Inventor · disambiguated record
Tommaso Torelli
Also filed as: TORELLI TOMMASO
6 granted patents·27 citations·filing 2005–2022
75Inventor score
Top patents by PatentIndex Score
6 records- 0191US9601393B2Selecting one or more parameters for inspection of a waferLEE CHRIS·Filed 2010·Granted Mar 21, 2017·17 cites·69 claims
- 0273US8532949B2Computer-implemented methods and systems for classifying defects on a specimenTEH CHO HUAK·Filed 2005·Granted Sep 10, 2013·9 cites·24 claims
- 0361US10290088B2Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughputKLA TENCOR CORP·Filed 2014·Granted May 14, 2019·1 cites·19 claims
- 0459US12062165B2Characterization system and method with guided defect discoveryKLA CORP·Filed 2022·Granted Aug 13, 2024·0 cites·10 claims
- 0554US11256967B2Characterization system and method with guided defect discoveryKLA CORP·Filed 2020·Granted Feb 22, 2022·0 cites·21 claims
- 0643US9569834B2Automated image-based process monitoring and controlKLA TENCOR CORP·Filed 2015·Granted Feb 14, 2017·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →