Inventor · disambiguated record
Stefan Kreissig
Also filed as: KREISSIG STEFAN
14 granted patents·2 pending applications·68 citations·filing 2003–2021
91Inventor score
Files withSUSS MICROTEC TEST SYS GMBH11FORMFACTOR INC1KANEV STOJAN1KIESEWETTER JOERG1SUSS MICROTEC TECH SYSTEMS GMB1
Top patents by PatentIndex Score
16 records- 0176US7579849B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·8 cites·11 claims
- 0276US7235990B1Probe station comprising a bellows with EMI shielding capabilitiesSUSS MICROTEC TEST SYS GMBH·Filed 2005·Granted Jun 26, 2007·9 cites·18 claims
- 0372US8278951B2Probe station for testing semiconductor substrates and comprising EMI shieldingKANEV STOJAN·Filed 2007·Granted Oct 2, 2012·8 cites·12 claims
- 0469US7671615B2Method and apparatus for controlling the temperature of electronic componentsSUSS MICROTEC TECH SYSTEMS GMB·Filed 2007·Granted Mar 2, 2010·6 cites·25 claims
- 0563US7652491B2Probe support with shield for the examination of test substrates under use of probe supportsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jan 26, 2010·4 cites·12 claims
- 0662US7579854B2Probe station and method for measurements of semiconductor devices under defined atmosphereSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·4 cites·21 claims
- 0762US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 0859US7741860B2Prober for testing magnetically sensitive componentsSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 22, 2010·4 cites·12 claims
- 0957US8402848B2Probe holderKIESEWETTER JOERG·Filed 2008·Granted Mar 26, 2013·3 cites·7 claims
- 1055US7038441B2Test apparatus with loading deviceSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 2, 2006·7 cites·20 claims
- 1149US7463044B2Adapter for positioning of contact tipsSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Dec 9, 2008·1 cites·13 claims
- 1247US7282930B2Device for testing thin elementsSUSS MICROTEC TEST SYS GMBH·Filed 2005·Granted Oct 16, 2007·2 cites·24 claims
- 1346US2009049944A1Micromanipulator for moving a probeSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 1445US11598789B2Probe systems configured to test a device under test and methods of operating the probe systemsFORMFACTOR INC·Filed 2021·Granted Mar 7, 2023·0 cites·20 claims
- 1544US7265536B2Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe stationSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Sep 4, 2007·1 cites·18 claims
- 1643US2009021275A1Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →