US2004069410A1PendingUtilityA1
Cluster tool for E-beam treated films
Priority: May 8, 2002Filed: Sep 3, 2003Published: Apr 15, 2004
Est. expiryMay 8, 2022(expired)· nominal 20-yr term from priority
H10P 95/08H10P 14/6922H10P 14/6686H10P 14/6342H10P 14/6336H10P 14/665H10P 95/00H10P 76/4085H10P 76/2045H10P 76/2043H10P 70/234H10P 70/23H10P 14/6923H10P 14/6905H10P 14/6682H10P 14/6539H10P 14/6334H10W 20/084H10W 20/095H10W 20/081H10W 20/074B05D 5/12C23C 16/56B05D 1/60C23C 16/26C23C 16/401B05D 3/141B05D 5/08C08G 77/50B05D 3/068
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Claims
Abstract
One embodiment of the present invention is a cluster tool for processing wafers that includes: (a) one or more chemical vapor deposition chambers; (b) one or more e-beam treatment chambers; and (c) a transfer chamber adapted to transfer a wafer from one chamber to another while maintaining vacuum conditions.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A cluster tool for processing wafers that comprises:
one or more chemical vapor deposition chambers; one or more e-beam treatment chambers; and a transfer chamber adapted to transfer a wafer from one chamber to another while maintaining vacuum conditions.
2 . A cluster tool that comprises:
one or more spin-on coating chambers; one or more thermal cure processing chambers; one or more e-beam treatment chambers; and a transfer chamber adapted to transfer a wafer from one chamber to another while maintaining vacuum conditions.
3 . The cluster tool of claim 2 that further comprises:
one or more chemical vapor deposition chambers.
4 . The cluster tool of claim 1 which further comprises:
one or more thermal cure processing chambers.
5 . The cluster tool of claim 2 wherein one or more of the one or more spin-on coating chambers are spin-on dielectric deposition chambers.
6 . The cluster tool of claim 1 wherein:
the cluster tool further comprises a factory/cluster tool interface; and
the factory/cluster tool interface includes an interface transfer robot that transfers a cassette adapted to carry one or more wafers into and out of an external factory environment through one or more access ports in the factory/cluster tool interface.
7 . The cluster tool of claim 6 wherein:
the interface transfer robot is adapted to move the cassette or individual wafers into and out of a loadlock; and
the transfer chamber comprises a transfer robot adapted to move a wafer in the loadlock into the transfer chamber.
8 . The cluster tool of claim 1 wherein:
the cluster tool further comprises a factory interface adapted to accept a wafer cassette from an external factory environment, and to transfer the wafer cassette to a loadlock that is in communication with the transfer chamber.
9 . The cluster tool of claim 8 wherein:
the transfer chamber further comprises a transfer robot and one or more transfer stations;
the transfer robot is adapted to move wafers: (a) from the loadlock to one or more of the chambers, (b) from the loadlock to one or more of the transfer stations, (c) from one or more of the chambers to one or more of the transfer stations, (d) from one or more of the chambers to the loadlock, (e) from one or more of the chambers to one or more other chambers, and (f) from one or more of the transfer stations to the loadlock.
10 . The cluster tool of claim 9 wherein the transfer chamber further comprises a second transfer robot wherein:
the second transfer robot is adapted to move wafers (a) from one or more of the transfer stations to one or more of the chambers, (b) from one or more of the chambers to one or more of the transfer stations, and (c) from one or more of the chambers to one or more other chambers.
11 . The cluster tool of claim 10 wherein the transfer chamber further comprises one or more second transfer stations and a third transfer robot wherein:
the third transfer robot is adapted to move wafers (a) from one or more of the second transfer stations to one or more of the chambers, (b) from one or more of the chambers to one or more of the second transfer stations, and (c) from the one or more of the chambers to one or more other chambers.
12 . A cluster tool for processing wafers that comprises:
one or more chemical vapor deposition chambers; one or more spin-on coating chambers; one or more thermal cure processing chambers; one or more e-beam treatment chambers; and a transfer chamber adapted to transfer a wafer from one chamber to another while maintaining vacuum conditions, which the transfer chamber includes a first and a second transfer robot and a transfer station; wherein:
the first transfer robot is adapted to transfer a wafer to one or more of the spin-on coating chambers, and thereafter to transfer the wafer to the transfer station; and
the second transfer robot is adapted to transfer the wafer from the transfer station to one or more of the thermal cure processing chambers, and thereafter to transfer the wafer to one or more of the e-beam treatment chambers.
13 . The cluster tool of claim 12 wherein the second transfer robot is further adapted to transfer the wafer to one or more of the chemical vapor deposition chambers.
14 . The cluster tool of claim 12 wherein:
the transfer chamber further includes a second transfer station and a third robot; and
the second transfer robot is further adapted to transfer the wafer to the second transfer station; and
the third transfer robot is adapted to transfer the wafer from the second transfer station to one or more of the chemical vapor deposition chambers.Join the waitlist — get patent alerts
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