Inventor · disambiguated record
Hyoseok Daniel Yang
Also filed as: YANG HYOSEOK · YANG HYOSEOK DANIEL
6 granted patents·8 pending applications·4 citations·filing 2002–2024
69Inventor score
Top patents by PatentIndex Score
14 records- 0161US2025234764A1Display apparatus and vision inspection systemSAMSUNG DISPLAY CO LTD·Filed 2024·Application pending·0 cites
- 0259US9423357B2Oblique illuminator for inspecting manufactured substratesKLA TENCOR CORP·Filed 2014·Granted Aug 23, 2016·0 cites·12 claims
- 0355US9435030B2Radical reactor with inverted orientationVEECO ALD INC·Filed 2013·Granted Sep 6, 2016·0 cites·16 claims
- 0455US2015361548A1Injection Assembly in Linear Deposition Apparatus with Bulging Ridges Extending along Bottom OpeningsVEECO ALD INC·Filed 2014·Application pending·0 cites
- 0554US2014366804A1Performing Atomic Layer Deposition on Large Substrate Using Scanning ReactorsVEECO ALD INC·Filed 2014·Application pending·0 cites
- 0650US2016340779A1Radical Reactor With Inverted OrientationVEECO ALD INC·Filed 2016·Application pending·0 cites
- 0747US8794801B2Oblique illuminator for inspecting manufactured substratesZHANG SHIYU·Filed 2011·Granted Aug 5, 2014·0 cites·20 claims
- 0846US2015360242A1Linear Deposition Apparatus with Modular AssemblyVEECO ALD INC·Filed 2014·Application pending·0 cites
- 0945US9546423B2Cleaning of deposition device by injecting cleaning gas into deposition deviceVEECO ALD INC·Filed 2015·Granted Jan 17, 2017·0 cites·12 claims
- 1041USD732093SGas tube assemblyVEECO ALD INC·Filed 2014·Granted Jun 16, 2015·4 cites·1 claims
- 1129US2003169980A1Fiber optic coupling assembly and apparatus and method for making sameALVESTA CORP·Filed 2002·Application pending·0 cites
- 1227USD732092SGas injection plateVEECO ALD INC·Filed 2014·Granted Jun 16, 2015·0 cites·1 claims
- 1325US2008106292A1Probe card having cantilever probesCORAD TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 1425US2008048685A1Probe card having vertical probesCORAD TECHNOLOGY INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →