Inventor · disambiguated record
Sagar A. Kekare
Also filed as: KEKARE SAGAR · KEKARE SAGAR A
12 granted patents·2 pending applications·447 citations·filing 2004–2019
91Inventor score
Files withKLA TENCOR CORP4KLA TENCOR TECH CORP4KLA TENCOR TECH CORPORATION2KEKARE SAGAR1MARELLA PAUL F1
Top patents by PatentIndex Score
14 records- 0198US7570796B2Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2006·Granted Aug 4, 2009·286 cites·88 claims
- 0297US9401014B2Methods and systems for utilizing design data in combination with inspection dataKLA-TENCOR TECH CORP·Filed 2014·Granted Jul 26, 2016·22 cites·103 claims
- 0397US7769225B2Methods and systems for detecting defects in a reticle design patternKLA TENCOR TECH CORP·Filed 2005·Granted Aug 3, 2010·80 cites·19 claims
- 0491US8923600B2Methods and systems for utilizing design data in combination with inspection dataZAFAR KHURRAM·Filed 2009·Granted Dec 30, 2014·33 cites·23 claims
- 0581US9689923B2Adaptive electrical testing of wafersKLA TENCOR CORP·Filed 2014·Granted Jun 27, 2017·5 cites·36 claims
- 0679US9002497B2Methods and systems for inspection of wafers and reticles using designer intent dataVOLK WILLIAM·Filed 2004·Granted Apr 7, 2015·14 cites·39 claims
- 0776US10303839B2Electrically relevant placement of metrology targets using design analysisKLA TENCOR CORP·Filed 2016·Granted May 28, 2019·2 cites·15 claims
- 0875US10713771B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2018·Granted Jul 14, 2020·1 cites·29 claims
- 0972US9400865B2Extracting comprehensive design guidance for in-line process control tools and methodsKLA TENCOR CORP·Filed 2015·Granted Jul 26, 2016·2 cites·53 claims
- 1065US11348222B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2019·Granted May 31, 2022·0 cites·30 claims
- 1163US10209628B2System and method for defect classification based on electrical design intentKLA TENCOR CORP·Filed 2016·Granted Feb 19, 2019·1 cites·40 claims
- 1257US8549445B2Targeted production control using multivariate analysis of design marginalitiesKEKARE SAGAR·Filed 2011·Granted Oct 1, 2013·1 cites·20 claims
- 1357US2008081385A1Methods and systems for inspection of wafers and reticles using designer intent dataMARELLA PAUL F·Filed 2007·Application pending·0 cites
- 1456US2015178914A1Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent DataKLA TENCOR TECH CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →