Inventor · disambiguated record
Sia Choon Beng
Also filed as: BENG SIA CHOON
8 granted patents·94 citations·filing 2002–2020
85Inventor score
Top patents by PatentIndex Score
8 records- 0186US10330703B2Probe systems and methods including electric contact detectionCASCADE MICROTECH INC·Filed 2018·Granted Jun 25, 2019·3 cites·21 claims
- 0282US6714112B2Silicon-based inductor with varying metal-to-metal conductor spacingCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Mar 30, 2004·37 cites·25 claims
- 0377US6777774B2Low noise inductor using electrically floating high resistive and grounded low resistive patterned shieldCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Aug 17, 2004·29 cites·31 claims
- 0474US11016121B2Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-testFORMFACTOR INC·Filed 2019·Granted May 25, 2021·2 cites·20 claims
- 0569US6486017B1Method of reducing substrate coupling for chip inductors by creation of dielectric islands by selective EPI depositionCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Nov 26, 2002·15 cites·30 claims
- 0663US11181550B2Probe systems and methods including electric contact detectionFORMFACTOR INC·Filed 2019·Granted Nov 23, 2021·0 cites·23 claims
- 0757US6608362B1Method and device for reducing capacitive and magnetic effects from a substrate by using a schottky diode under passive componentsCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Aug 19, 2003·8 cites·17 claims
- 0852US11454799B2Microscopes with objective assembly crash detection and methods of utiliizing the sameFORMFACTOR INC·Filed 2020·Granted Sep 27, 2022·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →