Inventor · disambiguated record
Jason Z. Lin
Also filed as: LIN JASON · LIN JASON Z · LIN JASON ZSE-CHERNG
33 granted patents·6 pending applications·769 citations·filing 1993–2022
97Inventor score
Files withKLA TENCOR CORP11KLA TENCOR TECH CORP8DMO SYSTEMS LTD6APPLIED MATERIALS INC3KLA INSTR CORP2
Top patents by PatentIndex Score
39 records- 0196US5537669AInspection method and apparatus for the inspection of either random or repeating patternsKLA INSTR CORP·Filed 1993·Granted Jul 16, 1996·224 cites·30 claims
- 0295US6137570ASystem and method for analyzing topological features on a surfaceKLA TENCOR CORP·Filed 1998·Granted Oct 24, 2000·161 cites·29 claims
- 0393US7570800B2Methods and systems for binning defects detected on a specimenKLA TENCOR TECH CORP·Filed 2005·Granted Aug 4, 2009·29 cites·45 claims
- 0491US7555409B1Daisy chained topologyKLA TENCOR CORP·Filed 2004·Granted Jun 30, 2009·48 cites·17 claims
- 0589US7440607B1Outlier substrate inspectionKLA TENCOR CORP·Filed 2004·Granted Oct 21, 2008·45 cites·20 claims
- 0688US10365617B2Auto defect screening using adaptive machine learning in semiconductor device manufacturing flowDMO SYSTEMS LTD·Filed 2016·Granted Jul 30, 2019·4 cites·24 claims
- 0788US9547745B1System and method for discovering unknown problematic patterns in chip design layout for semiconductor manufacturingDMO SYSTEMS LTD·Filed 2015·Granted Jan 17, 2017·7 cites·28 claims
- 0887US8000922B2Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithmKLA TENCOR CORP·Filed 2008·Granted Aug 16, 2011·16 cites·20 claims
- 0983US6665432B1Inspection method and apparatus for the inspection of either random or repeating patternsFiled 2000·Granted Dec 16, 2003·37 cites·9 claims
- 1081US8938695B1Signature analytics for improving lithographic process of manufacturing semiconductor devicesDMO SYSTEMS LTD·Filed 2014·Granted Jan 20, 2015·6 cites·14 claims
- 1177US6021214AInspection method and apparatus for the inspection of either random or repeating patternsKLA INSTR CORP·Filed 1995·Granted Feb 1, 2000·83 cites·4 claims
- 1274US11120182B2Methodology of incorporating wafer physical measurement with digital simulation for improving semiconductor device fabricationAPPLIED MATERIALS INC·Filed 2019·Granted Sep 14, 2021·1 cites·20 claims
- 1374US7251586B2Full swath analysisKLA TENCOR TECH CORP·Filed 2005·Granted Jul 31, 2007·6 cites·5 claims
- 1473USD569049SDouble decker pet carrierLIN JASON·Filed 2006·Granted May 13, 2008·20 cites·1 claims
- 1570US7865037B1Memory load balancingKLA TENCOR CORP·Filed 2006·Granted Jan 4, 2011·2 cites·12 claims
- 1670US2022230293A1Method and system for mixed mode wafer inspectionKLA CORP·Filed 2022·Application pending·0 cites
- 1769US7149642B1Programmable image computerKLA TENCOR TECH CORP·Filed 2004·Granted Dec 12, 2006·7 cites·17 claims
- 1868US7024339B1Full swath analysisKLA TENCOR TECH CORP·Filed 2004·Granted Apr 4, 2006·12 cites·16 claims
- 1967US8692878B2Methods and apparatus for simultaneously inspecting multiple array regions having different pitchesCHEN HONG·Filed 2010·Granted Apr 8, 2014·2 cites·24 claims
- 2067US7440640B1Image data storageKLA TENCOR CORP·Filed 2004·Granted Oct 21, 2008·8 cites·17 claims
- 2166US7076390B1Memory load balancingKLA TENCOR TECH CORP·Filed 2004·Granted Jul 11, 2006·5 cites·19 claims
- 2264US7181368B1Status pollingKLA TENCOR TECH CORP·Filed 2004·Granted Feb 20, 2007·9 cites·16 claims
- 2361USD608505SDouble pet strollerLIN JASON·Filed 2007·Granted Jan 19, 2010·12 cites·1 claims
- 2460US7379838B2Programmable image computerKLA TENCOR CORP·Filed 2006·Granted May 27, 2008·2 cites·1 claims
- 2559US11295438B2Method and system for mixed mode wafer inspectionKLA TENCOR CORP·Filed 2018·Granted Apr 5, 2022·0 cites·9 claims
- 2659US10754309B2Auto defect screening using adaptive machine learning in semiconductor device manufacturing flowAPPLIED MATERIALS INC·Filed 2019·Granted Aug 25, 2020·0 cites·12 claims
- 2758US9142014B2System and method for identifying systematic defects in wafer inspection using hierarchical grouping and filteringDMO SYSTEMS LTD·Filed 2013·Granted Sep 22, 2015·1 cites·18 claims
- 2858US8155428B2Memory cell and page break inspectionLIN JASON Z·Filed 2008·Granted Apr 10, 2012·3 cites·17 claims
- 2955US8645100B2Status pollingBHASKAR KRISHNAMURTHY·Filed 2007·Granted Feb 4, 2014·1 cites·8 claims
- 3054US2008154687A1Method And Apparatus Of On-Site Display For Showing Calendar Events Of A Conference RoomLIN JASON ZSE-CHERNG·Filed 2006·Application pending·0 cites
- 3153US10192303B2Method and system for mixed mode wafer inspectionKLA TENCOR CORP·Filed 2013·Granted Jan 29, 2019·0 cites·34 claims
- 3251US7218768B2Inspection method and apparatus for the inspection of either random or repeating patternsKLA TENCOR TECH CORP·Filed 2003·Granted May 15, 2007·4 cites·8 claims
- 3350US2009290784A1Methods and systems for binning defects detected on a specimenKLA TENCOR TECH CORP·Filed 2009·Application pending·0 cites
- 3449US7602958B1Mirror node process verificationKLA TENCOR CORP·Filed 2004·Granted Oct 13, 2009·5 cites·18 claims
- 3547US2016217240A1Methodology Of Incorporating Wafer Physical Measurement With Digital Simulation For Improving Semiconductor Device FabricationDMO SYSTEMS LTD·Filed 2015·Application pending·0 cites
- 3643US9916653B2Detection of defects embedded in noise for inspection in semiconductor manufacturingLIN JASON Z·Filed 2012·Granted Mar 13, 2018·0 cites·16 claims
- 3742US2009067722A1Memory cell and page break inspectionKLA TENCOR CORP·Filed 2008·Application pending·0 cites
- 3840US2014214192A1Apparatus For Design-Based Manufacturing Optimization In Semiconductor FabDMO SYSTEMS LTD·Filed 2013·Application pending·0 cites
- 3930US6455232B1Method of reducing stop layer loss in a photoresist stripping process using a fluorine scavengerAPPLIED MATERIALS INC·Filed 1998·Granted Sep 24, 2002·9 cites·18 claims
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