Inventor · disambiguated record
Ravi Keshav Joshi
Also filed as: JOSHI RAVI · JOSHI RAVI KESHAV
37 granted patents·16 pending applications·28 citations·filing 2014–2024
95Inventor score
Files withINFINEON TECHNOLOGIES AG34INFINEON TECHNOLOGIES AUSTRIA AG18INFINEON TECHNOLOGIES AUSTRIA1
Top patents by PatentIndex Score
53 records- 0194US10573742B1Oxygen inserted Si-layers in vertical trench power devicesINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2018·Granted Feb 25, 2020·11 cites·24 claims
- 0290US11031466B2Method of forming oxygen inserted Si-layers in power semiconductor devicesINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 0389US10741638B2Oxygen inserted Si-layers for reduced substrate dopant outdiffusion in power devicesINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2018·Granted Aug 11, 2020·4 cites·13 claims
- 0486US10861966B2Vertical trench power devices with oxygen inserted Si-layersINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2019·Granted Dec 8, 2020·3 cites·20 claims
- 0577US9917333B2Lithium ion battery, integrated circuit and method of manufacturing a lithium ion batteryINFINEON TECHNOLOGIES AG·Filed 2014·Granted Mar 13, 2018·2 cites·20 claims
- 0676US9899325B2Device and method for manufacturing a device with a barrier layerINFINEON TECHNOLOGIES AG·Filed 2014·Granted Feb 20, 2018·1 cites·19 claims
- 0775US9455136B2Controlling the reflow behaviour of BPSG films and devices made thereofINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2015·Granted Sep 27, 2016·2 cites·24 claims
- 0871US10256097B2Forming a metal contact layer on silicon carbide and semiconductor device with metal contact structureINFINEON TECHNOLOGIES AG·Filed 2017·Granted Apr 9, 2019·1 cites·15 claims
- 0971US2024113026A1Silicon Carbide Device and Method for Forming a Silicon Carbide DeviceINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 1064US11545545B2Superjunction device with oxygen inserted Si-layersINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2020·Granted Jan 3, 2023·0 cites·20 claims
- 1164US9379196B2Method of forming a trench using epitaxial lateral overgrowth and deep vertical trench structureINFINEON TECHNOLOGIES AUSTRIA·Filed 2014·Granted Jun 28, 2016·1 cites·10 claims
- 1263US11881512B2Method of manufacturing semiconductor device with silicon carbide bodyINFINEON TECHNOLOGIES AG·Filed 2021·Granted Jan 23, 2024·0 cites·14 claims
- 1362US11842938B2Semiconductor device and method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2021·Granted Dec 12, 2023·0 cites·18 claims
- 1460US12463037B2Method of manufacturing ohmic contacts on a silicon carbide (SIC) substrate, method of manufacturing a semiconductor device, and semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2022·Granted Nov 4, 2025·0 cites·23 claims
- 1560US10777506B2Silicon carbide semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2019·Granted Sep 15, 2020·0 cites·13 claims
- 1660US9773736B2Intermediate layer for copper structuring and methods of formation thereofINFINEON TECHNOLOGIES AG·Filed 2015·Granted Sep 26, 2017·1 cites·21 claims
- 1760US2024347456A1Vertical power semiconductor device comprising source or emitter padINFINEON TECHNOLOGIES AG·Filed 2024·Application pending·0 cites
- 1859US10910309B2Nanotube structure based metal damascene processINFINEON TECHNOLOGIES AG·Filed 2017·Granted Feb 2, 2021·0 cites·19 claims
- 1958US2022285149A1Power semiconductor device having a structured metallization layerINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2022·Application pending·0 cites
- 2057US11387095B2Passivation structuring and plating for semiconductor devicesINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2020·Granted Jul 12, 2022·0 cites·19 claims
- 2157US11195921B2Semiconductor device with silicon carbide bodyINFINEON TECHNOLOGIES AG·Filed 2019·Granted Dec 7, 2021·0 cites·16 claims
- 2257US10978395B2Method of manufacturing a semiconductor device having a power metallization structureINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2020·Granted Apr 13, 2021·0 cites·18 claims
- 2357US10325803B2Semiconductor wafer and method for processing a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2018·Granted Jun 18, 2019·0 cites·13 claims
- 2457US9159669B2Nanotube structure based metal damascene processINFINEON TECHNOLOGIES AG·Filed 2014·Granted Oct 13, 2015·0 cites·7 claims
- 2556US10790353B2Semiconductor device with superjunction and oxygen inserted Si-layersINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2018·Granted Sep 29, 2020·0 cites·11 claims
- 2656US2024030032A1Method for manufacturing a contact on a silicon carbide semiconductor substrate, and silicon carbide semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 2755US9984915B2Semiconductor wafer and method for processing a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2014·Granted May 29, 2018·0 cites·9 claims
- 2855US9704800B2Nanotube structure based metal damascene processINFINEON TECHNOLOGIES AG·Filed 2015·Granted Jul 11, 2017·0 cites·12 claims
- 2955US2024055257A1Method for manufacturing a contact on a silicon carbide substrate, and silicon carbide semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 3054US10043750B2Nanotube structure based metal damascene processINFINEON TECHNOLOGIES AG·Filed 2015·Granted Aug 7, 2018·0 cites·12 claims
- 3154US2025113592A1Semiconductor device with schottky contactINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 3253US2018247820A1Controlling the Reflow Behaviour of BPSG Films and Devices Made ThereofINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2018·Application pending·0 cites
- 3352US11367683B2Silicon carbide device and method for forming a silicon carbide deviceINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jun 21, 2022·0 cites·25 claims
- 3452US10475743B2Semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2017·Granted Nov 12, 2019·0 cites·25 claims
- 3552US2024055256A1Method for manufacturing a contact on a silicon carbide semiconductor substrate, and silicon carbide semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 3652US2023238442A1Semiconductor device with metal nitride layer and a method of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 3752US2022262906A1Sic mosfet with reduced on-resistanceINFINEON TECHNOLOGIES AG·Filed 2022·Application pending·0 cites
- 3851US11217500B2Semiconductor device and method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2019·Granted Jan 4, 2022·0 cites·26 claims
- 3951US10734320B2Power metallization structure for semiconductor devicesINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2018·Granted Aug 4, 2020·0 cites·18 claims
- 4050US10580878B1SiC device with buried doped regionINFINEON TECHNOLOGIES AG·Filed 2018·Granted Mar 3, 2020·0 cites·20 claims
- 4149US10049879B2Self aligned silicon carbide contact formation using protective layerINFINEON TECHNOLOGIES AG·Filed 2017·Granted Aug 14, 2018·0 cites·20 claims
- 4249US9768273B2Method of forming a trench using epitaxial lateral overgrowthINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2016·Granted Sep 19, 2017·0 cites·20 claims
- 4349US2017011927A1Controlling the Reflow Behaviour of BPSG Films and Devices Made ThereofINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2016·Application pending·0 cites
- 4448US9666482B1Self aligned silicon carbide contact formation using protective layerINFINEON TECHNOLOGIES AG·Filed 2016·Granted May 30, 2017·0 cites·20 claims
- 4547US10749216B2Battery, integrated circuit and method of manufacturing a batteryINFINEON TECHNOLOGIES AG·Filed 2014·Granted Aug 18, 2020·0 cites·20 claims
- 4647US10121859B2Method of manufacturing semiconductor devices with transistor cells and semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2017·Granted Nov 6, 2018·0 cites·22 claims
- 4742US10347491B2Forming recombination centers in a semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2017·Granted Jul 9, 2019·0 cites·20 claims
- 4842US2020111896A1Transistor Device and Method for Forming a Recess for a Trench Gate ElectrodeINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2019·Application pending·0 cites
- 4940US2019333765A1Semiconductor Device and ManufacturingINFINEON TECHNOLOGIES AG·Filed 2019·Application pending·0 cites
- 5039US9917170B2Carbon based contact structure for silicon carbide device technical fieldINFINEON TECHNOLOGIES AG·Filed 2016·Granted Mar 13, 2018·0 cites·18 claims
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →