Inventor · disambiguated record
Xiaowei Deng
Also filed as: DENG XIAOWEI
54 granted patents·8 pending applications·665 citations·filing 2000–2025
98Inventor score
Files withTEXAS INSTRUMENTS INC41DENG XIAOWEI17HOUSTON THEODORE W1PIOUS BEENA1TYCO ELECTRONICS SUZHOU LTD1
Top patents by PatentIndex Score
62 records- 0197US7164596B1SRAM cell with column select lineTEXAS INSTRUMENTS INC·Filed 2005·Granted Jan 16, 2007·72 cites·26 claims
- 0296US7816740B2Memory cell layout structure with outer bitlineTEXAS INSTRUMENTS INC·Filed 2008·Granted Oct 19, 2010·38 cites·20 claims
- 0395US6925025B2SRAM device and a method of powering-down the sameTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 2, 2005·94 cites·20 claims
- 0494US8654575B2Disturb-free static random access memory cellDENG XIAOWEI·Filed 2011·Granted Feb 18, 2014·18 cites·9 claims
- 0591US6573549B1Dynamic threshold voltage 6T SRAM cellTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 3, 2003·64 cites·7 claims
- 0690US8498143B2Solid-state memory cell with improved read stabilityDENG XIAOWEI·Filed 2011·Granted Jul 30, 2013·13 cites·22 claims
- 0790US7027346B2Bit line control for low power in standbyTEXAS INSTRUMENTS INC·Filed 2003·Granted Apr 11, 2006·46 cites·19 claims
- 0889US8760927B2Efficient static random-access memory layoutDENG XIAOWEI·Filed 2012·Granted Jun 24, 2014·11 cites·25 claims
- 0989US8462542B2Bit-by-bit write assist for solid-state memoryDENG XIAOWEI·Filed 2010·Granted Jun 11, 2013·13 cites·27 claims
- 1089US7924640B2Method for memory cell characterization using universal structureTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 12, 2011·13 cites·22 claims
- 1188US7936623B2Universal structure for memory cell characterizationTEXAS INSTRUMENTS INC·Filed 2007·Granted May 3, 2011·11 cites·27 claims
- 1287US8228749B2Margin testing of static random access memory cellsDENG XIAOWEI·Filed 2010·Granted Jul 24, 2012·12 cites·22 claims
- 1386US8379467B2Structure and methods for measuring margins in an SRAM bitTEXAS INSTRUMENTS INC·Filed 2011·Granted Feb 19, 2013·8 cites·5 claims
- 1486US7061820B2Voltage keeping scheme for low-leakage memory devicesTEXAS INSTRUMENTS INC·Filed 2003·Granted Jun 13, 2006·38 cites·25 claims
- 1584US8716808B2Static random-access memory cell array with deep well regionsTEXAS INSTRUMENTS INC·Filed 2013·Granted May 6, 2014·7 cites·14 claims
- 1684US8305798B2Memory cell with equalization write assist in solid-state memoryDENG XIAOWEI·Filed 2010·Granted Nov 6, 2012·9 cites·26 claims
- 1781US7039818B2Low leakage SRAM schemeTEXAS INSTRUMENTS INC·Filed 2003·Granted May 2, 2006·28 cites·17 claims
- 1879US6870375B2System and method for measuring a capacitance associated with an integrated circuitTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 22, 2005·30 cites·17 claims
- 1977US6731533B2Loadless 4T SRAM cell with PMOS driversTEXAS INSTRUMENTS INC·Filed 2001·Granted May 4, 2004·25 cites·1 claims
- 2074US9455021B2Array power supply-based screening of static random access memory cells for bias temperature instabilityDENG XIAOWEI·Filed 2012·Granted Sep 27, 2016·3 cites·12 claims
- 2174US6922370B2High performance SRAM device and method of powering-down the sameTEXAS INSTRUMENTS INC·Filed 2003·Granted Jul 26, 2005·20 cites·23 claims
- 2273US2025372924A1Conductive Terminal Assembly and ConnectorTYCO ELECTRONICS SUZHOU LTD·Filed 2025·Application pending·0 cites
- 2371US8670265B2Reducing power in SRAM using supply voltage controlDENG XIAOWEI·Filed 2012·Granted Mar 11, 2014·4 cites·27 claims
- 2471US6362660B1CMOS latch and register circuitry using quantum mechanical tunneling structuresTEXAS INSTRUMENTS INC·Filed 2000·Granted Mar 26, 2002·18 cites·10 claims
- 2570US6539526B1Method and apparatus for determining capacitances for a device within an integrated circuitTEXAS INSTRUMENTS INC·Filed 2000·Granted Mar 25, 2003·15 cites·24 claims
- 2668US8654562B2Static random access memory cell with single-sided buffer and asymmetric constructionDENG XIAOWEI·Filed 2012·Granted Feb 18, 2014·3 cites·5 claims
- 2767US9412437B2SRAM with buffered-read bit cells and its testingTEXAS INSTRUMENTS INC·Filed 2014·Granted Aug 9, 2016·2 cites·7 claims
- 2867US8437213B2Characterization of bits in a functional memoryDENG XIAOWEI·Filed 2008·Granted May 7, 2013·6 cites·36 claims
- 2967US7298663B2Bit line control for low power in standbyTEXAS INSTRUMENTS INC·Filed 2005·Granted Nov 20, 2007·5 cites·3 claims
- 3066US8432760B2Method of screening static random access memories for unstable memory cellsDENG XIAOWEI·Filed 2011·Granted Apr 30, 2013·3 cites·27 claims
- 3165US8472229B2Array-based integrated circuit with reduced proximity effectsTEXAS INSTRUMENTS INC·Filed 2012·Granted Jun 25, 2013·1 cites·10 claims
- 3265US8064279B2Structure and method for screening SRAMSHOUSTON THEODORE W·Filed 2009·Granted Nov 22, 2011·5 cites·20 claims
- 3364US8472228B2Array-based integrated circuit with reduced proximity effectsDENG XIAOWEI·Filed 2010·Granted Jun 25, 2013·1 cites·19 claims
- 3464US8233341B2Method and structure for SRAM cell trip voltage measurementDENG XIAOWEI·Filed 2009·Granted Jul 31, 2012·5 cites·27 claims
- 3561US6975143B2Static logic design for CMOSTEXAS INSTRUMENTS INC·Filed 2001·Granted Dec 13, 2005·9 cites·15 claims
- 3657US7821816B2Method for constructing Shmoo plots for SRAMsTEXAS INSTRUMENTS INC·Filed 2009·Granted Oct 26, 2010·3 cites·13 claims
- 3755US8139431B2Structure and methods for measuring margins in an SRAM bitDENG XIAOWEI·Filed 2009·Granted Mar 20, 2012·2 cites·14 claims
- 3853US9208832B2Functional screening of static random access memories using an array bias voltageTEXAS INSTRUMENTS INC·Filed 2012·Granted Dec 8, 2015·1 cites·17 claims
- 3952US11355182B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2017·Granted Jun 7, 2022·0 cites·19 claims
- 4049US9805788B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 31, 2017·0 cites·13 claims
- 4149US9576643B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2015·Granted Feb 21, 2017·0 cites·4 claims
- 4248US9466356B2Array power supply-based screening of static random access memory cells for bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 11, 2016·0 cites·6 claims
- 4348US2011158017A1Method for memory cell characterization using universal structureTEXAS INSTRUMENTS INC·Filed 2011·Application pending·0 cites
- 4448US2011199806A1Universal structure for memory cell characterizationTEXAS INSTRUMENTS INC·Filed 2011·Application pending·0 cites
- 4547US9208902B2Bitline leakage detection in memoriesPIOUS BEENA·Filed 2009·Granted Dec 8, 2015·2 cites·12 claims
- 4647US7499354B2Method for testing transistors having an active region that is common with other transistors and a testing circuit for accomplishing the sameTEXAS INSTRUMENTS INC·Filed 2005·Granted Mar 3, 2009·1 cites·21 claims
- 4745US11495301B2Sense amplifier look-through latch for FAMOS-based EPROMTEXAS INSTRUMENTS INC·Filed 2021·Granted Nov 8, 2022·0 cites·21 claims
- 4845US7855907B2Mitigation of charge sharing in memory devicesTEXAS INSTRUMENTS INC·Filed 2008·Granted Dec 21, 2010·1 cites·19 claims
- 4945US2013343136A1Sram with buffered-read bit cells and its testingTEXAS INSTRUMENTS INC·Filed 2013·Application pending·0 cites
- 5044US9472268B2SRAM with buffered-read bit cells and its testingDENG XIAOWEI·Filed 2011·Granted Oct 18, 2016·0 cites·5 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →