Inventor · disambiguated record
David L. Adler
Also filed as: ADLER DAVID · ADLER DAVID L · ADLER DAVID LEWIS
75 granted patents·6 pending applications·2,405 citations·filing 1997–2023
99Inventor score
Top patents by PatentIndex Score
81 records- 0198US7656170B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2007·Granted Feb 2, 2010·96 cites·12 claims
- 0298US7514681B1Electrical process monitoring using mirror-mode electron microscopyKLA TENCOR TECH CORP·Filed 2006·Granted Apr 7, 2009·94 cites·32 claims
- 0398US7315022B1High-speed electron beam inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Jan 1, 2008·59 cites·16 claims
- 0498US6897444B1Multi-pixel electron emission die-to-die inspectionKLA TENCOR TECH CORP·Filed 2003·Granted May 24, 2005·95 cites·25 claims
- 0598US6771806B1Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devicesKLA TENCOR·Filed 2000·Granted Aug 3, 2004·258 cites·27 claims
- 0697US9291578B2X-ray photoemission microscope for integrated devicesADLER DAVID L·Filed 2012·Granted Mar 22, 2016·33 cites·38 claims
- 0797US8995622B2X-ray source with increased operating lifeADLER DAVID L·Filed 2011·Granted Mar 31, 2015·35 cites·21 claims
- 0897US8831179B2X-ray source with selective beam repositioningADLER DAVID L·Filed 2011·Granted Sep 9, 2014·41 cites·18 claims
- 0996US11688067B2Methods and systems for detecting defects in devices using X-raysBRUKER NANO INC·Filed 2020·Granted Jun 27, 2023·5 cites·17 claims
- 1096US11042981B2Methods and systems for printed circuit board design based on automatic correctionsSVXR INC·Filed 2020·Granted Jun 22, 2021·6 cites·20 claims
- 1196US6636064B1Dual probe test structures for semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 21, 2003·127 cites·22 claims
- 1296US6633174B1Stepper type test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 14, 2003·195 cites·14 claims
- 1396US5973323AApparatus and method for secondary electron emission microscopeKLA TENCOR CORP·Filed 1997·Granted Oct 26, 1999·138 cites·45 claims
- 1495US9607724B2Devices processed using x-raysADLER DAVID LEWIS·Filed 2015·Granted Mar 28, 2017·11 cites·24 claims
- 1595US6524873B1Continuous movement scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Feb 25, 2003·102 cites·23 claims
- 1694US11430118B2Methods and systems for process control based on X-ray inspectionBRUKER NANO INC·Filed 2020·Granted Aug 30, 2022·3 cites·20 claims
- 1794US9129715B2High speed x-ray inspection microscopeADLER DAVID LEWIS·Filed 2013·Granted Sep 8, 2015·78 cites·43 claims
- 1894US7012439B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2005·Granted Mar 14, 2006·21 cites·9 claims
- 1994US6586733B1Apparatus and methods for secondary electron emission microscope with dual beamKLA TENCOR·Filed 2000·Granted Jul 1, 2003·46 cites·21 claims
- 2093US11651492B2Methods and systems for manufacturing printed circuit board based on x-ray inspectionBRUKER NANO INC·Filed 2020·Granted May 16, 2023·3 cites·78 claims
- 2193US11615533B2Methods and systems for product failure prediction based on X-ray image re-examinationBRUKER NANO INC·Filed 2020·Granted Mar 28, 2023·3 cites·35 claims
- 2293US9646732B2High speed X-ray microscopeSVXR INC·Filed 2016·Granted May 9, 2017·10 cites·54 claims
- 2393US6870172B1Maskless reflection electron beam projection lithographyKLA TENCOR TECH CORP·Filed 2004·Granted Mar 22, 2005·82 cites·34 claims
- 2493US6066849AScanning electron beam microscopeKLA TENCOR·Filed 1998·Granted May 23, 2000·103 cites·27 claims
- 2592US8422010B2Methods and systems for determining a characteristic of a waferKIRK MICHAEL D·Filed 2012·Granted Apr 16, 2013·13 cites·34 claims
- 2692US7171038B2Method and apparatus for inspecting a substrateKLA TENCOR TECH CORP·Filed 2001·Granted Jan 30, 2007·42 cites·5 claims
- 2792US6921672B2Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2003·Granted Jul 26, 2005·59 cites·12 claims
- 2892US6566885B1Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted May 20, 2003·57 cites·24 claims
- 2992US6528818B1Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Mar 4, 2003·60 cites·19 claims
- 3092US5869833AElectron beam dose control for scanning electron microscopy and critical dimension measurement instrumentsKLA TENCOR CORP·Filed 1997·Granted Feb 9, 1999·78 cites·18 claims
- 3191US6610980B2Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beamsKLA TENCOR CORP·Filed 2001·Granted Aug 26, 2003·42 cites·19 claims
- 3290US6803571B1Method and apparatus for dual-energy e-beam inspectorKLA TENCOR TECH CORP·Filed 2003·Granted Oct 12, 2004·34 cites·23 claims
- 3388US6903338B2Method and apparatus for reducing substrate edge effects in electron lensesKLA TENCOR TECH CORP·Filed 2003·Granted Jun 7, 2005·26 cites·18 claims
- 3488US6087659AApparatus and method for secondary electron emission microscopeKLA TENCOR CORP·Filed 1999·Granted Jul 11, 2000·44 cites·27 claims
- 3587US10692184B2Super-resolution X-ray imaging method and apparatusSVXR INC·Filed 2018·Granted Jun 23, 2020·4 cites·27 claims
- 3687US8284394B2Methods and systems for determining a characteristic of a waferKIRK MICHAEL D·Filed 2007·Granted Oct 9, 2012·12 cites·36 claims
- 3786US7660687B1Robust measurement of parametersKLA TENCOR CORP·Filed 2006·Granted Feb 9, 2010·8 cites·19 claims
- 3886US7361941B1Calibration standards and methodsKLA TENCOR TECH CORP·Filed 2004·Granted Apr 22, 2008·24 cites·29 claims
- 3985US6867606B2Multiple directional scans of test structures on semiconductor integrated circuitsKLA TENCOR TECHNOLOGIES INC·Filed 2003·Granted Mar 15, 2005·28 cites·6 claims
- 4084US8729470B2Electron microscope with an emitter operating in medium vacuumADLER DAVID L·Filed 2009·Granted May 20, 2014·7 cites·20 claims
- 4183US11307152B2X-ray photoemission apparatus for inspection of integrated devicesADLER DAVID L·Filed 2019·Granted Apr 19, 2022·2 cites·20 claims
- 4283US7391033B1Skew-oriented multiple electron beam apparatus and methodKLA TENCOR TECH CORP·Filed 2005·Granted Jun 24, 2008·9 cites·19 claims
- 4383US6797955B1Filtered e-beam inspection and reviewKLA TENCOR TECH CORP·Filed 2003·Granted Sep 28, 2004·19 cites·10 claims
- 4481US6803572B2Apparatus and methods for secondary electron emission microscope with dual beamKLA TENCOR TECH CORP·Filed 2003·Granted Oct 12, 2004·13 cites·19 claims
- 4579US7351968B1Multi-pixel electron emission die-to-die inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Apr 1, 2008·4 cites·20 claims
- 4679US6979824B1Filtered e-beam inspection and reviewKLA TENCOR TECH CORP·Filed 2004·Granted Dec 27, 2005·14 cites·25 claims
- 4778US9170503B2Method and apparatus for inspecting a substrateADLER DAVID·Filed 2006·Granted Oct 27, 2015·4 cites·11 claims
- 4878US7009177B1Apparatus and method for tilted particle-beam illuminationKLA TENCOR TECH CORP·Filed 2005·Granted Mar 7, 2006·4 cites·26 claims
- 4976US11619596B2X-ray photoemission system for 3-D laminographyADLER DAVID L·Filed 2022·Granted Apr 4, 2023·0 cites·20 claims
- 5076US10559396B2Devices processed using x-raysSVXR INC·Filed 2017·Granted Feb 11, 2020·1 cites·35 claims
Showing the top 50 of 81 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →