Inventor · disambiguated record
Robert Rosenberg
Also filed as: ROSENBERG ROBERT · ROSENBERG ROBERT L
36 granted patents·10 pending applications·1,822 citations·filing 1975–2017
98Inventor score
Top patents by PatentIndex Score
46 records- 0199US6342733B1Reduced electromigration and stressed induced migration of Cu wires by surface coatingIBM·Filed 1999·Granted Jan 29, 2002·506 cites·11 claims
- 0299US4647494ASilicon/carbon protection of metallic magnetic structuresIBM·Filed 1985·Granted Mar 3, 1987·157 cites·19 claims
- 0397US6451712B1Method for forming a porous dielectric material layer in a semiconductor device and device formedIBM·Filed 2000·Granted Sep 17, 2002·123 cites·43 claims
- 0495US3996095AEpitaxial process of forming ferrite, Fe3 O4 and γFe2 O3 thin films on special materialsIBM·Filed 1975·Granted Dec 7, 1976·56 cites·14 claims
- 0592US7468320B2Reduced electromigration and stressed induced migration of copper wires by surface coatingIBM·Filed 2005·Granted Dec 23, 2008·14 cites·9 claims
- 0692US4062038ARadiation responsive deviceIBM·Filed 1976·Granted Dec 6, 1977·73 cites·9 claims
- 0791USD476726SCombined air freshener and picture frameFiled 2002·Granted Jul 1, 2003·45 cites·1 claims
- 0891US5540785AFabrication of defect free silicon on an insulating substrateIBM·Filed 1994·Granted Jul 30, 1996·106 cites·9 claims
- 0989US6417572B1Process for producing metal interconnections and product produced therebyIBM·Filed 1999·Granted Jul 9, 2002·105 cites·21 claims
- 1087US5462883AMethod of fabricating defect-free silicon on an insulating substrateIBM·Filed 1994·Granted Oct 31, 1995·81 cites·32 claims
- 1187US5191631AHybrid optical fiber and method of increasing the effective area of optical transmission using sameAT & T BELL LAB·Filed 1991·Granted Mar 2, 1993·75 cites·19 claims
- 1287US5008207AMethod of fabricating a narrow base transistorIBM·Filed 1989·Granted Apr 16, 1991·57 cites·33 claims
- 1387US4599277AControl of the sintering of powdered metalsIBM·Filed 1984·Granted Jul 8, 1986·65 cites·37 claims
- 1484US4132571AGrowth of polycrystalline semiconductor film with intermetallic nucleating layerIBM·Filed 1977·Granted Jan 2, 1979·42 cites·4 claims
- 1582US6787912B2Barrier material for copper structuresIBM·Filed 2002·Granted Sep 7, 2004·27 cites·22 claims
- 1680US7119018B2Copper conductorIBM·Filed 2004·Granted Oct 10, 2006·20 cites·11 claims
- 1779US4482906AGallium aluminum arsenide integrated circuit structure using germaniumIBM·Filed 1982·Granted Nov 13, 1984·44 cites·3 claims
- 1876US7495338B2Metal capped copper interconnectIBM·Filed 2006·Granted Feb 24, 2009·4 cites·20 claims
- 1975US6525427B2BEOL decoupling capacitorIBM·Filed 2002·Granted Feb 25, 2003·11 cites·5 claims
- 2074US5327511AApparatus and method employing fast polarization modulation to reduce effects of polarization hole burning and polarization dependent lossAT & T BELL LAB·Filed 1993·Granted Jul 5, 1994·40 cites·29 claims
- 2173US6812143B2Process of forming copper structuresIBM·Filed 2002·Granted Nov 2, 2004·19 cites·15 claims
- 2273US6452276B1Ultra thin, single phase, diffusion barrier for metal conductorsIBM·Filed 1998·Granted Sep 17, 2002·38 cites·22 claims
- 2372US5857883AMethod of forming perforated metal/ferrite laminated magnetIBM·Filed 1997·Granted Jan 12, 1999·25 cites·30 claims
- 2469US6777809B2BEOL decoupling capacitorIBM·Filed 2002·Granted Aug 17, 2004·7 cites·5 claims
- 2562US6831364B2Method for forming a porous dielectric material layer in a semiconductor device and device formedIBM·Filed 2002·Granted Dec 14, 2004·6 cites·6 claims
- 2660US4155785AProcess of making a radiation responsive deviceIBM·Filed 1977·Granted May 22, 1979·19 cites·18 claims
- 2759US7825516B2Formation of aligned capped metal lines and interconnections in multilevel semiconductor structuresIBM·Filed 2002·Granted Nov 2, 2010·9 cites·1 claims
- 2859US2009142924A1Reduced electromigration and stressed induced migration of cu wires by surface coatingIBM·Filed 2008·Application pending·0 cites
- 2953US6503641B2Interconnects with Ti-containing linersIBM·Filed 2000·Granted Jan 7, 2003·5 cites·13 claims
- 3050US2008126245A1System and method for centralized bankingROSENBERG ROBERT·Filed 2006·Application pending·0 cites
- 3149US4389768ASelf-aligned process for fabricating gallium arsenide metal-semiconductor field effect transistorsIBM·Filed 1981·Granted Jun 28, 1983·15 cites·36 claims
- 3248US2006264036A1Line level air gapsIBM·Filed 2006·Application pending·0 cites
- 3346US10439547B2Framed modular ballast block and method of constructionROSENBERG ROBERT·Filed 2017·Granted Oct 8, 2019·0 cites·8 claims
- 3445US2004195694A1BEOL decoupling capacitorIBM·Filed 2004·Application pending·0 cites
- 3543US5986395AMetal/ferrite laminate magnetIBM·Filed 1997·Granted Nov 16, 1999·6 cites·26 claims
- 3643US2003085447A1Beol decoupling capacitorIBM·Filed 2002·Application pending·0 cites
- 3742US2002098681A1Reduced electromigration and stressed induced migration of Cu wires by surface coatingFiled 2001·Application pending·0 cites
- 3841US2001040271A1BEOL decoupling capacitorFiled 2001·Application pending·0 cites
- 3940USD749877STable top coverROSENBERG ROBERT·Filed 2014·Granted Feb 23, 2016·4 cites·1 claims
- 4039US7172968B2Ultra thin, single phase, diffusion barrier for metal conductorsIBM·Filed 2002·Granted Feb 6, 2007·0 cites·12 claims
- 4139US5359678AApparatus and method employing fast polarization modulation to reduce effects of polarization hole burning and/or polarization dependent lossAT & T BELL LAB·Filed 1993·Granted Oct 25, 1994·8 cites·24 claims
- 4239US2006012014A1Reliability of low-k dielectric devices with energy dissipative layerIBM·Filed 2004·Application pending·0 cites
- 4337US2005118796A1Process for forming an electrically conductive interconnectFiled 2003·Application pending·0 cites
- 4435US5132765ANarrow base transistor and method of fabricating sameBLOUSE JEFFREY L·Filed 1991·Granted Jul 21, 1992·8 cites·12 claims
- 4534US6264885B1Metal/ferrite laminate magnetIBM·Filed 1999·Granted Jul 24, 2001·2 cites·29 claims
- 4630US2001013660A1Beol decoupling capacitorFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →