Chip testing with exclusive OR

Abstract

First and second scan channels each comprise a plurality of scannable latches that apply input to and receive output from logic circuits on a chip under test. First input is scanned into the first scan channel and second input is scanned into the second scan channel. Output from the first scan channel is hashed using a first XOR on the first scan channel and output from the second scan channel is hashed using a first XOR on the second scan channel. Output from the first XOR on the first scan channel is hashed using a second XOR on the first scan channel. A rotator creates adjustment data from the output from the second XOR on the first scan channel. The adjustment data and output from the first XOR on the second scan channel are hashed using a second XOR on the second scan channel.

What is claimed is: 
     
       1. A method of testing a chip comprising:
 scanning first input data into a first scan channel, wherein the first scan channel comprises a first plurality of scannable latches configured to apply the first input data to logic circuits on the chip and further configured to receive first output data from the logic circuits on the chip; 
 scanning second input data into a second scan channel, wherein the second scan channel comprises a second plurality of scannable latches configured to apply the second input data to the logic circuits on the chip and further configured to receive second output data from the logic circuits on the chip; 
 hashing output data from the first scan channel using a first XOR on the first scan channel; 
 hashing output data from the second scan channel using a first XOR on the second scan channel; 
 hashing output data from the first XOR on the first scan channel using a second XOR on the first scan channel; 
 outputting data from the second XOR on the first scan channel to a rotator; 
 creating adjustment data using the output data from the second XOR on the first scan channel by the rotator; 
 transmitting the adjustment data to a second XOR on the second scan channel; and 
 hashing the adjustment data and output data from the first XOR on the second scan channel using a second XOR on the second scan channel. 
 
     
     
       2. The method of  claim 1 , wherein the first XOR on the second scan channel comprises a plurality of XORs. 
     
     
       3. The method of  claim 1 , wherein the second XOR on the second scan channel comprises a plurality of XORs. 
     
     
       4. The method of  claim 1 , wherein the first input data is different from the second input data. 
     
     
       5. The method of  claim 1 , wherein a quantity of logic circuits on the chip is different from a quantity of scannable latches on the first scan channel. 
     
     
       6. The method of  claim 1 , wherein a quantity of logic circuits on the chip is different from a quantity of scannable latches on the second scan channel. 
     
     
       7. The method of  claim 1 , wherein the output data from the first XOR on the first scan channel comprises fixed-length data referencing the output data from the first scan channel. 
     
     
       8. The method of  claim 1 , wherein the output data from the second XOR on the first scan channel is selected from the group consisting of:
 an indicator related to the second XOR on the first scan channel; 
 a value related to the second XOR on the first scan channel; and 
 a sequence related to the second XOR on the first scan channel. 
 
     
     
       9. The method of  claim 1 , wherein the hashing the output data from the first scan channel using the first XOR on the first scan channel is similar to the hashing the output data from the second scan channel using the first XOR on the second scan channel. 
     
     
       10. The method of  claim 1 , wherein the second XOR on the first scan channel comprises a first set of XORs, wherein the second XOR on the second scan channel comprises a second set of XORs, wherein each member in the first set has an equivalent member in the second set, and wherein the rotator redirects output data from a first member of the first set to a second member of the second set, the second member not being the equivalent member of the first member. 
     
     
       11. The method of  claim 10 , wherein the first XOR on the first scan channel comprises a third set of XORs, wherein each member in the third set has an equivalent member in the first set, and wherein output data from a third member of the third set is directed to the first member, the third member being the equivalent member of the first member. 
     
     
       12. The method of  claim 1 , wherein the second XOR on the first scan channel comprises a first set of XORs, wherein the second XOR on the second scan channel comprises a second set of XORs, wherein each member in the first set has an equivalent member in the second set, and wherein the rotator redirects output data from each member of the first set to a non-equivalent member of the second set. 
     
     
       13. The method of  claim 12 , wherein the first XOR on the first scan channel comprises a third set of XORs, wherein each member in the third set has an equivalent member in the first set, and wherein output data from each member of the third set is directed to the equivalent member of the first set.