Inventor · disambiguated record
Wah Kit Loh
Also filed as: LOH WAH K · LOH WAH KIT
44 granted patents·3 pending applications·496 citations·filing 1990–2017
98Inventor score
Top patents by PatentIndex Score
47 records- 0192US7216272B2Method for reducing SRAM test time by applying power-up state knowledgeTEXAS INSTRUMENTS INC·Filed 2005·Granted May 8, 2007·29 cites·20 claims
- 0291US8467233B2Asymmetric static random access memory cell with dual stress linerYU SHAOFENG·Filed 2011·Granted Jun 18, 2013·19 cites·16 claims
- 0389US8560931B2Low power retention random access memory with error correction on wake-upSESHADRI ANAND·Filed 2012·Granted Oct 15, 2013·13 cites·23 claims
- 0489US7924640B2Method for memory cell characterization using universal structureTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 12, 2011·13 cites·22 claims
- 0587US8228749B2Margin testing of static random access memory cellsDENG XIAOWEI·Filed 2010·Granted Jul 24, 2012·12 cites·22 claims
- 0687US7385864B2SRAM static noise margin test structure suitable for on chip parametric measurementsTEXAS INSTRUMENTS INC·Filed 2006·Granted Jun 10, 2008·18 cites·29 claims
- 0786US8379467B2Structure and methods for measuring margins in an SRAM bitTEXAS INSTRUMENTS INC·Filed 2011·Granted Feb 19, 2013·8 cites·5 claims
- 0886US6281760B1On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memoryTEXAS INSTRUMENTS INC·Filed 1999·Granted Aug 28, 2001·64 cites·40 claims
- 0984US8716808B2Static random-access memory cell array with deep well regionsTEXAS INSTRUMENTS INC·Filed 2013·Granted May 6, 2014·7 cites·14 claims
- 1082US8971138B2Method of screening static random access memory cells for positive bias temperature instabilitySESHADRI ANAND·Filed 2012·Granted Mar 3, 2015·8 cites·27 claims
- 1181US5200364APackaged integrated circuit with encapsulated electronic devicesTEXAS INSTRUMENTS INC·Filed 1992·Granted Apr 6, 1993·68 cites·2 claims
- 1275US5309446ATest validation method for a semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1992·Granted May 3, 1994·40 cites·7 claims
- 1374US9455021B2Array power supply-based screening of static random access memory cells for bias temperature instabilityDENG XIAOWEI·Filed 2012·Granted Sep 27, 2016·3 cites·12 claims
- 1474US5844853AMemory regulator control method with flexibility for a wide change in supply voltageTEXAS INSTRUMENTS INC·Filed 1997·Granted Dec 1, 1998·36 cites·37 claims
- 1571US5923599AApparatus and method for subarray testing in dynamic random access memories using a built-in-self-test unitTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 13, 1999·30 cites·12 claims
- 1670US9576621B2Read-current and word line delay path tracking for sense amplifier enable timingTEXAS INSTRUMENTS INC·Filed 2013·Granted Feb 21, 2017·4 cites·17 claims
- 1768US8654562B2Static random access memory cell with single-sided buffer and asymmetric constructionDENG XIAOWEI·Filed 2012·Granted Feb 18, 2014·3 cites·5 claims
- 1867US9412437B2SRAM with buffered-read bit cells and its testingTEXAS INSTRUMENTS INC·Filed 2014·Granted Aug 9, 2016·2 cites·7 claims
- 1967US8437213B2Characterization of bits in a functional memoryDENG XIAOWEI·Filed 2008·Granted May 7, 2013·6 cites·36 claims
- 2066US8432760B2Method of screening static random access memories for unstable memory cellsDENG XIAOWEI·Filed 2011·Granted Apr 30, 2013·3 cites·27 claims
- 2165US8472229B2Array-based integrated circuit with reduced proximity effectsTEXAS INSTRUMENTS INC·Filed 2012·Granted Jun 25, 2013·1 cites·10 claims
- 2265US7324391B2Method for determining and classifying SRAM bit fail modes suitable for production test implementation and real time feedbackTEXAS INSTRUMENTS INC·Filed 2005·Granted Jan 29, 2008·8 cites·22 claims
- 2365US5115298APackaged integrated circuit with encapsulated electronic devicesTEXAS INSTRUMENTS INC·Filed 1990·Granted May 19, 1992·34 cites·28 claims
- 2464US8472228B2Array-based integrated circuit with reduced proximity effectsDENG XIAOWEI·Filed 2010·Granted Jun 25, 2013·1 cites·19 claims
- 2564US8233341B2Method and structure for SRAM cell trip voltage measurementDENG XIAOWEI·Filed 2009·Granted Jul 31, 2012·5 cites·27 claims
- 2659US8755237B2SRAM power reduction through selective programmingLOH WAH KIT·Filed 2012·Granted Jun 17, 2014·2 cites·20 claims
- 2757US7821816B2Method for constructing Shmoo plots for SRAMsTEXAS INSTRUMENTS INC·Filed 2009·Granted Oct 26, 2010·3 cites·13 claims
- 2857US5220534ASubstrate bias generator systemTEXAS INSTRUMENTS INC·Filed 1990·Granted Jun 15, 1993·25 cites·19 claims
- 2955US8542545B2Repairing soft failures in memory cells in SRAM arraysLOH WAH KIT·Filed 2011·Granted Sep 24, 2013·2 cites·20 claims
- 3055US8139431B2Structure and methods for measuring margins in an SRAM bitDENG XIAOWEI·Filed 2009·Granted Mar 20, 2012·2 cites·14 claims
- 3154US8526253B2Method of screening static random access memories for pass transistor defectsPIOUS BEENA·Filed 2011·Granted Sep 3, 2013·2 cites·20 claims
- 3253US9208832B2Functional screening of static random access memories using an array bias voltageTEXAS INSTRUMENTS INC·Filed 2012·Granted Dec 8, 2015·1 cites·17 claims
- 3352US11355182B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2017·Granted Jun 7, 2022·0 cites·19 claims
- 3452US5959912AROM embedded mask release number for built-in self-testTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 28, 1999·13 cites·2 claims
- 3549US9805788B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 31, 2017·0 cites·13 claims
- 3649US9576643B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2015·Granted Feb 21, 2017·0 cites·4 claims
- 3749US9093315B2CMOS process to improve SRAM yieldTEXAS INSTRUMENTS INC·Filed 2013·Granted Jul 28, 2015·0 cites·2 claims
- 3848US9466356B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 11, 2016·0 cites·6 claims
- 3948US2011158017A1Method for memory cell characterization using universal structureTEXAS INSTRUMENTS INC·Filed 2011·Application pending·0 cites
- 4047US9208902B2Bitline leakage detection in memoriesPIOUS BEENA·Filed 2009·Granted Dec 8, 2015·2 cites·12 claims
- 4147US6239650B1Low power substrate bias circuitTEXAS INSTRUMENTS INC·Filed 1995·Granted May 29, 2001·9 cites·31 claims
- 4245US2013343136A1Sram with buffered-read bit cells and its testingTEXAS INSTRUMENTS INC·Filed 2013·Application pending·0 cites
- 4344US9472268B2SRAM with buffered-read bit cells and its testingDENG XIAOWEI·Filed 2011·Granted Oct 18, 2016·0 cites·5 claims
- 4444US2014078819A1Static random access memory cell with single-sided buffer and asymmetric constructionTEXAS INSTRUMENTS INC·Filed 2013·Application pending·0 cites
- 4543US8603875B2CMOS process to improve SRAM yieldYU SHAOFENG·Filed 2011·Granted Dec 10, 2013·0 cites·18 claims
- 4641US8174914B2Method and structure for SRAM Vmin/Vmax measurementDENG XIAOWEI·Filed 2009·Granted May 8, 2012·0 cites·26 claims
- 4735US9208899B2Universal test structures based SRAM on-chip parametric test module and methods of operating and testingDENG XIAOWEI·Filed 2010·Granted Dec 8, 2015·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →