US2023031720A1PendingUtilityA1

Methods for forming doped silicon oxide thin films

Assignee: ASM INT NVPriority: Nov 4, 2011Filed: Mar 8, 2022Published: Feb 2, 2023
Est. expiryNov 4, 2031(~5.3 yrs left)· nominal 20-yr term from priority
H10P 95/90H10P 32/171H10P 32/141H10P 32/19H10P 14/69215H10P 14/6923H10P 14/6687H10P 14/6681H10P 14/6339H10P 14/6336H10P 14/6334H10P 14/6518H10D 30/0241C23C 16/402C23C 16/45553C23C 16/45531H01L 21/02274H01L 21/324H01L 21/02129H01L 21/02219H01L 21/02208H01L 29/66803H01L 21/2255H01L 21/0228H01L 21/2225H01L 21/02321H01L 21/02271H01L 21/02164
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Claims

Abstract

The present disclosure relates to the deposition of dopant films, such as doped silicon oxide films, by atomic layer deposition processes. In some embodiments, a substrate in a reaction space is contacted with pulses of a silicon precursor and a dopant precursor, such that the silicon precursor and dopant precursor adsorb on the substrate surface. Oxygen plasma is used to convert the adsorbed silicon precursor and dopant precursor to doped silicon oxide.

Claims

exact text as granted — not AI-modified
We claim: 
     
         1 . A method for depositing doped silicon oxide on a substrate in a reaction chamber comprising at least one doped silicon oxide deposition cycle comprising, in order:
 contacting the substrate with a dopant precursor;   contacting the substrate with a first reactive species;   contacting the substrate with a silicon precursor;   exposing the substrate to a purge gas; and   contacting the substrate with a second reactive species.

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