US2006056115A1PendingUtilityA1
Magnetoresistance effect device and method of production of the same
Assignee: NAT INST OF ADVANCED IND SCIENPriority: Sep 7, 2004Filed: Sep 7, 2005Published: Mar 16, 2006
Est. expirySep 7, 2024(expired)· nominal 20-yr term from priority
Inventors:David Djulianto DjayaprawiraKoji TsunekawaMotonobu NagaiHiroki MaeharaShinji YamagataNaoki WatanabeShinji Yuasa
G11C 11/161H01F 10/3204B82Y 40/00H01F 41/18C23C 14/081C23C 14/34G11C 11/16B82Y 25/00H01F 10/3254H01F 41/307G11C 11/15H10N 50/01H10N 50/10
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Claims
Abstract
A magnetoresistance effect device including a multilayer structure having a pair of ferromagnetic layers and a barrier layer positioned between them, wherein at least one ferromagnetic layer has at least the part contacting the barrier layer made amorphous and the barrier layer is an MgO layer having a highly oriented texture structure.
Claims
exact text as granted — not AI-modified1 . A magnetoresistance effect device including a multilayer structure comprised of a pair of ferromagnetic layers and a barrier layer positioned between them, wherein
at least a part of at least one of said ferromagnetic layers contacting said barrier layer is amorphous, and said barrier layer is an MgO layer having a single structure.
2 . A magnetoresistance effect device including a multilayer structure comprised of a pair of ferromagnetic layers and a barrier layer positioned between them, wherein
at least a part of at least one of said ferromagnetic layers contacting said barrier layer is amorphous, and said barrier layer is an MgO layer having a highly oriented fiber-texture structure.
3 . The magnetoresistance effect device as set forth in claim 1 , wherein said MgO layer is a single crystal layer formed by a sputtering method.
4 . The magnetoresistance effect device as set forth in claim 1 , wherein said MgO layer is a highly oriented fiber-texture layer formed by a sputtering method.
5 . The magnetoresistance effect device as set forth in claim 3 , wherein said MgO layer is a single crystal layer formed using an MgO target and a sputtering method.
6 . The magnetoresistance effect device as set forth in claim 4 , wherein said MgO layer is a a highly oriented fiber-texture layer formed using an MgO target and a sputtering method.
7 . The magnetoresistance effect device as set forth in claim 1 , wherein said ferromagnetic layers are CoFeB layers.
8 . The magnetoresistance effect device as set forth in claim 2 , wherein said ferromagnetic layers are CoFeB layers.
9 . A method of production of a magnetoresistance effect device including a multilayer structure comprised of a pair of ferromagnetic layers and a barrier layer positioned between them, comprising:
forming at least one ferromagnetic layer so that at least a part contacting the barrier layer is amorphous and forming said barrier layer having a single crystal structure by using a sputtering method.
10 . A method of production of a magnetoresistance effect device including a multilayer structure comprised of a pair of ferromagnetic layers and a barrier layer positioned between them, comprising:
forming at least one ferromagnetic layer so that at least a part contacting the barrier layer is amorphous and forming said barrier layer having a highly-oriented fiber-texture structure by using a sputtering method.
11 . A method of production of a magnetoresistance effect device as set forth in claim 9 , further comprising forming said MgO layer by a sputtering method using an MgO target.
12 . A method of production of a magnetoresistance effect device as set forth in claim 10 , further comprising forming said MgO layer by a sputtering method using an MgO target.Cited by (0)
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