US2014210083A1PendingUtilityA1
Thermally and electrically enhanced ball grid array package
Est. expiryDec 1, 2020(expired)· nominal 20-yr term from priority
H10W 90/754H10W 90/737H10W 90/734H10W 74/00H10W 72/07554H10W 72/5366H10W 72/5363H10W 72/951H10W 72/884H10W 72/547H10W 72/536H10W 72/075H10W 72/50H10W 90/701H10W 76/40H10W 74/117H10W 70/685H10W 70/60H10W 40/778H10W 40/228H10W 72/20H01L 24/14H01L 23/12
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Claims
Abstract
In one embodiment, a device package is provided. The device package can include a substrate having first and second opposing surfaces, an opening being formed through the first and second surfaces of the substrate; a stiffener coupled to the first surface of the substrate, the stiffener having an extending portion that extends into the opening of the substrate; and an integrated circuit (IC) die coupled to the extending portion of the stiffener, the IC die being electrically coupled to the substrate.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A device package, comprising:
a substrate having first and second opposing surfaces, wherein an opening is formed through the first and second surfaces of the substrate; a stiffener coupled to the first surface of the substrate, the stiffener having an extending portion that extends into the opening of the substrate; and an integrated circuit (IC) die coupled to the extending portion of the stiffener, the IC die being electrically coupled to the substrate.
2 . The device package of claim 1 , wherein the substrate comprises:
a metal layer, wherein the IC die is electrically coupled to the metal layer.
3 . The device package of claim 2 , wherein the substrate further comprises:
a circuit mask coupled to the metal layer.
4 . The device package of claim 3 , wherein the substrate further comprises:
a dielectric layer coupled to the metal layer.
5 . The device package of claim 4 , wherein the dielectric layer is coupled to the metal layer with an adhesive.
6 . The device package of claim 2 , wherein the metal layer comprises a trace.
7 . The device package of claim 2 , wherein the metal layer is a first metal layer and wherein the the substrate further comprises a second metal layer coupled to the first metal layer.
8 . The device package of claim 2 , further comprising:
a plurality of connection elements attached to the substrate and electrically coupled to the metal layer.
9 . The device package of claim 8 , wherein the plurality of connection elements comprise a plurality of solder balls.
10 . The device package of claim 1 , further comprising:
a wire connection coupled to the IC die.
11 . The device package of claim 10 , wherein the wire connection is coupled to the substrate.
12 . The device package of claim 11 , wherein the stiffener comprises an opening formed therein and the wire connection passes through the opening.
13 . The device package of claim 10 , wherein the wire connection is coupled to the stiffener.
14 . The device package of claim 13 , wherein the stiffener comprises a plating surface and wherein the wire connection is coupled to the plating surface.
15 . The device package of claim 1 , wherein the extending portion of the stiffener is exposed at an outer surface of the device package.
16 . The device package of claim 1 , wherein the stiffener comprises a metal.
17 . A device package, comprising:
a substrate having first and second opposing surfaces; a stiffener coupled to the first surface of the substrate, wherein the substrate comprises a plurality of conductive paths extending between the first and second surfaces of the substrate and contacting the stiffener; and an integrated circuit (IC) die coupled to the stiffener and electrically coupled to the substrate.
18 . The device package of claim 17 , further comprising:
a plurality of connection elements coupled to the second surface of the substrate, wherein a conductive path of the plurality of conductive paths is electrically coupled to a connection element of the plurality of connection elements.
19 . The device package of claim 17 , wherein the substrate comprises: a metal layer.
20 . The device package of claim 19 , further comprising:
a wire connection coupled to the IC die and the metal layer.Cited by (0)
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