US11415892B2ActiveUtilityA1
Method for producing a reflecting optical element of a projection exposure apparatus and reflecting optical element for a projection exposure apparatus, projection lens and projection exposure apparatus
Est. expiryJul 12, 2038(~12 yrs left)· nominal 20-yr term from priority
G03F 7/70316G02B 1/14G02B 5/0891G03F 7/70891G21K 1/062G03F 7/70958G03F 7/70883G03F 7/702G03F 7/70075
83
PatentIndex Score
2
Cited by
35
References
9
Claims
Abstract
A method for producing a reflecting optical element for a projection exposure apparatus (1). The element has a substrate (30) with a substrate surface (31), a protection layer (38) and a layer partial system (39) suitable for the EUV wavelength range. The method includes: (a) measuring the substrate surface (31), (b) irradiating the substrate (30) with electrons (36), and (c) tempering the substrate (30). Furthermore, an associated reflective optical element for the EUV wavelength range, a projection lens with a mirror (18, 19, 20) as reflective optical element, and a projection exposure apparatus (1) including such a projection lens.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. Method for producing a reflecting optical element for a projection exposure apparatus, which comprises a substrate with a substrate surface, a protection layer and a layer partial system suited for an extreme ultraviolet (EUV) wavelength range, comprising:
a) measuring the substrate surface,
b) compacting the substrate by irradiating the substrate with electrons, and
c) tempering the substrate after said compacting.
2. Method according to claim 1 ,
wherein said tempering comprises:
using tempering temperatures of between 22° C. and 400° C.
3. Method according to claim 1 ,
wherein said tempering comprises:
holding the tempering temperature over a duration of 1 h to 1000 h.
4. Method according to claim 1 ,
wherein said tempering comprises:
varying the tempering temperature over time.
5. Method according to claim 1 ,
wherein said tempering comprises:
heating the substrate homogeneously.
6. Method according to claim 1 ,
wherein said tempering comprises:
localized heating of the substrate.
7. Method for producing a reflecting optical element for a projection exposure apparatus, which comprises a substrate with a substrate surface, a protection layer and a layer partial system suited for an extreme ultraviolet (EUV) wavelength range, comprising:
a) measuring the substrate surface,
b) irradiating the substrate with electrons, and
c) tempering the substrate,
wherein said tempering comprises:
introducing the tempering temperature into the substrate by irradiation with a laser with a wavelength of 2.6 μm to 2.8 μm.
8. Method according to claim 7 ,
wherein the wavelength is 2.755 μm.
9. Method for producing a reflecting optical element for a projection exposure apparatus, which comprises a substrate with a substrate surface, a protection layer and a layer partial system suited for an extreme ultraviolet (EUV) wavelength range, comprising:
a) measuring the substrate surface,
b) irradiating the substrate with electrons, and
c) tempering the substrate,
wherein said irradiating comprises:
adjusting a set-point change in the substrate from said tempering in said irradiating of the substrate.Cited by (0)
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