Inventor · disambiguated record
Yalin Xiong
Also filed as: XIONG YALIN
26 granted patents·1 pending application·942 citations·filing 1997–2018
97Inventor score
Top patents by PatentIndex Score
27 records- 0198US7646906B2Computer-implemented methods for detecting defects in reticle design dataKLA TENCOR TECH CORP·Filed 2005·Granted Jan 12, 2010·85 cites·22 claims
- 0296US7873204B2Method for detecting lithographically significant defects on reticlesKLA TENCOR CORP·Filed 2007·Granted Jan 18, 2011·56 cites·20 claims
- 0396US7738093B2Methods for detecting and classifying defects on a reticleKLA TENCOR CORP·Filed 2008·Granted Jun 15, 2010·42 cites·21 claims
- 0495US7440093B1Apparatus and methods for providing selective defect sensitivityKLA TENCOR TECH CORP·Filed 2007·Granted Oct 21, 2008·36 cites·19 claims
- 0594US8785082B2Method and apparatus for inspecting a reflective lithographic mask blank and improving mask qualityXIONG YALIN·Filed 2012·Granted Jul 22, 2014·16 cites·24 claims
- 0694US7995832B2Photomask inspection and verification by lithography image reconstruction using imaging pupil filtersKLA TENCOR CORP·Filed 2007·Granted Aug 9, 2011·36 cites·18 claims
- 0793US8204297B1Methods and systems for classifying defects detected on a reticleXIONG YALIN·Filed 2009·Granted Jun 19, 2012·28 cites·19 claims
- 0891US10451563B2Inspection of photomasks by comparing two photomasksKLA TENCOR CORP·Filed 2017·Granted Oct 22, 2019·11 cites·28 claims
- 0991US6359617B1Blending arbitrary overlaying images into panoramasAPPLE COMPUTER·Filed 1998·Granted Mar 19, 2002·148 cites·74 claims
- 1090US7271891B1Apparatus and methods for providing selective defect sensitivityKLA TENCOR TECH CORP·Filed 2004·Granted Sep 18, 2007·47 cites·33 claims
- 1190US6434265B1Aligning rectilinear images in 3D through projective registration and calibrationAPPLE COMPUTER·Filed 1998·Granted Aug 13, 2002·202 cites·108 claims
- 1289US7932004B1Feature identification for metrological analysisKLA TENCOR CORP·Filed 2009·Granted Apr 26, 2011·20 cites·9 claims
- 1388US11270430B2Wafer inspection using difference imagesKLA TENCOR CORP·Filed 2018·Granted Mar 8, 2022·5 cites·18 claims
- 1488US9892503B2Monitoring changes in photomask defectivityKLA TENCOR CORP·Filed 2016·Granted Feb 13, 2018·4 cites·28 claims
- 1586US6549651B2Aligning rectilinear images in 3D through projective registration and calibrationAPPLE COMPUTER·Filed 2002·Granted Apr 15, 2003·63 cites·20 claims
- 1685US6754379B2Aligning rectilinear images in 3D through projective registration and calibrationAPPLE COMPUTER·Filed 2003·Granted Jun 22, 2004·56 cites·50 claims
- 1783US8611637B2Wafer plane detection of lithographically significant contamination photomask defectsSHI RUIFANG·Filed 2010·Granted Dec 17, 2013·6 cites·21 claims
- 1878US9518935B2Monitoring changes in photomask defectivityKLA TENCOR CORP·Filed 2014·Granted Dec 13, 2016·3 cites·28 claims
- 1977US7995199B2Method for detection of oversized sub-resolution assist featuresKLA TENCOR CORP·Filed 2009·Granted Aug 9, 2011·4 cites·20 claims
- 2072US5960108AMethod and system for creating an image-based virtual reality environment utilizing a fisheye lensAPPLE COMPUTER·Filed 1997·Granted Sep 28, 1999·54 cites·15 claims
- 2169US9766185B2Block-to-block reticle inspectionKLA TENCOR CORP·Filed 2014·Granted Sep 19, 2017·1 cites·15 claims
- 2268US8090189B1Detection of thin line for selective sensitivity during reticle inspectionPHALKE VINAYAK DATTATREYA·Filed 2008·Granted Jan 3, 2012·8 cites·18 claims
- 2366US9778207B2Integrated multi-pass inspectionKLA TENCOR CORP·Filed 2014·Granted Oct 3, 2017·1 cites·37 claims
- 2466US9778205B2Delta die and delta database inspectionKLA TENCOR CORP·Filed 2015·Granted Oct 3, 2017·1 cites·27 claims
- 2566US8151220B2Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout dataHESS CARL·Filed 2004·Granted Apr 3, 2012·9 cites·23 claims
- 2658US10539512B2Block-to-block reticle inspectionKLA TENCOR CORP·Filed 2017·Granted Jan 21, 2020·0 cites·15 claims
- 2733US2015310160A1Method, system and computer program product for generating high density registration maps for masksKLA TENCOR CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →