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US9349941B2ActiveUtilityPatentIndex 84

STTMRAM element having multiple perpendicular MTJs coupled in series

Assignee: AVALANCHE TECHNOLOGY INCPriority: Feb 12, 2007Filed: Nov 17, 2015Granted: May 24, 2016
Est. expiryFeb 12, 2027(~0.6 yrs left)· nominal 20-yr term from priority
Inventors:RANJAN RAJIV YADAVKESHTBOD PARVIZMALMHALL ROGER KLAS
G11C 11/161G11C 11/5607H01L 43/08H01L 43/10G11C 11/1673G11C 11/1675H01L 27/222H01L 43/02H10N 50/85H10B 61/00H10B 61/22G11C 13/0004H10N 50/10H10N 50/80
84
PatentIndex Score
5
Cited by
8
References
9
Claims

Abstract

The present invention is directed to a multi-state current-switching magnetic memory element configured to store a state by current flowing therethrough to switch the state. The magnetic memory element includes a stack of two or more magnetic tunneling junctions (MTJs) with each MTJ including a free layer with a switchable magnetic orientation perpendicular to a layer plane thereof, a barrier layer, and a fixed layer with a fixed magnetic orientation perpendicular to a layer plane thereof. Each MTJ is separated from other MTJs in the stack by at least an isolation layer. The stack of MTJs may store more than one bit of information. The free layer of each MTJ has a switching current threshold different from free layers of other MTJs in the stack.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A multi-state current-switching magnetic memory element configured to store a state by current flowing therethrough to switch the state comprising:
 a stack of two or more magnetic tunnel junctions (MTJs), each MTJ including a free layer with a switchable magnetic orientation perpendicular to a layer plane thereof, a barrier layer, and a fixed layer with a fixed magnetic orientation perpendicular to a layer plane thereof, each MTJ being separated from other MTJs in the stack by at least an isolation layer, the stack of MTJs operable to store more than one bit of information, 
 wherein the free layer of each MTJ has a switching current threshold different from free layers of other MTJs in the stack. 
 
     
     
       2. The magnetic memory element of  claim 1 , wherein the free layer of each MTJ has a different composition from free layers of other MTJs in the stack. 
     
     
       3. The magnetic memory element of  claim 1 , wherein the free layer of each MTJ has a different oxide content from free layers of other MTJs in the stack. 
     
     
       4. The magnetic memory element of  claim 1 , wherein the isolation layer has an amorphous structure. 
     
     
       5. The magnetic memory element of  claim 1 , wherein the isolation layer is non-magnetic. 
     
     
       6. The magnetic memory element of  claim 1 , wherein each MTJ in the stack stores one bit of information. 
     
     
       7. The magnetic memory element of  claim 1 , wherein each MTJ has a different thickness from other MTJs in the stack. 
     
     
       8. The magnetic memory element of  claim 1 , wherein each MTJ has a different in-plane dimension compared with other MTJs in the stack. 
     
     
       9. The magnetic memory element of  claim 1 , wherein the barrier layer of each MTJ has a different thickness from barrier layers of other MTJs in the stack, thereby providing each MTJ a unique electrical resistance.

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