Inventor · disambiguated record
Shyh-Horng Lin
Also filed as: LIN SHYH-HORNG
15 granted patents·4 pending applications·265 citations·filing 2002–2022
93Inventor score
Files withSYNTEST TECHNOLOGIES INC10IND TECH RES INST3NVIDIA CORP2IND TECHNOLOGY RES INST ITRI1SYNTEST TECH INC1
Top patents by PatentIndex Score
19 records- 0196US7412672B1Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Aug 12, 2008·36 cites·58 claims
- 0293US6957403B2Computer-aided design system to automate scan synthesis at register-transfer levelSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Oct 18, 2005·69 cites·68 claims
- 0391US7191373B2Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniquesSYNTEST TECHNOLOGIES INC·Filed 2002·Granted Mar 13, 2007·48 cites·19 claims
- 0489US11808805B1Heterogenous voltage-based testing via on-chip voltage regulator circuitsNVIDIA CORP·Filed 2022·Granted Nov 7, 2023·2 cites·20 claims
- 0588US7331032B2Computer-aided design system to automate scan synthesis at register-transfer levelSYNTEST TECHNOLOGIES INC·Filed 2005·Granted Feb 12, 2008·12 cites·11 claims
- 0687US7512851B2Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2004·Granted Mar 31, 2009·39 cites·46 claims
- 0786US7552373B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Jun 23, 2009·36 cites·44 claims
- 0878US7444567B2Method and apparatus for unifying self-test with scan-test during prototype debug and production testSYNTEST TECHNOLOGIES INC·Filed 2003·Granted Oct 28, 2008·17 cites·18 claims
- 0977US11328112B1Timing-aware testingNVIDIA CORP·Filed 2021·Granted May 10, 2022·1 cites·25 claims
- 1064US8543950B2Computer-aided design system to automate scan synthesis at register-transfer levelWANG LAUNG-TERNG L-T·Filed 2012·Granted Sep 24, 2013·1 cites·4 claims
- 1163US9474735B2Liver function improvement and treatment of liver diseaseIND TECH RES INST·Filed 2014·Granted Oct 25, 2016·0 cites·11 claims
- 1259US7721173B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2009·Granted May 18, 2010·3 cites·47 claims
- 1353US9696377B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECH INC·Filed 2015·Granted Jul 4, 2017·0 cites·12 claims
- 1452US9682062B2Pharmaceutical compositions and method for inhibiting angiogenesisIND TECH RES INST·Filed 2013·Granted Jun 20, 2017·0 cites·2 claims
- 1549US7228479B2IEEE Std. 1149.4 compatible analog BIST methodologySYNTEST TECHNOLOGIES INC·Filed 2005·Granted Jun 5, 2007·1 cites·14 claims
- 1647US2008276141A1Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 1745US2011158933A1Liver function and treatment of liver diseaseIND TECHNOLOGY RES INST ITRI·Filed 2010·Application pending·0 cites
- 1837US2016008319A1Pharmaceutical compositions for inhibiting angiogenesisIND TECH RES INST·Filed 2015·Application pending·0 cites
- 1930US2002194558A1Method and system to optimize test cost and disable defects for scan and BIST memoriesFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →