiconductor apparatusRENESAS TECH CORP·Filed 2002·Granted Oct 10, 2006·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →