Inventor · disambiguated record
Kurt H. Weiner
Also filed as: WEINER KURT · WEINER KURT H
59 granted patents·13 pending applications·1,970 citations·filing 1990–2019
99Inventor score
Top patents by PatentIndex Score
72 records- 0197US7824935B2Methods of combinatorial processing for screening multiple samples on a semiconductor substrateINTERMOLECULAR INC·Filed 2008·Granted Nov 2, 2010·25 cites·8 claims
- 0297US7280945B1Apparatus and methods for detection of systematic defectsKLA TENCOR TECH CORP·Filed 2002·Granted Oct 9, 2007·121 cites·35 claims
- 0397US6795952B1System and method for product yield prediction using device and process neighborhood characterization vehiclePDF SOLUTIONS INC·Filed 2002·Granted Sep 21, 2004·264 cites·20 claims
- 0497US6751519B1Methods and systems for predicting IC chip yieldKLA TENCOR TECH CORP·Filed 2002·Granted Jun 15, 2004·222 cites·33 claims
- 0596US6861666B1Apparatus and methods for determining and localization of failures in test structures using voltage contrastKLA TENCOR TECH CORP·Filed 2002·Granted Mar 1, 2005·106 cites·16 claims
- 0696US6636064B1Dual probe test structures for semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 21, 2003·127 cites·22 claims
- 0795US7198963B2Methodologies for efficient inspection of test structures using electron beam scanning and step and repeat systemsKLA TENCOR TECH CORP·Filed 2003·Granted Apr 3, 2007·87 cites·17 claims
- 0895US7067335B2Apparatus and methods for semiconductor IC failure detectionKLA TENCOR TECH CORP·Filed 2002·Granted Jun 27, 2006·93 cites·11 claims
- 0994US8011317B2Advanced mixing system for integrated tool having site-isolated reactorsINTERMOLECULAR INC·Filed 2006·Granted Sep 6, 2011·23 cites·29 claims
- 1094US7205542B1Scanning electron microscope with curved axesKLA TENCOR TECH CORP·Filed 2006·Granted Apr 17, 2007·21 cites·29 claims
- 1194US6995393B2Apparatus and methods for semiconductor IC failure detectionKLA TENCOR TECH CORP·Filed 2002·Granted Feb 7, 2006·72 cites·10 claims
- 1293US8881677B2Shadow mask for patterned deposition on substratesINTERMOLECULAR INC·Filed 2012·Granted Nov 11, 2014·10 cites·17 claims
- 1393US6813572B2Apparatus and methods for managing reliability of semiconductor devicesKLA TENCOR TECH CORP·Filed 2002·Granted Nov 2, 2004·69 cites·16 claims
- 1492US6921672B2Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2003·Granted Jul 26, 2005·59 cites·12 claims
- 1592US6528818B1Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Mar 4, 2003·60 cites·19 claims
- 1691US5346850ACrystallization and doping of amorphous silicon on low temperature plasticUNIV CALIFORNIA·Filed 1992·Granted Sep 13, 1994·154 cites·24 claims
- 1789US8770143B2Multi-region processing systemENDO RICK·Filed 2011·Granted Jul 8, 2014·19 cites·13 claims
- 1886US8039052B2Multi-region processing system and headsINTERMOLECULAR INC·Filed 2007·Granted Oct 18, 2011·5 cites·9 claims
- 1986US7993461B2Method and system for mask handling in high productivity chamberINTERMOLECULAR INC·Filed 2007·Granted Aug 9, 2011·8 cites·13 claims
- 2085US8143619B2Methods of combinatorial processing for screening multiple samples on a semiconductor substrateVERMA GAURAV·Filed 2010·Granted Mar 27, 2012·4 cites·6 claims
- 2184US8220502B1Measuring volume of a liquid dispensed into a vesselKELEKAR RAJESH·Filed 2007·Granted Jul 17, 2012·12 cites·7 claims
- 2284US8037894B1Maintaining flow rate of a fluidINTERMOLECULAR INC·Filed 2007·Granted Oct 18, 2011·11 cites·13 claims
- 2384US6642726B2Apparatus and methods for reliable and efficient detection of voltage contrast defectsKLA TENCOR CORP·Filed 2001·Granted Nov 4, 2003·23 cites·21 claims
- 2483US8383430B2Methods of combinatorial processing for screening multiple samples on a semiconductor substrateINTERMOLECULAR INC·Filed 2012·Granted Feb 26, 2013·3 cites·12 claims
- 2582US8414703B2Advanced mixing system for integrated tool having site-isolated reactorsWEINER KURT H·Filed 2012·Granted Apr 9, 2013·4 cites·18 claims
- 2682US8207069B2Advanced mixing method for integrated tool having site-isolated reactorsWEINER KURT H·Filed 2011·Granted Jun 26, 2012·4 cites·22 claims
- 2781US6855568B2Apparatus and methods for monitoring self-aligned contact arrays using voltage contrast inspectionKLA TENCOR CORP·Filed 2001·Granted Feb 15, 2005·27 cites·21 claims
- 2880US8822346B1Method and apparatus for self-aligned layer removalWEINER KURT·Filed 2008·Granted Sep 2, 2014·7 cites·17 claims
- 2980US8082045B1Substrate processing recipe managerASHIZAWA YOSHIKI·Filed 2007·Granted Dec 20, 2011·19 cites·26 claims
- 3080US7560939B1Electrical defect detection using pre-charge and sense scanning with prescribed delaysKLA TENCOR TECH CORP·Filed 2006·Granted Jul 14, 2009·10 cites·8 claims
- 3180US5569624AMethod for shallow junction formationUNIV CALIFORNIA·Filed 1995·Granted Oct 29, 1996·57 cites·19 claims
- 3279US5114876ASelective epitaxy using the gild processUS ENERGY·Filed 1990·Granted May 19, 1992·67 cites·20 claims
- 3378US9059223B2Modular flow cell and adjustment systemWEINER KURT·Filed 2008·Granted Jun 16, 2015·6 cites·7 claims
- 3478US8501505B2Methods of combinatorial processing for screening multiple samples on a semiconductor substrateINTERMOLECULAR INC·Filed 2012·Granted Aug 6, 2013·2 cites·20 claims
- 3574US8317925B2Method and system for mask handling in high productivity chamberENDO RICK·Filed 2011·Granted Nov 27, 2012·2 cites·19 claims
- 3673US9016233B1Volume combinatorial processing chamberWEINER KURT·Filed 2008·Granted Apr 28, 2015·5 cites·19 claims
- 3772US8771483B2Combinatorial process systemENDO RICK·Filed 2008·Granted Jul 8, 2014·2 cites·15 claims
- 3872US8633039B2Methods of combinatorial processing for screening multiple samples on a semiconductor substrateINTERMOLECULAR INC·Filed 2013·Granted Jan 21, 2014·1 cites·20 claims
- 3972US8449678B2Combinatorial process systemENDO RICK·Filed 2008·Granted May 28, 2013·2 cites·18 claims
- 4071US2014311408A1Multi-Region Processing System and HeadsINTERMOLECULAR INC·Filed 2014·Application pending·0 cites
- 4170US8932995B2Combinatorial process systemENDO RICK·Filed 2011·Granted Jan 13, 2015·1 cites·11 claims
- 4270US8387563B2Combinatorial process systemENDO RICK·Filed 2012·Granted Mar 5, 2013·1 cites·9 claims
- 4370US8343327B2Apparatus and methods for fast chemical electrodeposition for fabrication of solar cellsREEL SOLAR INC·Filed 2010·Granted Jan 1, 2013·1 cites·27 claims
- 4469USH1637HLaser-assisted fabrication of bipolar transistors in silicon-on-sapphire (SOS)Filed 1991·Granted Mar 4, 1997·46 cites·30 claims
- 4567US5773309AMethod for producing silicon thin-film transistors with enhanced forward current driveUNIV CALIFORNIA·Filed 1995·Granted Jun 30, 1998·32 cites·13 claims
- 4665US6732002B1Apparatus and methods for predicting multiple product chip yields through critical area matchingKLA TENCOR CORP·Filed 2001·Granted May 4, 2004·9 cites·23 claims
- 4764US7955436B2Systems and methods for sealing in site-isolated reactorsINTERMOLECULAR INC·Filed 2006·Granted Jun 7, 2011·1 cites·20 claims
- 4862US8772772B2System and method for increasing productivity of combinatorial screeningWEINER KURT H·Filed 2006·Granted Jul 8, 2014·1 cites·32 claims
- 4961US8528608B2Measuring volume of a liquid dispensed into a vesselKELEKAR RAJESH·Filed 2012·Granted Sep 10, 2013·1 cites·16 claims
- 5061US5508065AMethod for materials deposition by ablation transfer processingUNIV CALIFORNIA·Filed 1994·Granted Apr 16, 1996·19 cites·23 claims
Showing the top 50 of 72 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Kurt H. Weiner files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →