Inventor · disambiguated record
Tien-Hao Tang
Also filed as: TANG TIEN-HAO
128 granted patents·20 pending applications·1,290 citations·filing 1998–2024
99Inventor score
Top patents by PatentIndex Score
148 records- 0197US9368484B1Fin type electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 14, 2016·28 cites·13 claims
- 0297US6521952B1Method of forming a silicon controlled rectifier devices in SOI CMOS process for on-chip ESD protectionUNITED MICROELECTRONICS CORP·Filed 2001·Granted Feb 18, 2003·150 cites·43 claims
- 0396US7368761B1Electrostatic discharge protection device and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2007·Granted May 6, 2008·51 cites·33 claims
- 0494US6465768B1MOS structure with improved substrate-triggered effect for on-chip ESD protectionUNITED MICROELECTRONICS CORP·Filed 2001·Granted Oct 15, 2002·92 cites·40 claims
- 0593US9691752B1Semiconductor device for electrostatic discharge protection and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·11 cites·20 claims
- 0691US9653450B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 16, 2017·8 cites·14 claims
- 0791US9640527B2Electrostatic discharge protection device with parasitic bipolar junction transistorsUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 2, 2017·8 cites·18 claims
- 0891US6788507B2Electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2002·Granted Sep 7, 2004·62 cites·20 claims
- 0990US7655980B1Device for ESD protection circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Feb 2, 2010·21 cites·15 claims
- 1090US6861680B2Silicon-on-insulator diodes and ESD protection circuitsUNITED MICROELECTRONICS CORP·Filed 2002·Granted Mar 1, 2005·40 cites·7 claims
- 1189US9716087B1Semiconductor electrostatic discharge protection circuit, ESD protection semiconductor device, and layout structure of ESD protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jul 25, 2017·7 cites·16 claims
- 1289US9153571B1Stacked electrostatic discharge (ESD) protection deviceUNITED MICROELECTRONICS CORP·Filed 2014·Granted Oct 6, 2015·10 cites·23 claims
- 1388US9972615B1Semiconductor device for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 15, 2018·7 cites·14 claims
- 1488US8896024B1Electrostatic discharge protection structure and electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 25, 2014·10 cites·14 claims
- 1588US6894324B2Silicon-on-insulator diodes and ESD protection circuitsUNITED MICROELECTRONICS CORP·Filed 2001·Granted May 17, 2005·35 cites·5 claims
- 1688US6621133B1Electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2002·Granted Sep 16, 2003·40 cites·14 claims
- 1788US6498357B2Lateral SCR device for on-chip ESD protection in shallow-trench-isolation CMOS processUNITED MICROELECTRONICS CORP·Filed 2001·Granted Dec 24, 2002·41 cites·16 claims
- 1887US8817434B2Electrostatic discharge (ESD) protection deviceWANG CHANG-TZU·Filed 2011·Granted Aug 26, 2014·10 cites·18 claims
- 1987US6242763B1Low triggering voltage SOI silicon-control-rectifier (SCR) structureUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 5, 2001·74 cites·26 claims
- 2086US10008489B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 26, 2018·4 cites·15 claims
- 2186US8467162B2ESD protection circuit and ESD protection device thereofWANG CHANG-TZU·Filed 2010·Granted Jun 18, 2013·8 cites·10 claims
- 2284US6933573B2Electrostatic discharge protection circuit of non-gated diode and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2002·Granted Aug 23, 2005·29 cites·21 claims
- 2383US10903205B2Semiconductor device of electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jan 26, 2021·3 cites·18 claims
- 2483US10629585B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 21, 2020·3 cites·16 claims
- 2583US9640524B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 2, 2017·3 cites·5 claims
- 2682US9673189B2ESD unitUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 6, 2017·4 cites·28 claims
- 2782US9613948B1Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Apr 4, 2017·4 cites·20 claims
- 2882US8530969B2Semiconductor deviceChen lu-an·Filed 2012·Granted Sep 10, 2013·7 cites·9 claims
- 2982US8492834B2Electrostatic discharge protection device and applications thereofLAI TAI-HSIANG·Filed 2011·Granted Jul 23, 2013·8 cites·15 claims
- 3081US9607980B1High voltage transistorUNITED MICROELECTRONICS CORP·Filed 2016·Granted Mar 28, 2017·4 cites·19 claims
- 3181US9093565B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 28, 2015·3 cites·5 claims
- 3281US8981521B1Lateral bipolar junction transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 17, 2015·7 cites·10 claims
- 3381US8507981B2Method of manufacturing NMOS transistor with low trigger voltageChen lu-an·Filed 2011·Granted Aug 13, 2013·7 cites·10 claims
- 3481US7910998B2Silicon controlled rectifier device for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2007·Granted Mar 22, 2011·10 cites·19 claims
- 3580US10103136B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 16, 2018·2 cites·1 claims
- 3679US10897131B2Electrostatic discharge protection circuit for bypassing an ESD currentUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 19, 2021·3 cites·17 claims
- 3779US9564436B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Feb 7, 2017·5 cites·21 claims
- 3879US6806160B2Method for forming a lateral SCR device for on-chip ESD protection in shallow-trench-isolation CMOS processUNITED MICROELECTRONICS CORP·Filed 2002·Granted Oct 19, 2004·22 cites·36 claims
- 3979US6649944B2Silicon-on-insulator diodes and ESD protection circuitsUNITED MICROELECTRONICS CORP·Filed 2002·Granted Nov 18, 2003·18 cites·10 claims
- 4078US9876006B2Semiconductor device for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jan 23, 2018·4 cites·9 claims
- 4178US6479870B1ESD device with salicide layer isolated by shallow trench isolation for saving one salicide block photomaskUNITED MICROELECTRONICS CORP·Filed 2000·Granted Nov 12, 2002·25 cites·5 claims
- 4277US10204897B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 12, 2019·2 cites·6 claims
- 4377US6479883B1Electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2000·Granted Nov 12, 2002·23 cites·11 claims
- 4476US8981488B1Semiconductor structure and integrated circuitUNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 17, 2015·4 cites·19 claims
- 4576US7906810B2LDMOS device for ESD protection circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Mar 15, 2011·6 cites·16 claims
- 4676US6351364B1Electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2000·Granted Feb 26, 2002·26 cites·3 claims
- 4775US7638857B2Structure of silicon controlled rectifierUNITED MICROELECTRONICS CORP·Filed 2008·Granted Dec 29, 2009·9 cites·20 claims
- 4874US9466598B1Semiconductor structure suitable for electrostatic discharge protection applicationUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 11, 2016·2 cites·12 claims
- 4974US2025120185A1Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 5073US8648421B2Electrostatic discharge (ESD) device and semiconductor structureWEN YUNG-JU·Filed 2011·Granted Feb 11, 2014·5 cites·14 claims
Showing the top 50 of 148 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Tien-Hao Tang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →