Inventor · disambiguated record
Rusmin Kudinar
Also filed as: KUDINAR RUSMIN
39 granted patents·1 pending application·875 citations·filing 1984–2022
98Inventor score
Top patents by PatentIndex Score
40 records- 0197US6392749B1High speed optical profilometer for measuring surface height variationCANDELA INSTR·Filed 2000·Granted May 21, 2002·123 cites·28 claims
- 0296US6757056B1Combined high speed optical profilometer and ellipsometerCANDELA INSTR·Filed 2001·Granted Jun 29, 2004·91 cites·72 claims
- 0395US7656519B2Wafer edge inspectionKLA TENCOR CORP·Filed 2007·Granted Feb 2, 2010·26 cites·35 claims
- 0495US7161668B2Wafer edge inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Jan 9, 2007·24 cites·16 claims
- 0594US7161667B2Wafer edge inspectionKLA TENCOR TECH CORP·Filed 2005·Granted Jan 9, 2007·22 cites·18 claims
- 0694US6956660B2System and method for measuring properties of an object using a phase difference between two reflected light signalsKLA TENCOR TECHNOLOGIES·Filed 2004·Granted Oct 18, 2005·43 cites·52 claims
- 0794US6031615ASystem and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughnessCANDELA INSTR·Filed 1998·Granted Feb 29, 2000·74 cites·93 claims
- 0892US11536940B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Dec 27, 2022·2 cites·14 claims
- 0992US6956658B2System and method for measuring object characteristics using phase differences in polarized light reflectionsKLA TENCOR TECH CORP·Filed 2003·Granted Oct 18, 2005·42 cites·32 claims
- 1091US8848181B1Multi-surface scattered radiation differentiationMEEKS STEVEN W·Filed 2013·Granted Sep 30, 2014·10 cites·19 claims
- 1191US5705741AConstant-force profilometer with stylus-stabilizing sensor assembly, dual-view optics, and temperature drift compensationTENCOR INSTRUMENTS·Filed 1994·Granted Jan 6, 1998·71 cites·58 claims
- 1290US10094787B2Multi-surface specular reflection inspectorZETA INSTR INC·Filed 2016·Granted Oct 9, 2018·4 cites·20 claims
- 1390US9921169B2Method of detecting defect location using multi-surface specular reflectionZETA INSTR INC·Filed 2016·Granted Mar 20, 2018·4 cites·16 claims
- 1490US8836935B1Optical inspector with selective scattered radiation blockerMEEKS STEVEN W·Filed 2013·Granted Sep 16, 2014·9 cites·19 claims
- 1590US8830457B1Multi-surface optical inspectorZETA INSTR INC·Filed 2013·Granted Sep 9, 2014·9 cites·13 claims
- 1689US6717671B1System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic patternCANDELA INSTR·Filed 1999·Granted Apr 6, 2004·48 cites·37 claims
- 1788US6268919B1System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operationsCANDELA INSTR·Filed 1999·Granted Jul 31, 2001·47 cites·36 claims
- 1886US7532318B2Wafer edge inspectionKLA TENCOR CORP·Filed 2006·Granted May 12, 2009·10 cites·29 claims
- 1986US6130749ASystem and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operationCANDELA INSTR·Filed 1999·Granted Oct 10, 2000·40 cites·29 claims
- 2082US10048480B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesXU JAMES JIANGUO·Filed 2011·Granted Aug 14, 2018·4 cites·9 claims
- 2182US6229610B1System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operationCANDELA INSTR·Filed 1999·Granted May 8, 2001·33 cites·36 claims
- 2282US6198533B1High temperature thin film property measurement system and methodCANDELA INSTR INC·Filed 1999·Granted Mar 6, 2001·36 cites·111 claims
- 2380US12265212B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2022·Granted Apr 1, 2025·0 cites·1 claims
- 2478US7110097B2Combined high speed optical profilometer and ellipsometerKLA TENCOR TECH CORP·Filed 2005·Granted Sep 19, 2006·4 cites·29 claims
- 2577US8896825B2Optical inspectorMEEKS STEVEN W·Filed 2013·Granted Nov 25, 2014·4 cites·17 claims
- 2677US6665078B1System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafersCANDELA INSTR·Filed 1999·Granted Dec 16, 2003·36 cites·34 claims
- 2775US9036869B2Multi-surface optical 3D microscopeLEE KEN KINSUN·Filed 2011·Granted May 19, 2015·4 cites·19 claims
- 2875US7075630B2Combined high speed optical profilometer and ellipsometerKLA TENCOR TECH CORP·Filed 2004·Granted Jul 11, 2006·13 cites·13 claims
- 2974US9389408B23D microscope and methods of measuring patterned substratesHOU ZHEN·Filed 2011·Granted Jul 12, 2016·4 cites·28 claims
- 3073US4597708AWafer handling apparatusTENCOR INSTRUMENTS·Filed 1984·Granted Jul 1, 1986·36 cites·15 claims
- 3172US11294161B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
- 3262US10884228B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2018·Granted Jan 5, 2021·0 cites·11 claims
- 3361US8498184B1Interchangeable disk clampKUDINAR RUSMIN·Filed 2009·Granted Jul 30, 2013·2 cites·19 claims
- 3451US9664888B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 30, 2017·0 cites·20 claims
- 3550US9645381B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 9, 2017·0 cites·11 claims
- 3650US8830456B2Optical inspectorMEEKS STEVEN W·Filed 2013·Granted Sep 9, 2014·0 cites·20 claims
- 3749US10209501B23D microscope and methods of measuring patterned substratesZETA INSTR INC·Filed 2016·Granted Feb 19, 2019·0 cites·15 claims
- 3844US8976366B2System and method for monitoring LED chip surface roughening processXU JAMES JIANGUO·Filed 2012·Granted Mar 10, 2015·0 cites·42 claims
- 3942US10769769B2Dual mode inspectorZETA INSTR INC·Filed 2016·Granted Sep 8, 2020·0 cites·22 claims
- 4036US2002015146A1Combined high speed optical profilometer and ellipsometerFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →