Inventor · disambiguated record
Steve Cui
Also filed as: CUI STEVE · CUI STEVE YIFENG
8 granted patents·1 pending application·89 citations·filing 2003–2020
84Inventor score
Top patents by PatentIndex Score
9 records- 0189US7103484B1Non-contact methods for measuring electrical thickness and determining nitrogen content of insulating filmsKLA TENCOR TECH CORP·Filed 2003·Granted Sep 5, 2006·54 cites·25 claims
- 0287US7728965B2Systems and methods for inspecting an edge of a specimenKLA TENCOR TECH CORP·Filed 2005·Granted Jun 1, 2010·23 cites·20 claims
- 0386US9645093B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·3 cites·46 claims
- 0484US9176069B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2013·Granted Nov 3, 2015·5 cites·44 claims
- 0565US8902429B1Focusing detector of an interferometry systemKLA TENCOR CORP·Filed 2012·Granted Dec 2, 2014·2 cites·25 claims
- 0656US11374375B2Laser closed power loop with an acousto-optic modulator for power modulationKLA CORP·Filed 2020·Granted Jun 28, 2022·0 cites·25 claims
- 0754US8621945B2Method and apparatus for improving the temperature stability and minimizing the noise of the environment that encloses an interferometric measuring systemZENG AN ANDREW·Filed 2011·Granted Jan 7, 2014·2 cites·10 claims
- 0848US11181484B1Systems and methods for advanced defect ablation protectionKLA CORP·Filed 2020·Granted Nov 23, 2021·0 cites·20 claims
- 0933US2015192404A1Reducing registration error of front and back wafer surfaces utilizing a see-through calibration waferKLA TENCOR CORP·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Steve Cui files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →