US2002009827A1PendingUtilityA1

Microelectronic unit forming methods and materials

Priority: Aug 26, 1997Filed: Sep 24, 2001Published: Jan 24, 2002
Est. expiryAug 26, 2017(expired)· nominal 20-yr term from priority
H10P 72/744H10P 72/743H10W 90/756H10W 72/5363H10W 72/244H10W 72/0198H10W 72/59H10W 72/29H10W 70/656H10W 70/65H10W 70/60H10W 70/05H10W 70/644H10W 90/724H10W 72/90H10W 70/093H10W 90/701
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Claims

Abstract

Electrically conductive elements such as terminals and leads are held on a support structure by a degradable connecting layer such as a adhesive degradable by heat or radiant energy. After connecting these elements to a microelectronic element such as a chip or wafer, the conductive elements are released from the support structure by degrading the connecting layer. The support structure desirably has a predictable, isotropic coefficient of thermal expansion and such coefficient of thermal expansion may be close to that of silicon to minimize the effect of the temperature changes. The conductive elements may be mounted on a plurality of individual tiles rather than on an unitary sheet covering an entire wafer to minimize dimensional changes when the dielectric is released from the support structure.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . A method of making a microelectronic assembly comprising: 
 (a) providing leads physically connected to a bottom surface of a support, each said lead having a tip end and a terminal end;    (b) engaging said support with a microelectronic element having contacts thereon so that the tip ends of the leads are aligned with the contacts of the microelectronic element, and bonding the tip ends of the leads to the contacts;    (c) during or after said bonding, selectively degrading the connection between the support and the leads at and adjacent the tip ends thereof so as to free the tip ends from the support and leave the terminal ends secured to the support.

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